Title: Lecture 4 Design Rules,Layout and Stick Diagram
1Lecture 4 Design Rules,Layout and Stick Diagram
- Pradondet Nilagupta
- pom_at_ku.ac.th
- Department of Computer Engineering
- Kasetsart University
2Acknowledgement
- This lecture note has been summarized from
lecture note on Introduction to VLSI Design, VLSI
Circuit Design all over the world. I cant
remember where those slide come from. However,
Id like to thank all professors who create such
a good work on those lecture notes. Without those
lectures, this slide cant be finished.
3Roadmap for the term major topics
- VLSI Overview
- CMOS Processing Fabrication
- Components Transistors, Wires, Parasitics
- Design Rules Layout
- Combinational Circuit Design Layout
- Sequential Circuit Design Layout
- Standard-Cell Design with CAD Tools
- Systems Design using Verilog HDL
- Design Project Complete Chip
4Review - CMOS Mask Layers
- Determine placement of layout objects
- Color coding specifies layers
- Layout objects
- Rectangles
- Polygons
- Arbitrary shapes
- Grid types
- Absolute (micron)
- Scaleable (lambda)
5Mask Generation
- Mask Design using Layout Editor
- user specifies layout objects on different layers
- output layout file
- Pattern Generator
- Reads layout file
- Generates enlarged master image of each mask
layer - Image printed on glass
- Step repeat camera
- Reduces copies image onto mask
- One copy for each die on wafer
- Note importance of mask alignment
6Symbolic Mask Layers
- Key idea
- Reduce layers to those that describe design
- Generate physical layers as needed
- Magic Layout Editor "Abstract Layers
- metal1 (blue) - 1st layer metal (equiv. to
physical layer) - Poly (red) - polysilicon (equivalent to physical
layer) - ndiff (green) - n diffusion (combination of
active, nselect) - ntranistor (green/red crosshatch) - combined
poly, ndiff - pdiff (brown) - p diffusion (combination of
active, pselect) - ptransistor (brown/red crosshatch) - combined
poly, pdiff - contacts combine layers, cut mask
7About Magic
- Scalable Grid for Scalable Design Rules
- Grid distance l (lambda)
- Value is process-dependent l 0.5 X minimum
transistor length - Painting metaphor
- Paint squares on grid for each mask layer
- Layers to interact to form components (e.g.
transistors)
8Mask Layers in Magic
- Poly (red)
- N Diffusion (green)
- P Diffusion (brown)
- Metal (blue)
- Metal 2 (purple)
- Well (cross-hatching)
- Contacts (X)
9Magic User-Interface
- Graphic Display Window
- Cursor
- Box - specifies area to paint
- Command window (not shown)
- accepts text commandspaint polypaint
redpaint ndiffpaint greenwrite - prints error status messages
10Layer Interaction in Magic
- Transistors - where poly, diffusion cross
- poly crosses ndiffusion - ntransistor
- poly crosses pdiffusion - ptransistor
- Vias - where layers connect
- Metal 1 connecting to Poly - polycontact
- Metal 1 connecting to P-Diffusion (normal) - pdc
- Metal 1 connecting to P-Diffusion (substrate
contact) - psc - Metal 1 connecting to N-Diffusion (normal) - ndc
- Metal 1 connecting to N-Diffusion (substrate
contact) - nsc - Metal 1 connecting to Metal 2 - via
11Magic Layers - Example
12Why we need design rules
- Masks are tooling for manufacturing.
- Manufacturing processes have inherent limitations
in accuracy. - Design rules specify geometry of masks which will
provide reasonable yields. - Design rules are determined by experience.
13Manufacturing problems
- Photoresist shrinkage, tearing.
- Variations in material deposition.
- Variations in temperature.
- Variations in oxide thickness.
- Impurities.
- Variations between lots.
- Variations across a wafer.
14Transistor problems
- Varaiations in threshold voltage
- oxide thickness
- ion implanatation
- poly variations.
- Changes in source/drain diffusion overlap.
- Variations in substrate.
15Wiring problems
- Diffusion changes in doping -gt variations in
resistance, capacitance. - Poly, metal variations in height, width -gt
variations in resistance, capacitance. - Shorts and opens
16Oxide problems
- Variations in height.
- Lack of planarity -gt step coverage.
metal 2
metal 1
metal 2
17Via problems
- Via may not be cut all the way through.
- Undesize via has too much resistance.
- Via may be too large and create short.
18MOSIS SCMOS design rules
- Designed to scale across a wide range of
technologies. - Designed to support multiple vendors.
- Designed for educational use.
- Ergo, fairly conservative.
19? and design rules
- ? is the size of a minimum feature.
- Specifying ? particularizes the scalable rules.
- Parasitics are generally not specified in ??units?
