Title: Digital VLSI Design
1Digital VLSI Design
- Full Automation
- Maximum benefit of scaling
- High speed ,low power
2MOS
CONSTANT
3Design metrics
4Long Channel Vs. Short Channel
SAME
5Long Channel Vs. Short ChannelId vs Vgs
6Sub-threshold operation
Required----
7INVERTER
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9VTC DESIGN ISSUES
- STATIC POWER CONSUMPTION
- FULL LOGIC LEVELS
- SHARP TRANSITION
- SWITCHING THRESHOLD? NOISE MARGINS
10PRACTICAL VTC
11FIVE CRITICAL VOLTAGES
12SWITCHING THRESHOLD
- Vth
- Output changes its state
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14Noise Margins
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17ImplementationResistive load
18Design for Vol
19SAT. ENHANCEMENT LOAD INV.
20LIN. ENHANCEMENT LOAD INV.
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22Static characteristics
23Operating regions
24VOH
25VOL
26VIL
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28VIH
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30V th
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32Variation in Vth. by (w/L)
33Critical voltage
- Nothing
- We can design for wide noise margins
- Set Vth ½Vdd
34Why design for Vth? ½Vdd?
35Effect on kR
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38Switching characteristics
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41Delay calculationmethod 1
42CMOS Inverter Driving a Lumped Capacitance Load
- CMOS Inverter can be viewed as a single
transistor either charging the Cload or
discharging the Cload - Vin is assumed to switch abruptly
- If Vin switches high, the NMOS Tx discharges
Cload while the PMOS Tx turns OFF - If Vin switches low, the PMOS Tx charges Cload
while the NMOS Tx turns OFF - Cload is comprised of
- Cgate due to the gate capacitance of receiving
circuits - Cwire of the interconnect metal
- Cparasitics of the inverter output junctions
43Switch Model of CMOS TransistorMODEL-1
Approximate as a simple RC network where R is
given as an equivalent resistance of the NMOS and
PMOS devices and C is given as the total lumped
Cload capacitance
44CMOS Inverter Transient ResponseSwitch model
Vout VDD (1 e t / RONCL )
Vout VDD (e t / RONCL )
45In velocity saturated device
46Method 2
47CMOS Inverter Propagation Delay(AVERAGE CURRENT
THROUGH LOAD)
V
DD
-VDD)
t
C
(V
pHL
L
50
I
av
V
out
I
tpLH C L (V50-VOL)
C
L
av
Iav
V
V
in
DD
48- WHERE
- Iav, HL ½ic(VINVOH, VOUT VOH) ic(VINVOH,
VOUT V50) - Iav, LH ½ic(VINVOL, VOUT V50)
ic(VINVOL, VOUT VOL) - SIMPLE
- neglects variation of cap. during the entire
transition
49Method-3
Differential equation approach accurate
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55tpHL
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57tpLH
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59Impact of Rise Time on Delay
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61DELAY REDUCTION
62Delay as a function of VDD(?)
63Delay as a function of CL(?)DELAY a CLDelay
as a function of W/L(?)DELAY a (W/L)-1
64MINIMUM POSSIBLE DELAY
65Computing Intrinsic Transistor Capacitance
- Intrinsic PN junction capacitance of the driving
circuit must be added to the load capacitance
Cload - Consider the inverter example at left
- Area and perimeter of the PMOS and NMOS
transistors are calculated from the layout and
inserted into the circuit model - NMOS drain area Wn x Ddrain
- PMOS drain area Wp x Ddrain
- NMOS drain perimeter 2 (Wn Ddrain)
- PMOS drain perimeter 2 (Wp Ddrain)
- SPICE simulations were done (bottom left) for a
fixed extrinsic load of 100fF with increasing
transistor width (Wp/Wn 2.75) - Results show diminishing returns beyond a certain
Wn (say about 6 um) due to effect of the
increasing drain capacitance on the overall
capacitive load
66Area x Delay Figure of Merit
- Increasing device width shows diminishing returns
on propagation delay time - Define a figure of merit as area x delay for the
inverter circuit - Increasing device width Wn shows a minimum in
area x delay product - Unconstrained increase in transistor width in
order to improve circuit delay is often a poor
tradeoff due to the high cost of silicon real
estate on the wafer!!
