Title: Ultra Low Power CMOS Design
1Ultra Low Power CMOS Design
- Ph.D. Dissertation Proposal
- Kyungseok Kim
- ECE Auburn Univ.
Chair Prof. Vishwani D. Agrawal
Committee Members Prof. Victor P. Nelson Prof.
Fa F. Dai
May 11, 2010
2Outline
- Study of Subthreshold Voltage Operation
- Dual Voltage Assignment Algorithm (MILP)
- Current Progress Future Work
- Conclusion
3Energy Constrained Systems
- Low activity rates
- Relaxed speed requirements
- Long battery lifetimes ( more than 1 year )
- Energy harvesting from the environment
-
- Examples
- Micro-sensor networks, Pacemakers, RFID
tags, and Portable devices
Energy Harvesting Tech. Power Density ( µW/cm2 )
Vibration - electromagnetic Vibration - piezoelectric Vibration - electrostatic Thermoelectric ( 5C difference) Solar - direct sunlight Solar - indoor 4.0 500 3.8 60 3700 3.2
A. Wang, B. H. Calhoun, and A. P. Chandrakasan,
Sub-Threshold Design for Ultra Low-Power Systems.
Springer, 2006.
4Subthreshold Operation (weak inversion)
Eric A. Vittoz (1967) discovered that the
transfer characteristics of MOS device were
exponential across more than 5 decades of drain
current.
Measurement of a MOS transistor at very low
current (Vittozs notebook)
E. A. Vittoz, The Electronic Watch and Low-Power
Circuits, IEEE Solid-State Circuits Newsletter,
vol. 13, no. 3, pp. 723, 2008.
5 Minimum Operating Voltage
- Swanson and Meindl (1972) examined the voltage
transfer characteristic (VTC) of an inverter - Minimum Voltage 8kT/q or 200 mV at
300K - (A ring oscillator worked at 100 mV soon
thereafter.) - Ideal limit of the lowest possible supply
voltage (2001) - Vdd 2kT/q 57 mV at 300K
R. M. Swanson and J. D. Meindl, Ion-Implanted
Complementary MOS Transistors in Low-Voltage
Circuits, IEEE JSSC, vol. 7, no. 2, April
1972. A. Bryant, J. Brown, P. Cottrell, M.
Ketchen, J. Ellis-Monaghan, E. Nowak, I. Div, and
E. Junction, Low-power CMOS at Vdd 4kT/q, in
Device Research Conference, 2001, pp. 2223.
6VTC of Inverter in PTM 90nm CMOS
SPICE simulation ( Predictive Technology Model,
PTM )
Vth_nmos 0.29 V, Vth_pmos 0.21 V Nominal
VDD 1.2 V, Temp. 300K Inverter size WP
5.5L Wn 2.4L L 90nm
7180 mV FFT Processor
- Dynamic Voltage Scaling (DVS) in subthreshold
region according to operating scenarios - ( 128 to 1024 FFT length and 8 or 16 bit
precision) - Tech. Standard 018 µm 6M CMOS (Vth 450 mV)
- Voltage scaling 180 mV to 900 mV
- Operating Freq. 164 Hz to 6 MHz
- Optimal operating point for 1024 and 16b
- Vdd,opt 350 mV Freq. 9.6 kHz
Eopt 155 nJ - Above-threshold low power FFT processor
consumes 3.4 µJ - in 0.7 µm process with 1.1 V
A. Wang and A. Chandrakasan, A 180mV FFT
Processor Using Subthreshold Circuit Techniques,
in IEEE International Solid-State Circuits
Conference Digest of Technical Papers, 2004, pp.
292529.
8Minimum Energy Operating Point
- Lowest energy per cycle
- Eopt Minimum Etot Edyn Eleak
- Dynamic energy Edyn
- Leakage energy Eleak
- Eopt normally occurs in subthreshold region if
speed is not constrained - Speed critical operation
- Vdd can be higher, even above-threshold
9Vdd gt Vth
- Dynamic Energy
- Edyn a0?1CVdd2
- Quadratic reduction with supply voltage Vdd
- Activity factor a affects Edyn
- Leakage Energy
- Eleak Pleaktd IleakVddtd
- Ileak is composed of subthreshod leakage, gate
leakage and pn junction reverse-bias current .. - Normally smaller than dynamic energy
10Vdd lt Vth
- Dynamic Energy
- Edyn scaled down as Vdd2 is comparable to Eleak
- Leakage Energy
- Assume Ileak Isub,off
- td exponentially increases by scaling Vdd down
- Eleak is independent of Vth
A. Wang, B. H. Calhoun, and A. P. Chandrakasan,
Sub-Threshold Design for Ultra Low-Power Systems.
Springer, 2006.
11Ileak and td
Io Drain current at VgsVth S Subthreshold
swing ? Drain-induced barrier lowering ( DIBL
) VT Thermal voltage (kT/q)
Ileak Isub,off Isub (Vgs 0) DIBL reduces
Ileak with scaling Vdd
K Fitting parameter CL Load capacitance
Isub,on Isub (Vgs Vdd lt Vth)
12Normalized Ileak and td for INV (SPICE
Simulation)
Eleak is mainly dominated by td in subthreshold
region.
13Total Energy per Cycle ( Etot )
14Threshold Voltage Vs. Total Energy
Lowering Vth does not change Eopt in the
subthreshold region
B.H. Calhoun, A. Wang, and A. Chandrakasan,
Modeling and Sizing for Minimum Energy Operation
in Subthreshold Circuits, in IEEE Journal of
Solid-State Circuits, Sept. 2005.
