Atpg PowerPoint PPT Presentations

All Time
Show:
Recommended
Sort by:
Lecture 12 Advanced Combinational ATPG Algorithms PowerPoint PPT Presentation
Lecture 12 Advanced Combinational ATPG Algorithms - EST Search space learning (1991) BDD Test generation (1991) ... TEGUS satisfiability ATPG. Henftling et al. and Tafertshofer et al. ...
EST Search space learning (1991) BDD Test generation (1991) ... TEGUS satisfiability ATPG. Henftling et al. and Tafertshofer et al. ...
| PowerPoint PPT presentation | free to view
Lecture 12 Advanced Combinational ATPG Algorithms PowerPoint PPT Presentation
Lecture 12 Advanced Combinational ATPG Algorithms - Lecture 12 Advanced Combinational ATPG Algorithms FAN Multiple Backtrace (1983) TOPS Dominators (1987) SOCRATES Learning (1988) Legal Assignments (1990)
Lecture 12 Advanced Combinational ATPG Algorithms FAN Multiple Backtrace (1983) TOPS Dominators (1987) SOCRATES Learning (1988) Legal Assignments (1990)
| PowerPoint PPT presentation | free to download
Partial Scan Design with Guaranteed Combinational ATPG PowerPoint PPT Presentation
Partial Scan Design with Guaranteed Combinational ATPG - Partial Scan Design with Guaranteed Combinational ATPG. Vishwani D. Agrawal ... from any PIs to any reachable POs (Balakrishnan and Chakradhar, VLSI Design `96) ...
Partial Scan Design with Guaranteed Combinational ATPG. Vishwani D. Agrawal ... from any PIs to any reachable POs (Balakrishnan and Chakradhar, VLSI Design `96) ...
| PowerPoint PPT presentation | free to download
A New ATPG Algorithm for 21st Century: The wojoRithm PowerPoint PPT Presentation
A New ATPG Algorithm for 21st Century: The wojoRithm - John Sunwoo sunwojo@auburn.edu Electrical & Computer Engineering Auburn University, AL Table of Contents Flow Diagram PI Assignment Mechanism Logic Simulation (How ...
John Sunwoo sunwojo@auburn.edu Electrical & Computer Engineering Auburn University, AL Table of Contents Flow Diagram PI Assignment Mechanism Logic Simulation (How ...
| PowerPoint PPT presentation | free to download
Development of Parallel Distributed Computing System for ATPG Program and Evaluation of the speedup PowerPoint PPT Presentation
Development of Parallel Distributed Computing System for ATPG Program and Evaluation of the speedup - Execute ATPG program (HITEC/PROOFS) on each partitioned fault list separately ... HITEC/PROOFS. HITEC/PROOFS. 4/26/05. Han: ELEC7250. 6. Eliminate all the ...
Execute ATPG program (HITEC/PROOFS) on each partitioned fault list separately ... HITEC/PROOFS. HITEC/PROOFS. 4/26/05. Han: ELEC7250. 6. Eliminate all the ...
| PowerPoint PPT presentation | free to download
High-Level Spectral ATPG for Gate-level Circuits PowerPoint PPT Presentation
High-Level Spectral ATPG for Gate-level Circuits - Type of gate level synthesis * Sun Ultra 5, 256MB RAM. March 8, 2006. Spectral RTL ATPG ... Model the test generation system in the frequency domain using ...
Type of gate level synthesis * Sun Ultra 5, 256MB RAM. March 8, 2006. Spectral RTL ATPG ... Model the test generation system in the frequency domain using ...
| PowerPoint PPT presentation | free to download
Lecture 9 Combinational Automatic TestPattern Generation ATPG Basics PowerPoint PPT Presentation
Lecture 9 Combinational Automatic TestPattern Generation ATPG Basics - xp xy xr xs xt xu ... = 0. 3SAT: xi xj xk xj xk xl xl xm xn ... = 0. xp xy xr xs xt xt xu xv ... = 0. Jan. 29, 2001. VLSI Test: Bushnell-Agrawal/Lecture 9 ...
xp xy xr xs xt xu ... = 0. 3SAT: xi xj xk xj xk xl xl xm xn ... = 0. xp xy xr xs xt xt xu xv ... = 0. Jan. 29, 2001. VLSI Test: Bushnell-Agrawal/Lecture 9 ...
| PowerPoint PPT presentation | free to view
Lecture 14 Sequential Circuit ATPG SimulationBased Methods PowerPoint PPT Presentation
Lecture 14 Sequential Circuit ATPG SimulationBased Methods - Impossible initialization with three-valued logic (Section 5.3.4) ... is a good test; no race in fault-free circuit. 00, 11 causes a race condition in fault-free ...
