Title: Testing and Faults
1Testing and Faults
2Chip Technology
3Chip Technology
4Chip Technology
5Chip Technology
6Chip Technology
7Chip Technology
8Chip Technology
GHz frequency
9Testing and Faults
10Testing and Faults
11Testing and Faults
12Testing and Faults
13Testing and Faults
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22Wafer Cost
Chip Yield
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26Testing and Faults
27Wafer Cost
Yield 6/12 50
Yield 57/64 89
Wafer Cost 10,000
28Wafer Cost
29Wafer Cost
30Wafer Cost
31Wafer Cost
32Wafer Cost
33Wafer Cost
34Testing and Faults
Fault Cost
Wafer 0.01 - 0.1 Packaged
Chip 0.1 - 1 Board 1 -
10 System 10 100 Field
100 - 1000
35Testing and Faults
Pentium Bug
824 633 702 441.0 X 1/ 824 633 702 441.0
0.999 999 996 274 709 702 Due to
faulty floating point number divide look-up table
36Testing and Faults
32bit Adder Test
37Testing and Faults
32bit Adder Test
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32bit Adder Test
39Testing and Faults
32bit Adder Test
40Testing and Faults
32bit Adder Test
41Testing and Faults
32bit Adder Test
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46Testing and Faults
SA0 Stuck at 0 SA1 Stuck at 1
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50Testing and Faults
Input A stuck at 1 (SA1)?
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59Testing and Faults
Test Vector for A SA1 A 0, B 1, C 0, D
1, F 0/1
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Test Vector for A SA1 A 0, B 1, C 0, D
1, F 0/1 Test Vector for A SA0 A 1, B 1, C
0, D 1, F 1/0
61Testing and Faults
Test Vector for A SA1 A 0, B 1, C 0, D
1, F 0/1 Test Vector for A SA0 A 1, B 1, C
0, D 1, F 1/0 Test Vector for A SA0 A 1,
B 1, C 0, D 0, F 0/1
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64Testing and Faults
65Testing and Faults
Boolean Difference
66Testing and Faults
Boolean Difference
67Testing and Faults
Boolean Difference
68Testing and Faults
Boolean Difference
69Testing and Faults
Boolean Difference
70Testing and Faults
Boolean Difference
71Testing and Faults
Boolean Difference
72Testing and Faults
Boolean Difference
73Testing and Faults
Boolean Difference
74Testing and Faults
75Testing and Faults
Boolean Difference Equation dF/dA F(A1)
F(A0)
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