15Energy Vs. Performance
Delay and energy per cycle of 8-bit ripple carry
adder ( SPICE Simulation )
- Small increase of Etot in subthreshold region
exponentially improves circuit speed
16Outline
- Study of Subthreshold Voltage Operation
- Dual Voltage Assignment Algorithm (MILP)
- Current Progress Future Work
- Conclusion
17Motivation
- Utilizing time slack for low power design is
common in above-threshold, but not has been done
in subthreshold operation - Small increase in Etot can significantly
improves circuit speed - Two supply voltages are acceptable in todays
designs
18Dual-Vdd Design
- Use two supply voltages VDDH and VDDL
- Apply VDDH to gates on critical paths to maintain
performance (speed), while VDDL to gates on
non-critical paths to reduce power - Use level converters at interfaces of VDDL cells
feeding into VDDH cells
19Driven Gates and Input Swing Level
20Gate td and Pleak in Subthreshold
Simulation data (PTM 90nm CMOS) Two
supply voltages VDDH 250 mV and VDDL 200 mV
- Level converter has unacceptable delay overhead
for subthreshold circuits -
Gate Above-threshold (VDDH1.2V, VDDL0.96V) Above-threshold (VDDH1.2V, VDDL0.96V) Sub-threshold (VDDH250mV, VDDL200mV) Sub-threshold (VDDH250mV, VDDL200mV)
Gate td (psec) Pleak (nW) td (nsec) Pleak (pW)
INV Level converter (LC) 9.54 68.13 6.87 31.30 0.83 254.21 46.2 214.6
LC norm. to INV 7.1 4.6 306.3 4.7
21Algorithm I Eopt for Single Vdd
- Characterize Standard cells for maximum delay,
average leakage, and capacitances power using
SPICE simulation over subthreshold region (100 mV
to 300 mV, 10 mV step, 21 points, PTM 90 nm CMOS) - Low to high signal activity from logic simulator
- Critical delay Tc from STA (21 points)
- Calculate Etot by the sum of energy for gates
- (21 points)
- Find lowest Etot as Eopt
22Algorithm I Results
16-bit ripple carry adder for single
Vdd
23Algorithm II VDDL Assignment
- VDDH and Tc are given as inputs from Algorithm I
- Use repeatedly MILP to solve Etot and VDDL
assignment to selected gates on the non-critical
paths to achieve minimum energy for a pair of
VDDH and VDDL ( Vmin90 mV VDDL lt VDDH ) - Find Eopt and best VDDL Assignment corresponding
to Eopt - Eliminate level converters in dual supply voltage
operation by suitable constraints in MILP
24MILP for VDDL Assignment
For given speed requirement Tc ( VDDH )
Xi Integer variable 0 for VDDH or 1 for VDDL
Ti is the latest arrival time at a gate i output
from PI events
T. Raja, V. D. Agrawal, and M. L. Bushnell,
Minimum Dynamic Power CMOS Circuit Design by a
Reduced Constraint Set Linear Program, in
Proceedings of 16th International Conference on
VLSI Design, Jan.2003, pp. 527532.
25Topological Constraints
HH Xj 0 and Xi 0 ? Xi Xj 0 LL
Xj 1 and Xi 1 ? Xi Xj 0 HL Xj 0
and Xi 1 ? Xi Xj 1 LH Xj 1 and Xi
0 ? Xi Xj -1
Xi Xj 0
26Example Result
16-bit Ripple-Carry Adder (a0.21) in 90nm Bulk CMOS 16-bit Ripple-Carry Adder (a0.21) in 90nm Bulk CMOS 16-bit Ripple-Carry Adder (a0.21) in 90nm Bulk CMOS 16-bit Ripple-Carry Adder (a0.21) in 90nm Bulk CMOS
Operation VDD (V) Energy/cycle (fJ) Clock rate
Nominal 1.2 252.2 1.35 GHz
Minimum Energy Single VDD 0.20 8.71 2.01 MHz
Dual VDD ( energy opt.) 0.19, 0.13 6.82 1.57 MHz
Dual VDD ( perf. opt.) 0.26, 0.18 8.55 8.12 MHz
27Dual-Vdd Assignment Results
28Outline
- Study of Subthreshold Voltage Operation
- Dual Voltage Assignment Algorithm (MILP)
- Current Progress Future Work
- Conclusion
29Current Progress
- Validation of a dual-Vdd technique in bulk CMOS
subthreshold circuits - A method for finding minimum energy operating
point in single supply voltage - An MILP for dual supply voltages in subthreshold
region - Level converter are avoided
- A paper submitted to ICCAD 2010
30Future Work
- Modify topological constraints to allow suitable
level converters or to use circuit techniques,
then possibly more VDDL cells - Build MILP framework for minimum energy optimized
circuit using dual-Vdd and highest speed - Minimum energy operating circuit immune to
functional fails and process variations
31Outline
- Study of Subthreshold Voltage Operation
- Dual Voltage Assignment Algorithm (MILP)
- Current Progress Future Work
- Conclusion
32Conclusion
- Dual-Vdd MILP framework for minimum energy
operating circuit design is effective from
minimum energy operating point to highest speed
operation - Ultra low power design without performance
constraint - Minimum energy optimized design for given speed
- Reduced energy optimization for highest speed
33Thanks!