Impossible initialization with three-valued logic (Section 5.3.4) ... is a good test; no race in fault-free circuit. 00, 11 causes a race condition in fault-free ...
| PowerPoint PPT presentation | free to view
Lecture 9 Combinational Automatic Test-Pattern Generation (ATPG) Basics PowerPoint PPT Presentation
Lecture 9 Combinational Automatic Test-Pattern Generation (ATPG) Basics - ... 1 7 23 292 1574 ATPG System 2189 ATPG System 8765 ATPG System 3005 ATPG System 485 25057 Year 1966 1981 1983 1987 1988 1990 1991 1993 1995 1997 * * * ...
... 1 7 23 292 1574 ATPG System 2189 ATPG System 8765 ATPG System 3005 ATPG System 485 25057 Year 1966 1981 1983 1987 1988 1990 1991 1993 1995 1997 * * * ...
| PowerPoint PPT presentation | free to view
Lecture 13 Sequential Circuit ATPG TimeFrame Expansion PowerPoint PPT Presentation
Lecture 13 Sequential Circuit ATPG TimeFrame Expansion - Problem of sequential circuit ATPG. Time-frame expansion. Nine-valued logic ... max-1. Time- Frame. max-2. Time- Frame -2. Time- Frame -1. S0. S1. S2. S3. Smax ...
Problem of sequential circuit ATPG. Time-frame expansion. Nine-valued logic ... max-1. Time- Frame. max-2. Time- Frame -2. Time- Frame -1. S0. S1. S2. S3. Smax ...
| PowerPoint PPT presentation | free to view
Lecture 14 Sequential Circuit ATPG Simulation-Based Methods PowerPoint PPT Presentation
Lecture 14 Sequential Circuit ATPG Simulation-Based Methods - Ref.: Agrawal, et al., IEEE-TCAD, 1989. Directed Search Cost Function Defined for required objective (initialization or fault detection).
Ref.: Agrawal, et al., IEEE-TCAD, 1989. Directed Search Cost Function Defined for required objective (initialization or fault detection).
| PowerPoint PPT presentation | free to view
Test Point Insertion that facilitates ATPG in reducing test time and data volume PowerPoint PPT Presentation
Test Point Insertion that facilitates ATPG in reducing test time and data volume - TPI method does not handle large Fan-out Free Regions (FFRs) March 6, ... Experimental results on 19 ISCAS circuits and 15 industrial circuits. March 6, 2003 ...
TPI method does not handle large Fan-out Free Regions (FFRs) March 6, ... Experimental results on 19 ISCAS circuits and 15 industrial circuits. March 6, 2003 ...
| PowerPoint PPT presentation | free to view
Lecture 10 Redundancy Removal Using ATPG PowerPoint PPT Presentation
Lecture 10 Redundancy Removal Using ATPG - Redundancy Removal Using ATPG. Redundancy identification. Redundancy removal ... Use ATPG to find all redundant faults; Remove all redundant faults with non ...
Redundancy Removal Using ATPG. Redundancy identification. Redundancy removal ... Use ATPG to find all redundant faults; Remove all redundant faults with non ...
| PowerPoint PPT presentation | free to view
Sequential Circuit BIST Synthesis using Spectrum and Noise from ATPG Patterns PowerPoint PPT Presentation
Sequential Circuit BIST Synthesis using Spectrum and Noise from ATPG Patterns - Set J Component Spectrum Power ... A Test Methodology for Finite State Machines using ... SC1 = 0.25 SC2 = 0.25 SC3 = 0.5 Cellular Automata ...
Set J Component Spectrum Power ... A Test Methodology for Finite State Machines using ... SC1 = 0.25 SC2 = 0.25 SC3 = 0.5 Cellular Automata ...
| PowerPoint PPT presentation | free to download
A Fast Sequential Learning Technique for Real Circuits With Application to Enhancing ATPG Performanc PowerPoint PPT Presentation
A Fast Sequential Learning Technique for Real Circuits With Application to Enhancing ATPG Performanc - Department of Computer Engineering. King Fahd University of ... Industrial 1. Industrial 2. Industrial 3. FFs. Gates. FF-FF. Gate-FF. CPU(s) 179. 239. 638 ...