20Design Rules
- Typical rules
- Minumum size
- Minimum spacing
- Alignment / overlap
- Composition
- Negative features
21Types of Design Rules
- Scalable Design Rules (e.g. SCMOS)
- Based on scalable coarse grid - l (lambda)
- Idea reduce l value for each new process, but
keep rules the same - Key advantage portable layout
- Key disadvantage not everything scales the same
- Not used in real life
- Absolute Design Rules
- Based on absolute distances (e.g. 0.75µm)
- Tuned to a specific process (details usually
proprietary) - Complex, especially for deep submicron
- Layouts not portable
22SCMOS Design Rules
- Intended to be Scalable
- Original rules SCMOS
- Submicron SCMOS-SUBM
- Deep Submicron SCMOS-DEEP
- Pictorial Summary Book Fig. 2-24, p. 27
- Authoritative Reference www.mosis.org
23SCMOS Design Rule Summary
- Line size and spacing
- metal1 Minimum width3l, Minimum Spacing3l
- metal2 Minimum width3l, Minimum Spacing4l
- poly Minimum width 2l, Minimum Spacing2l
- ndiff/pdiff Minimum width 3l, Minimum
Spacing3l, minimum ndiff/pdiff seperation10l - wells minimum width10l, min distance form well
edge to source/drain5l - Transistors
- Min width3l
- Min length2l
- Min poly overhang2l
24SCMOS Design Rule Summary
- Contacts (Vias)
- Cut size exactly 2l X 2l
- Cut separation minimum 2l
- Overlap min 1l in all directions
- Magic approach Symbolic contact layer min. size
4l X 4l - Contacts cannot stack (i.e., metal2/metal1/poly)
- Other rules
- cut to poly must be 3l from other poly
- cut to diff must be 3l from other diff
- metal2/metal1 contact cannot be directly over
poly - negative features must be at least 2l in size
- CMP Density rules (AMI/HP subm) 15 Poly, 30
Metal
25Design Rule Checking in Magic
- Design violations displayed as error paint
- Find which rule is violated with "drc why Poly
must overhang transistor by at least 2 (MOSIS
rule 3.3)
26Scaling Design Rules
- Effects of scaling down are positive
- See book, p. 78-79 - if everything scales,
scaling circuit by 1/x increases performance by x - Problem not everything scales proportionally
27Aside - About MOSIS
- MOSIS - MOS Implementation Service
- Rapid-prototyping for small chips
- Multi-project chip idea - several designs on the
same wafer - Reduced mask costs per design
- Accepts layout designs via email
- Brokers fabrication by foundries (e.g. AMI,
Agilent, IBM, TSMC) - Packages chips ships back to designers
- Our designs will use AMI 1.5µm process (more
about this later)
28Aside - About MOSIS
- Some Typical MOSIS Prices (from www.mosis.org)
- AMI 1.5µm Tiny Chip (2.2mm X 2.2mm) 1,080
- AMI 1.5µm 9.4mm X 9.7mm 17,980
- AMI 0.5µm 0-5mm2 5,900
- TSMC 0.25µm 0-10mm2 15,550
- TSMC 0.18µm 0-7mm2 24,500
- TSMC 100-159mm2 63,250 900 X size
- MOSIS Educational Program (what we use)
- AMI 1.5µm Tiny Chip (2.2mm X 2.2mm) FREE
- AMI 0.5mm Tiny Chip (1.5mm X 1.5mm) FREE
sponsored by Semiconductor Industry Assn.,
Semiconductor Research Corp., AMI, Inc.,
DuPont Photomasks, and MOSIS
29Layout Considerations
- Break layout into interconnected cells
- Use hierarchy to control complexity
- Connect cells by
- Abutment
- Added wires
- Key goals
- Minimize size of overall layout
- Meet performance constraints
- Meet design time deadlines
30Hierarchy in Layout
- Chips are constructed as a hierarchy of cells
- Leaf cells - bottom of hierarchy
- Root cells - contains overall cell
- Example - hypothetical UART
- Pad frame - ring that contains I/O pads
- Core - contains logic organized as subcells
- Shift register
- FSM
- Other cells
31Hierarchy Example
32Wires
metal 3
6
metal 2
3
metal 1
3
pdiff/ndiff
3
poly
2
33Transistors
2
2
3
3
1
5
34Vias
- Types of via metal1/diff, metal1/poly,
metal1/metal2.
4
4
1
2
35Metal 3 via
- Type metal3/metal2.
- Rules
- cut 3 x 3
- overlap by metal2 1
- minimum spacing 3
- minimum spacing to via1 2
36Tub tie
4
1
37Spacings
- Diffusion/diffusion 3
- Poly/poly 2
- Poly/diffusion 1
- Via/via 2
- Metal1/metal1 3
- Metal2/metal2 4
- Metal3/metal3 4
38Overglass
- Cut in passivation layer.
- Minimum bonding pad 100 ?m.
- Pad overlap of glass opening 6
- Minimum pad spacing to unrelated metal2/3 30
- Minimum pad spacing to unrelated metal1, poly,
active 15
39Stick diagrams (1/3)
- A stick diagram is a cartoon of a layout.
