Vishwani PowerPoint PPT Presentations

Testing for Faults, Looking for Defects Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University, Auburn, AL ...

Title: Slide 1 Author: Vishwani Agrawal Last modified by: agrawvd Created Date: 8/13/2004 4:53:40 PM Document presentation format: On-screen Show (4:3)

Optimizing Tests for Multiple Fault Models Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE Auburn, AL 36849, USA Outline Multiple fault models ...

Optimizing Tests for Multiple Fault ... Minimization of total number of vectors. Minimizing IDDQ measurements. Results ... Sematech study (Nigh et. al. VTS' ...

Independence Fault Collapsing and Concurrent Test Generation Master s Defense Alok S. Doshi Dept. of ECE, Auburn University Thesis Advisor: Vishwani D. Agrawal

Very low voltage 16-bit counter in high leakage static CMOS technology COLIN STEVENS LOW POWER ELECTRONICS ELEC6270 INSTRUCTOR-VISHWANI D. AGRAWAL

Probabilistic Soft Error Rate Estimation from Statistical SEU Parameters Fan Wang* Vishwani D. Agrawal Department of Electrical and Computer Engineering

Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey http://cm.bell-labs.com/cm/cs/who/va January 2003

Transition Delay Fault Testing of Microprocessors by Spectral Method Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE Auburn, AL 36849, USA

Soft Error Rates with Inertial and Logical Masking Fan Wang* Vishwani D. Agrawal vagrawal@eng.auburn.edu Department of Electrical and Computer Engineering

Title: Slide 1 Author: Vishwani Agrawal Last modified by: Preferred Customer Created Date: 8/9/2004 10:08:20 PM Document presentation format: On-screen Show (4:3)

Interdisciplinary Computer Engineering Curriculum Keynote Talk (My Teaching Philosophy) Vishwani D. Agrawal Agere Systems, Murray Hill, NJ, USA and Rutgers University, NJ

Implication Graphs and Logic Testing Vishwani D. Agrawal James J. Danaher Professor Dept. of ECE, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu

Stratified Sampling for Fault Coverage of VLSI Systems Vishwani D. Agrawal Agere Systems, Murray Hill, NJ 07974 va@agere.com http://cm.bell-labs.com/cm/cs/who/va

Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage Vishwani D. Agrawal James J. Danaher Professor

High-Level Test Generation for Gate-level Fault Coverage Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE Auburn, AL 36849 Outline Need for High ...

Soft Error Rate Determination for Nanometer CMOS VLSI Circuits Fan Wang Vishwani D. Agrawal Department of Electrical and Computer Engineering Auburn University, AL ...

Ultra Low Power CMOS Design Ph.D. Dissertation Proposal Kyungseok Kim ECE Auburn Univ. Chair: Prof. Vishwani D. Agrawal Committee Members: Prof. Victor P. Nelson

Mutiple Faults: Modeling, Simulation and Test Yong C. Kim University of Wisconsin, Dept. of ECE, Madison, WI 53706, USA kimy@ece.wisc.edu Vishwani D. Agrawal

Title: USING PARTIAL IMPLICATIONS FOR REDUNDANCY IDENTIFICATION AND FAULT EQUIVALENCE Author: user Last modified by: Vishwani Agrawal Created Date

Built-In Self-Test and Calibration of Mixed-Signal Devices Ph.D Final Exam Wei Jiang Advisor: Vishwani D. Agrawal University Reader Minseo Park Committee Members:

Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey http://cm.bell-labs.com/cm/cs/who/va January 2003

Hillary Grimes & Vishwani D. Agrawal. 2. Outline. Problem Statement. Reconvergent Fanout Analysis ... When signals produced by a common fanout point reconverge, ...

PROOFS: A Fault Simulation Algorithm Pratap S.Prasad ELEC 7250 Instructor: Prof. Vishwani Agrawal Fault Simulation Fault Simulation Simulators Necessity Strategy Need ...

Net Diagnosis using Stuck-at and Transition Fault Models Master s Defense Lixing Zhao Thesis Advisor: Dr. Vishwani D. Agrawal Thesis Committee: Dr. Adit Singh and ...

Total Power Minimization in Glitch-Free CMOS Circuits Considering Process Variation Yuanlin Lu Intel Corporation, Folsom, CA 95630 Vishwani D. Agrawal

Soft Error Rate Determination for Nanometer CMOS VLSI Circuits Master s Defense Fan Wang Thesis Advisor: Dr. Vishwani D. Agrawal Thesis Committee: Dr. Fa Foster Dai ...

Designing Variation-Tolerance in Mixed-Signal Components of a System-on-Chip Wei Jiang and Vishwani D. Agrawal Electrical and Computer Engineering, Auburn University ...