Department of Computer Engineering. King Fahd University of ... Industrial 1. Industrial 2. Industrial 3. FFs. Gates. FF-FF. Gate-FF. CPU(s) 179. 239. 638 ...
| PowerPoint PPT presentation | free to download
ATPG for Noise Induced Switch Failures in Domino Logic PowerPoint PPT Presentation
ATPG for Noise Induced Switch Failures in Domino Logic - j,vj = backtrace () Delay_Imply (j,vj) if (TEST_GEN() == SUCCESS), return (SUCCESS) ... SSL tests provide poor coverage of such failures ...
j,vj = backtrace () Delay_Imply (j,vj) if (TEST_GEN() == SUCCESS), return (SUCCESS) ... SSL tests provide poor coverage of such failures ...
| PowerPoint PPT presentation | free to view
Testing and DFT tools PowerPoint PPT Presentation
Testing and DFT tools - TURBO TESTER Testing and DFT tools ( Installed in our PLD Lab ) Maksim Jenihhin IXX9500 Doktoriseminar DFT Package tools Design Flow ATPG library MG DFT Documentation ...
TURBO TESTER Testing and DFT tools ( Installed in our PLD Lab ) Maksim Jenihhin IXX9500 Doktoriseminar DFT Package tools Design Flow ATPG library MG DFT Documentation ...
| PowerPoint PPT presentation | free to download
By Praveen Venkataramani PowerPoint PPT Presentation
By Praveen Venkataramani - Techniques for Test Power Reduction in Leading Edge IP Using Cadence Encounter Test -ATPG: By Praveen Venkataramani * Test power consumption is 3x-5x the functional ...
Techniques for Test Power Reduction in Leading Edge IP Using Cadence Encounter Test -ATPG: By Praveen Venkataramani * Test power consumption is 3x-5x the functional ...
| PowerPoint PPT presentation | free to download
ATP Oil PowerPoint PPT Presentation
ATP Oil - This presentation contains projections and other forward looking statements ... Guildford, Surrey GU1 1UJ. United Kingdom. 44 (0) 1483 307200. www.atpog.com ...
This presentation contains projections and other forward looking statements ... Guildford, Surrey GU1 1UJ. United Kingdom. 44 (0) 1483 307200. www.atpog.com ...
| PowerPoint PPT presentation | free to download
Sequential%20Circuit%20BIST%20Synthesis%20using%20Spectrum%20and%20Noise%20from%20ATPG%20Patterns PowerPoint PPT Presentation
Sequential%20Circuit%20BIST%20Synthesis%20using%20Spectrum%20and%20Noise%20from%20ATPG%20Patterns - Area & delay overhead, yield loss, large vector size and testing times. Non ... Hadam-ard BIST (64k) Weighted Random (64k) Random (64k vectors) Flex. Test. ATPG ...
Area & delay overhead, yield loss, large vector size and testing times. Non ... Hadam-ard BIST (64k) Weighted Random (64k) Random (64k vectors) Flex. Test. ATPG ...
| PowerPoint PPT presentation | free to download
Fault%20Detection%20and%20Diagnostic%20Test%20Set%20Minimization PowerPoint PPT Presentation
Fault%20Detection%20and%20Diagnostic%20Test%20Set%20Minimization - Fault Diagnosis: Logical analysis using vectors to find the possible defect locations. ... SUN Fire 280R, 900 MHz Dual Core machine. ATPG ATALANTA. Fault ...
Fault Diagnosis: Logical analysis using vectors to find the possible defect locations. ... SUN Fire 280R, 900 MHz Dual Core machine. ATPG ATALANTA. Fault ...
| PowerPoint PPT presentation | free to download
VLSI Design For Testability Lecture 3.1: Testability PowerPoint PPT Presentation
VLSI Design For Testability Lecture 3.1: Testability - Lecture 3.2: Automatic Test Pattern Generation (ATPG) Basics ... V. Agrawal (Auburn Univ), M. Bushnell (Rutgers Univ), X, Chen (CCNY), C. Stroud (Auburn Univ. ...