- Does show all components/vias (except possibly
tub ties), relative placement. - Does not show exact placement, transistor sizes,
wire lengths, wire widths, tub boundaries.
40Stick Diagrams (2/3)
- Key idea "Stick figure cartoon" of a layout
- Useful for planning layout
- relative placement of transistors
- assignment of signals to layers
- connections between cells
- cell hierarchy
41Stick Diagrams (3/3)
42Example - Stick Diagrams (1/2)
Alternatives - Pull-up Network
Circuit Diagram.
Pull-Down Network (The easy part!)
Complete Stick Diagram
43Example - Stick Diagrams (2/2)
44Dynamic latch stick diagram
VDD
in
out
VSS
phi
phi
45Stick Diagram XOR Gate Examples
46Hierarchical Stick Diagrams
- Define cells by outlines use in a hierarchy to
build more complex cells
47Cell Connection Schemes
- External connection - wire cells together
- Abutment - design cells to connect when adjacent
- Reflection, mirroring - use to make abutment
possible
48Example 2-input multiplexer
49Sticks design of multiplexer
50NAND sticks
VDD
a
out
b
VSS
51Refined one-bit Mux Design
- Use NAND cell as black box
- Arrange easy power connections
- Vertical connections for allow multiple bits
523-bit mux sticks
select
select
m2(one-bit-mux)
select
select
VDD
ai
oi
a2
o2
VSS
bi
b2
m2(one-bit-mux)
select
select
VDD
ai
a1
oi
o1
VSS
bi
b1
m2(one-bit-mux)
select
select
VDD
ai
a0
oi
o0
VSS
bi
b0
53Multiple-Bit Mux
54Cell Mirroring, Overlap
- Use mirroring, overlap to save area
55Example Layout / Stick Diagram
- Create a layout for a NAND gate given
constraints - Use minimum-size transistors
- Assume power supply lines pass through cell
from left to right at top and bottom of cell - Assume inputs are on left side of cell
- Assume output is on right side of cell
- Optimize cell to minimize width
- Optimize cell to minimize overall area
56Layout Example
Exterior of Cell
Circuit Diagram.
57Example - Magic Layout
58Review - VLSI Levels of Abstraction
59Levels of Abstraction - Perspective
- Right now, were focusing on the low level
- Circuit level - transistors, wires, parasitics
- Layout level - mask objects
- Well work upward to higher levels
- Logic level - individual gates, latches,
flip-flops - Register- transfer level - Verilog HDL
- Behavior level - Specifications
60The Challenge of Design
- Start higher level (spec)
- Finish lower level (implementation)
- Must meet design criteria and constraints
- Design time - how long did it take to ship a
product? - Performance - how fast is the clock?
- Cost - NRE unit cost
- CAD tools - essential in modern design
61CAD Tool Survey Layout Design
- Layout Editors
- Design Rule Checkers (DRC)
- Circuit Extractors
- Layout vs. Schematic (LVS) Comparators
- Automatic Layout Tools
- Layout Generators
- ASIC Place/Route for Standard Cells, Gate Arrays
62Layout Editors
- Goal produce mask patterns for fabrication
- Grid type
- Absolute grid (MAX, LASI, LEdit, Mentor
ICStation, other commercial tools) - Magic lambda-based grid - easier to learn, but
less powerful - Mask description
- Absolute mask (one layer for each mask)
- Magic symbolic masks (layers combine to generate
actual mask patterns)
63Design Rule Checkers
- Goal identify design rule violations
- Often a separate tool (built in to Magic)
- General approach scanline algorithm
- Computationally intensive, especially for large
chips
64Circuit Extractors
- Goal extract netlist of equivalent circuit
- Identify active components
- Identify parasitic components
- Capacitors
- Resistors
65Layout Versus Schematic (LVS)
- Goal Compare layout, schematic netlists
- Compare transistors, connections (ignore
parasitics) - Issue error if two netlists are not equivalent
- Important for large designs
66Automatic Layout Tools
- Layout Generators - produce cell from spec.
- Simple Procedural specification of layout
- (see book Fig. 2-33, p. 95)
- Complex Netlist - places wires individual
transistors - ASIC - Place, route modules with fixed shape
- Standard Cells - use predefined cells as "cookie
cutters" - Gate Arrays - configurable pre-manufactured gates
(only change metal masks) - FPGAs - electrically configurable array of gates
67Layout design and analysis tools
- Layout editors are interactive tools.
- Design rule checkers are generally
batch---identify DRC errors on the layout. - Circuit extractors extract the netlist from the
layout. - Connectivity verification systems (CVS) compare
extracted and original netlists.
68Automatic layout
- Cell generators (macrocell generators) create
optimized layouts for ALUs, etc. - Standard cell/sea-of-gates layout creates layout
from predesigned cells custom routing. - Sea-of-gates allows routing over the cell.
69Standard cell layout
routing area
routing area
routing area
routing area