67Power dissipation
68Why worry about power?-- Heat Dissipation
microprocessor power dissipation
DEC 21164
69Why worry about power Portability
70Where Does Power Go in CMOS?
71Power consumption
- 4 components
- Static power consumption
- Short circuit power consumption
- Leakage power consumption
- Dynamic power consumption
72Static power consumption
73Short circuit power
74CMOS Short-Circuit Power Dissipation Derivation
75Short Circuit Path
76- The total power in a CMOS circuit is given by
Ptotal Pd Psc Ps where - Pd is the dynamic average power (previous chart),
- Psc is the short circuit power,
- and Ps is the static power due to ratio circuit
current, junction leakage, and sub-threshold Ioff
leakage current - Short circuit current flows during the brief
transient when the pull down and pull up devices
both conduct at the same time where one (or both)
of the devices are in saturation
77- For a balanced CMOS inverter with ?n?p, and Vtn
Vtp, the short circuit power can be expressed
by - Psc (?/12)(Vdd 2Vt)3 (tr/f/tpin)
- where tpin is the period of the input waveform
and trf is the total risetime (or falltime) tr
tf trf
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79Modelling
80t1- t2, Mos operates in saturation At t2,
current reaches its maximum value At this point
vinvdd/2, because inverter is symmetrical I
mean 2x 2/T x ?Isat dt Limits(t1,
t2) ConditionsVin(t)(Vdd/t) t --assume vin
increases linearly with time tr tf trf Psc
(?/12)(Vdd 2Vt)3 (trf/tpin)
81Effect of load cap on short circuit power
- P short circuit reduces
- Reason---- output start switching after input has
completely stabilized
82Effect of Cload
83Dynamic power consumption
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85Average Dynamic Power in CMOS Inverter
- Average dynamic power derivation
- On negative going input, pull-up device charges
the load capacitance. On positive going input,
pull-down device discharges the load into ground.
- Average power given by
- Pave (1/T)?CL (dvout/dt) (Vdd vout)dt
(1/T)?(-1) CL (dvout/dt) vout dt where the
first integral is taken from 0 to T/2 and the
second integral is from T/2 to T - completion of the integral yields
- Pave CL Vdd2 f where f 1/T
- Note that the dynamic power is independent of the
typical device parameters, but is simply a
function of power supply, load capacitance and
frequency of the switching!
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87Dynamic Power Consumption - Revisited
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89Power Consumption is Data Dependentuniform
distribution of inputs
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91Transition Probabilities for Basic Gates
Non-uniform distribution of inputs
92No feedback
93Power consumptionCorrelated signals
½
94Leakage power consumption
95Power delay product
Indicates that energy required ? 0 for Vdd? 0
? erroneous
96Energy delay product
Shd. Be minimum
97Energy delay productoptimum Vdd
98Combinational logicSTATIC CMOS
GATESasynchronous designCan Be Made
Synchronous By Inserting Latches in between
99Design Styles Full Static CMOS or complementary
logic
100NOR
NAND
101XOR/ XNOR
DRAWBACK complementary signals are required
102F D A. (BC)
103Delay computation NAND worst case
104static CMOS gateVTC--Input data dependent
(R1R2) (CL) R1C1)
(R1R2) CL
105Uniform transistor sizing
- For the gate, Find equivalent inverter model
- Find the required transistor w/L
- Hence estimate w/L of each transistor
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107Influence of fan-in / fanout on propagation delay
108Other delay reduction techniques
- Progressive transistor sizing
- Input reordering
- Logic restructuring
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110Reduce power consumption
- Reduce switching activity
111Power consumption due to glitches
112Logic restructuring for glitch reduction
113Logic restructuring
114Input reordering affects
115Time multiplexing of resources
Very low switching activity
Very high switching activity as bus toggles
between 0 and 1
116Other design styles--Pseudo NMOS
117DCVSL
118Xor/ Xnor
ADVANTAGE---TRANSISTOR SHARING
DCVSL is advantageous for full adder
implementation Then static CMOS
119NAND/ AND
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121Logical effortSIMPLE MODEL FOR DELAY ESTIMATION
FOR STATIC GATE LOGIC
122CKT DESIGN PROBLEMS
- Chip designers face a bewildering array of
choices. - What is the best circuit topology for a function?