Lecture 3.2: Automatic Test Pattern Generation (ATPG) Basics ... V. Agrawal (Auburn Univ), M. Bushnell (Rutgers Univ), X, Chen (CCNY), C. Stroud (Auburn Univ. ...
| PowerPoint PPT presentation | free to view
Mutiple Faults: Modeling, Simulation and Test PowerPoint PPT Presentation
Mutiple Faults: Modeling, Simulation and Test - Kim, et al., VLSI Design'02. 2. Problem Statement. ATPG ... Kim, et al., VLSI Design'01, ITC'01. A combinational model is made for the sequential circuit. ...
Kim, et al., VLSI Design'02. 2. Problem Statement. ATPG ... Kim, et al., VLSI Design'01, ITC'01. A combinational model is made for the sequential circuit. ...
| PowerPoint PPT presentation | free to download
Flipflop Selection to Maximize TDF Coverage with Partial Enhanced Scan PowerPoint PPT Presentation
Flipflop Selection to Maximize TDF Coverage with Partial Enhanced Scan - Dual Enhanced Scan Flip-flop & Enhanced DTSFF (Delay Test ... Running ATPG using Synopsis TetraMax. 9. Results (s13207) 10. Results (s9234) 11. Results (s5378) ...
Dual Enhanced Scan Flip-flop & Enhanced DTSFF (Delay Test ... Running ATPG using Synopsis TetraMax. 9. Results (s13207) 10. Results (s9234) 11. Results (s5378) ...
| PowerPoint PPT presentation | free to view
Dominance Fault Collapsing of Combinational Circuits PowerPoint PPT Presentation
Dominance Fault Collapsing of Combinational Circuits - ... collapsed fault set obtained from HITEC ATPG software. ... HITEC. MATLAB program. Circuit Under Test. Conclusion ... [1] HITEC/PROOFS User's manual. ...
... collapsed fault set obtained from HITEC ATPG software. ... HITEC. MATLAB program. Circuit Under Test. Conclusion ... [1] HITEC/PROOFS User's manual. ...
| PowerPoint PPT presentation | free to download
MixedMode BIST Based on Column Matching PowerPoint PPT Presentation
MixedMode BIST Based on Column Matching - Combination of pseudo-random and deterministic BIST. Column-Matching. LFSR produces code words ... be transformed into deterministic patterns (computed by ATPG) ...
Combination of pseudo-random and deterministic BIST. Column-Matching. LFSR produces code words ... be transformed into deterministic patterns (computed by ATPG) ...
| PowerPoint PPT presentation | free to view
Combinational Hardware False Path Identification without Search PowerPoint PPT Presentation
Combinational Hardware False Path Identification without Search - Fault-Independent solution to the False Path Identification problem in circuits ... Mercer et al., A Topological Search Algorithm for ATPG, IEEE DAC 1987 ...
Fault-Independent solution to the False Path Identification problem in circuits ... Mercer et al., A Topological Search Algorithm for ATPG, IEEE DAC 1987 ...
| PowerPoint PPT presentation | free to view
High Quality Robust Tests for Path Delay Faults PowerPoint PPT Presentation
High Quality Robust Tests for Path Delay Faults - Develop new test conditions for high quality robust tests for a path that take ... Construct an ATPG to generate robust tests that invoke the maximal delay along a ...
Develop new test conditions for high quality robust tests for a path that take ... Construct an ATPG to generate robust tests that invoke the maximal delay along a ...
| PowerPoint PPT presentation | free to view
Using Partial Implications for Redundancy Identification and Fault Equivalence PowerPoint PPT Presentation
Using Partial Implications for Redundancy Identification and Fault Equivalence - ... IEEE-TCAD 92 Transitive closure: ATPG: Chakradhar, et al., IEEE-TCAD 93 Redundancy, Agrawal, et al., ATS 96 Partial implications: Henftling, ...
... IEEE-TCAD 92 Transitive closure: ATPG: Chakradhar, et al., IEEE-TCAD 93 Redundancy, Agrawal, et al., ATS 96 Partial implications: Henftling, ...
| PowerPoint PPT presentation | free to download
RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power PowerPoint PPT Presentation
RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power - Microprocessor Research and Develop Center of Peking University ... Compatible with current ATPG flow. Need handshaking between DUT and ATE. The END. Thank you ...