ELEC 5270-001/6270-001(Fall 2006) Low-Power Design of Electronic Circuits Adiabatic Logic Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and ...

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT. Vishwani D. Agrawal. Agere Systems ... (a) Apply vectors at test-clock speed (b) Apply rated clock to flip-flops ...

ELEC 5270-001/6270-001(Fall 2006) Low-Power Design of Electronic Circuits Test Power Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and ...

Designing Variation-Tolerance in Mixed-Signal Components of a System-on-Chip Wei Jiang and Vishwani D. Agrawal Electrical and Computer Engineering

Soft Error Rate Determination for Nanometer CMOS VLSI Circuits Master s Defense Fan Wang Thesis Advisor: Dr. Vishwani D. Agrawal Thesis Committee: Dr. Fa Foster Dai ...

Electronic Testing Education, Research and Training Infrastructure NSF Computing Research Infrastructure (CRI) Project at Auburn University Vishwani Agrawal

ELEC 5970-001/6970-001(Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic Circuits Test Power Vishwani D. Agrawal

Title: Slide 1 Author: Vishwani Agrawal Last modified by: Prathima Created Date: 8/13/2004 4:53:40 PM Document presentation format: On-screen Show Company

Partial Scan Design with Guaranteed Combinational ATPG. Vishwani D. Agrawal ... from any PIs to any reachable POs (Balakrishnan and Chakradhar, VLSI Design `96) ...

332:578 Deep Submicron VLSI Design Lecture 27 Emerging Nanotechnology Devices Tezaswi Raja Trans-Meta Corp. Prof. Vishwani Agrawal Auburn U.

and Rutgers University, NJ. vishwani02@yahoo.com. http://cm.bell-labs.com/cm/cs/who/va ... Why is it different from computer science and electrical engineering? ...

ELEC 5270-001/6270-001 (Fall 2006) Low-Power Design of Electronic Circuits (ELEC 5970/6970) Low Voltage Low Power Devices Vishwani D. Agrawal James J. Danaher Professor

Testing in the Fourth Dimension. Vishwani D. Agrawal. Bell Labs, Murray ... SIA Roadmap, IEEE Spectrum, July 1999. 5/29/09. ATS'00. 3. Cost of Testing in 2000AD ...

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Title: Slide 1 Author: Vishwani Agrawal Last modified by: Prathima Created Date: 8/13/2004 4:53:40 PM Document presentation format: On-screen Show Company

DAV UNIVERSITY is one of the top university in Jalandhar in this studies are not confined to classroom teaching but there is much beyond that. It is a multi-disciplinary institution, excellence in subjects from engineering to natural sciences.

Graduate and Professional Student Council Who We Are An organized group of graduate and professional students working with administration to serve the needs of ...

ELEC 7250 VLSI Testing (Spring 2005) Place and Time: Broun 235, Tuesday/Thursday, 11:00AM 12:15PM Catalog data: ELEC 7250. VLSI Testing (3) Lec.

University of Alabama in Huntsville. Rhonda Gaede. University of Alabama Tuscaloosa. Bruce Kim. Tuskegee University. Hira Narang. Muhammad Ali ...

7744 (0.62), #dom. = 5824 (0.46) May 15, 2003. Agrawal et al.: Fault Collapsing. 5 ... Dom. Equ. Dom. Equ. Hierarchical. with functional. Flat. structural only ...

High-performance integrated circuits have traditionally been characterized by ... While timing measurements can theoretically be performed using a rigorous ...

... scaling to reduce capacitance and voltage. Body bias to reduce threshold voltage and leakage. Multiple threshold CMOS (MTCMOS). Silicon on insulator ...

Hierarchical Fault Collapsing Functional Equivalences and Dominances

For every test vector. Do true-value simulation; for every undetected faulty machine ... than a state of the art concurrent fault simulator while also requiring ...

Design Team Project: Physical Design ( Layout ) Kyungseok Kim. ELEC ... Changing Options In Auto Route. Automated Layout Flow. Layout: MUX. 1. 3. 2. 5. 4. 6. ...

Boundary scan (2 classes) Analog test bus (1 class) System test and core test (2 classes) ... Homework (1 per week, most weeks) 30% Term paper (6 pages) 10 ...

Department of Electrical and Computer Engineering. Auburn University ... K. M ller-Glaser, K. Kirsch and K. Neusinger, 'Estimating Essential ...

Related Ideas for Investigation Energy recovery Reversible Logic ... leakage and short-circuit power Recent references 9/21/04 ELEC 5970-003/6970-003 ...