- How large size should the transistors be?
- How many stages of logic give least delay?
123Need of simple delay model
- Circuit designers waste too much time simulating
and tweaking circuits - High speed logic designers need to know where
time is going in their logic - CAD engineers need to understand circuits to
build better tools
124Delay in a Logic Gate
125Delay contributors
- ? is speed of basic transistor
- p-intrinsic delay of the gate due to its own
internal parasitic capacitances - H?combines the effect of external load with sizes
of transistors - G? effects of circuit topology, fan-in
126Estimation of ?
127CMOS Ring Oscillator Circuit
- An odd number of inverter circuits connected
serially with output brought back to input will
be astable and can be used an an oscillator
(called a ring oscillator) - Ring oscillators are typically used to
characterize a new technology as to its intrinsic
device performance - Frequency and stage are related as follows
- f 1/T 1/(2n?P)
- where n is the number of stages and
- ?P is the stage delay
128Observations
- Logical effort describes relative ability of gate
topology to deliver current (defined to be 1 for
an inverter) - More complex gates have greater logical effort
and parasitic delay - Electrical effort is the ratio of output to input
capacitance - Delay increases with electrical effort
129Computing Logical Effort
130Different gates
131Observations
- More complex gates have larger logical efforts.
- Complex gates exhibit high g, greater delay
- Logical efforts grow with increase in no. of
inputs
132Parasitic delay
- It is fixed for a gate
- More complex gatehigher parasitic delay
- Pinv1 (inverter parasitic delay )
- For other gates , parasitic delay is written in
terms of pinv
133Parasitic delay
134How to compute Pinv
- For inv. g1, dabst(hpinv)
- In a given tech. plot dabs vs. h
- Plot would be st. line with slope t,
intercept-pinv t - Pinv can be estimated after obtaining t
- Draw similar plot for other gates
- Once t is obtained, g and p of other gates can be
found out.
135Delay equation plot
136Calculating delay of a gate
EE141
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137Using LE in design
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138Sizing a path for minimum delay
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139Branching effort along a path
? Used for sizing for delay
Where BH is
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140Observations regarding F
- F depends on only topology and loading
- F is Indep. of transistor sizes
- F is unchanged if inverters are added or removed
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141Path Delay D
- Sum of delay of all stages
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142Condition for min. path delay
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143On Differentiation
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144Thus, minimum stage effort of each stage reqd.
for min. delay along a path is
We shd. choose transistor sizes such that stage
effort is same for all blocks
Thus, minimum delay achievable along a path is
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145Example
Compute for each stage
i
Apply capacitance transformation backwards
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146EE141
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147Transistor sizes
All stages shd. have same sizes C n W LMIN
Cox n is a non zero no. Each stage load 3 (w
l) Cox Lmin size
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148Transistor sizes
- Inverter load at the input Cz (1pmos1nmos)
gate load - Wnmos Wpmos Lmin Cox
- Here
- CzCL Wnmos Wpmos Lmin Cox 2 Wnmos Lmin
Cox - In a given tech., Lmin is fixed, say 1um
- given 1Cg Wmin Lmin Cox
- Then if CZ 100Cg then Wnmos 100 Cg /2 Lmin
Cox - Wnmos ½100 Wmin
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149Ca Cb Wnmos Wpmos Lmin Cox
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150Optimizing no of stages in a path for min. delay
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151To find optimum N
If pinv 0,
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152For N stages in chain with inverters Best delay
per stage , d gh pinv
d ? pinv
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153Graphical sol
As pinv grows, adding inverters become less
advantageous
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154Mis-sizing the gate
155Mis number the gates
156Driving Large Capacitances-use LE
157Using Cascaded Buffers
158design
- Determine N, u
- cLun1 cg
- (n1)ln (cL/cg) / ln(u)
- Delayto (cdu cg) / (cdcg)
- Delay total (n1) to (cdu cg) / (cdcg)
- Delay total ln (cL/cg) / ln(u)
- to (cdu
cg) / (cdcg) - u(ln u-1) (cd/cg) 0
- U e
159Other logic design styles