Microprocessor Research and Develop Center of Peking University ... Compatible with current ATPG flow. Need handshaking between DUT and ATE. The END. Thank you ...
| PowerPoint PPT presentation | free to view
CSE 498M598M, Fall 2002 Digital Systems Testing PowerPoint PPT Presentation
CSE 498M598M, Fall 2002 Digital Systems Testing - Combinational Automatic Test-Pattern Generation (ATPG) Basics. 8/28/09 ... S ak bk ck = 0 (non-tautology) or. P (ak bk ck) = 1 (satisfiability) ...
Combinational Automatic Test-Pattern Generation (ATPG) Basics. 8/28/09 ... S ak bk ck = 0 (non-tautology) or. P (ak bk ck) = 1 (satisfiability) ...
| PowerPoint PPT presentation | free to view
Timing Analysis for Partially Specified Vectors TAPSV PowerPoint PPT Presentation
Timing Analysis for Partially Specified Vectors TAPSV - Contribution: a new timing refinement method to compute timing ranges for ... Comparing test efficiency of ATPGs with/without TA-PSV for similar run time. ...
Contribution: a new timing refinement method to compute timing ranges for ... Comparing test efficiency of ATPGs with/without TA-PSV for similar run time. ...
| PowerPoint PPT presentation | free to view
High-Level Test Generation for Gate-level Fault Coverage PowerPoint PPT Presentation
High-Level Test Generation for Gate-level Fault Coverage - High-Level Test Generation for Gate-level Fault Coverage Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE Auburn, AL 36849 Outline Need for High ...
High-Level Test Generation for Gate-level Fault Coverage Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE Auburn, AL 36849 Outline Need for High ...
| PowerPoint PPT presentation | free to download
Spectral Characterization of Functional Vectors for Gate-level Fault Coverage Tests PowerPoint PPT Presentation
Spectral Characterization of Functional Vectors for Gate-level Fault Coverage Tests - have been found useful in detection of manufacture defects like timing faults ... Manufacturing tests. may be non-functional; cannot be used for verification ...
have been found useful in detection of manufacture defects like timing faults ... Manufacturing tests. may be non-functional; cannot be used for verification ...
| PowerPoint PPT presentation | free to download
Concurrent%20Test%20Generation PowerPoint PPT Presentation
Concurrent%20Test%20Generation - ... and V. D. Agrawal, 'Independence Fault Collapsing,' Proc. ... Independence Fault Collapsing ... tests when combined with independence fault collapsing. ...
... and V. D. Agrawal, 'Independence Fault Collapsing,' Proc. ... Independence Fault Collapsing ... tests when combined with independence fault collapsing. ...
| PowerPoint PPT presentation | free to download
Mutiple Faults: Modeling, Simulation and Test PowerPoint PPT Presentation
Mutiple Faults: Modeling, Simulation and Test - Mutiple Faults: Modeling, Simulation and Test Yong C. Kim University of Wisconsin, Dept. of ECE, Madison, WI 53706, USA kimy@ece.wisc.edu Vishwani D. Agrawal
Mutiple Faults: Modeling, Simulation and Test Yong C. Kim University of Wisconsin, Dept. of ECE, Madison, WI 53706, USA kimy@ece.wisc.edu Vishwani D. Agrawal
| PowerPoint PPT presentation | free to download
Alfred L. Crouch Chief Scientist Inovys Corporation al.crouch@inovys.com PowerPoint PPT Presentation
Alfred L. Crouch Chief Scientist Inovys Corporation al.crouch@inovys.com - Title: DFT For AC Scan Subject: AC Scan Author: Al Crouch Keywords: Design Rules, Resource Checking, Limitations Description: Tutorial Information involved in Using ...
Title: DFT For AC Scan Subject: AC Scan Author: Al Crouch Keywords: Design Rules, Resource Checking, Limitations Description: Tutorial Information involved in Using ...
| PowerPoint PPT presentation | free to view
Independence Fault Collapsing PowerPoint PPT Presentation
Independence Fault Collapsing - Independence Fault Collapsing and Concurrent Test Generation Master s Defense Alok S. Doshi Dept. of ECE, Auburn University Thesis Advisor: Vishwani D. Agrawal
Independence Fault Collapsing and Concurrent Test Generation Master s Defense Alok S. Doshi Dept. of ECE, Auburn University Thesis Advisor: Vishwani D. Agrawal
| PowerPoint PPT presentation | free to download
Homologous Recombination: PowerPoint PPT Presentation
Homologous Recombination: - Homologous Recombination: Presynaptic Filaments & Brca2 Scott Morrical Dept. of Biochemistry smorrica@zoo.uvm.edu E. coli RecA Paradigm Eukaryotic Rad51
Homologous Recombination: Presynaptic Filaments & Brca2 Scott Morrical Dept. of Biochemistry smorrica@zoo.uvm.edu E. coli RecA Paradigm Eukaryotic Rad51
| PowerPoint PPT presentation | free to view
Gate-Level Test Generation Using Spectral Methods at Register-Transfer Level PowerPoint PPT Presentation
Gate-Level Test Generation Using Spectral Methods at Register-Transfer Level - General Oral Examination. 1. Gate-Level Test Generation Using Spectral Methods at ... General Oral Examination. 3. 1 - Introduction. Test generation challenges ...
General Oral Examination. 1. Gate-Level Test Generation Using Spectral Methods at ... General Oral Examination. 3. 1 - Introduction. Test generation challenges ...
| PowerPoint PPT presentation | free to download
Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Generation of Test Patterns for Sequential Circuits PowerPoint PPT Presentation
Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Generation of Test Patterns for Sequential Circuits - Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Generation of Test Patterns for Sequential Circuits Michael Dimopoulos - Panagiotis Linardis
Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Generation of Test Patterns for Sequential Circuits Michael Dimopoulos - Panagiotis Linardis
| PowerPoint PPT presentation | free to download
VLSI Design For Testability Lecture 7: Design For Test: Partial Scan, Scan Rules, Scan Compression PowerPoint PPT Presentation
VLSI Design For Testability Lecture 7: Design For Test: Partial Scan, Scan Rules, Scan Compression - VLSI Design For Testability Lecture 7: Design For Test: Partial Scan, Scan Rules, Scan Compression Instructor: Shianling Wu Director, NE USA, European, & Asian Operations
VLSI Design For Testability Lecture 7: Design For Test: Partial Scan, Scan Rules, Scan Compression Instructor: Shianling Wu Director, NE USA, European, & Asian Operations
| PowerPoint PPT presentation | free to view
High-Level Test Generation for Gate-level Fault Coverage PowerPoint PPT Presentation
High-Level Test Generation for Gate-level Fault Coverage - Bit stream to analyze. Correlating with Walsh functions by multiplying with Hadamard matrix. ... Spectrum for new bit-streams consists of the essential ...
Bit stream to analyze. Correlating with Walsh functions by multiplying with Hadamard matrix. ... Spectrum for new bit-streams consists of the essential ...
| PowerPoint PPT presentation | free to download
Key Results - Verification PowerPoint PPT Presentation
Key Results - Verification - Title: NSF/NSC workshop Author: Jason Cong Last modified by: Kwang-Ting (Tim) Cheng Created Date: 11/9/1997 12:30:08 PM Document presentation format
Title: NSF/NSC workshop Author: Jason Cong Last modified by: Kwang-Ting (Tim) Cheng Created Date: 11/9/1997 12:30:08 PM Document presentation format
| PowerPoint PPT presentation | free to download
Independence%20Fault%20Collapsing PowerPoint PPT Presentation
Independence%20Fault%20Collapsing - Master's Defense. Alok S. Doshi. Dept. of ECE, Auburn University. Jan. 25, 2006 ... Alok Doshi: MS Defense. 3. Problem Statement ...
Master's Defense. Alok S. Doshi. Dept. of ECE, Auburn University. Jan. 25, 2006 ... Alok Doshi: MS Defense. 3. Problem Statement ...
| PowerPoint PPT presentation | free to download
Fundamentals of Digital Test and DFT PowerPoint PPT Presentation
Fundamentals of Digital Test and DFT - Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey http://cm.bell-labs.com/cm/cs/who/va January 2003
Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey http://cm.bell-labs.com/cm/cs/who/va January 2003
| PowerPoint PPT presentation | free to download
Source III, Inc. PowerPoint PPT Presentation
Source III, Inc. - Verilog/VHDL. Testbench. STIL. WGL ... 2002 Synopsys, Inc. ( 4 ) CONFIDENTIAL. VTRAN's EDA-IP ... Simplifies translations by providing data access rather than ...
Verilog/VHDL. Testbench. STIL. WGL ... 2002 Synopsys, Inc. ( 4 ) CONFIDENTIAL. VTRAN's EDA-IP ... Simplifies translations by providing data access rather than ...
| PowerPoint PPT presentation | free to download
Computer-Aided Design Concept to Silicon PowerPoint PPT Presentation
Computer-Aided Design Concept to Silicon - ASIC Design Flow Mentor Graphics CAD Tools ... FPGA Configuration File Standard Cell IC & FPGA/CPLD Synthesis Test vectors Full-custom IC Create Behavioral/RTL ...
ASIC Design Flow Mentor Graphics CAD Tools ... FPGA Configuration File Standard Cell IC & FPGA/CPLD Synthesis Test vectors Full-custom IC Create Behavioral/RTL ...
| PowerPoint PPT presentation | free to download
Spectral Testing PowerPoint PPT Presentation
Spectral Testing - Title: USING PARTIAL IMPLICATIONS FOR REDUNDANCY IDENTIFICATION AND FAULT EQUIVALENCE Author: user Last modified by: Vishwani Agrawal Created Date
Title: USING PARTIAL IMPLICATIONS FOR REDUNDANCY IDENTIFICATION AND FAULT EQUIVALENCE Author: user Last modified by: Vishwani Agrawal Created Date
| PowerPoint PPT presentation | free to download
Efficient Reachability Checking using Sequential SAT PowerPoint PPT Presentation
Efficient Reachability Checking using Sequential SAT - G. Parthasarathy, M. K. Iyer, K.-T.Cheng, Li. C. Wang Department of ECE University of California Santa Barbara
G. Parthasarathy, M. K. Iyer, K.-T.Cheng, Li. C. Wang Department of ECE University of California Santa Barbara
| PowerPoint PPT presentation | free to download
Transition Delay Fault Testing of Microprocessors by Spectral Method PowerPoint PPT Presentation
Transition Delay Fault Testing of Microprocessors by Spectral Method - Transition Delay Fault Testing of Microprocessors by Spectral Method Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE Auburn, AL 36849, USA
Transition Delay Fault Testing of Microprocessors by Spectral Method Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE Auburn, AL 36849, USA
| PowerPoint PPT presentation | free to download
RATS talk - Spring 95/96 PowerPoint PPT Presentation
RATS talk - Spring 95/96 - Testing for Manufacturing Defects. Ensure high quality ... Keep Only One in Fault List. c/0. y/0. 13. DUDES - Async 2000. Fault Dominance. Test Set Comparison ...
Testing for Manufacturing Defects. Ensure high quality ... Keep Only One in Fault List. c/0. y/0. 13. DUDES - Async 2000. Fault Dominance. Test Set Comparison ...
| PowerPoint PPT presentation | free to download
Concurrent Test Generation PowerPoint PPT Presentation
Concurrent Test Generation - Concurrent Test Generation ... a new method for graph generation using simulation: ... Concurrent test generation produces compact tests when combined with ...
Concurrent Test Generation ... a new method for graph generation using simulation: ... Concurrent test generation produces compact tests when combined with ...
| PowerPoint PPT presentation | free to download
Embedded test tutorial PowerPoint PPT Presentation
Embedded test tutorial - ... of semi-embedded test address the bandwidth bottleneck in ATE to ... Reduced volume of test data. Underutilized bandwidth. Decompressor capacity problem ...
... of semi-embedded test address the bandwidth bottleneck in ATE to ... Reduced volume of test data. Underutilized bandwidth. Decompressor capacity problem ...
| PowerPoint PPT presentation | free to download
Embedded test tutorial PowerPoint PPT Presentation
Embedded test tutorial - Test coverage objectives are achieved by pseudorandom patterns and test points ... Patent descriptions and US Patent and Trademark Office web site. The End. The End ...
Test coverage objectives are achieved by pseudorandom patterns and test points ... Patent descriptions and US Patent and Trademark Office web site. The End. The End ...
| PowerPoint PPT presentation | free to view


Home About Us Terms and Conditions Privacy Policy Contact Us
Copyright 2024 CrystalGraphics, Inc. — All rights Reserved. PowerShow.com is a trademark of CrystalGraphics, Inc.
atpg — Search results on PowerShow.com