CSCE 613: Fundamentals of VLSI Chip Design - PowerPoint PPT Presentation

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CSCE 613: Fundamentals of VLSI Chip Design

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Forms covalent bonds with four neighbor atoms (3D cubic crystal lattice) ... classes of MOSIS SCMOS rules: SUBMICRON, DEEP SUBMICRON. Fund. of VLSI Chip Design 22 ... – PowerPoint PPT presentation

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Title: CSCE 613: Fundamentals of VLSI Chip Design


1
CSCE 613 Fundamentals of VLSI Chip Design
  • Instructor Jason D. Bakos

2
Topics for this Lecture
  • Semiconductor theory in a nutshell
  • MOSFET devices as switches
  • Transistor-level logic
  • Logic gates
  • IC fabrication
  • SCMOS design rules
  • Cell libraries

3
Elements
4
Semiconductors
  • Silicon is a group IV element (4 valence
    electrons, shells 2, 8, 18, )
  • Forms covalent bonds with four neighbor atoms (3D
    cubic crystal lattice)
  • Si is a poor conductor, but conduction
    characteristics may be altered
  • Add impurities/dopants (replaces silicon atom in
    lattice)
  • Makes a better conductor
  • Group V element (phosphorus/arsenic) gt 5 valence
    electrons
  • Leaves an electron free gt n-type semiconductor
    (electrons, negative carriers)
  • Group III element (boron) gt 3 valence electrons
  • Borrows an electron from neighbor gt p-type
    semiconductor (holes, positive carriers)


-
-


- - - - - -

- - - - - -
P-N junction
forward bias
reverse bias
5
MOSFETs
  • Diodes not very useful for building logic
  • Metal-oxide-semiconductor structures built onto
    substrate
  • Diffusion Inject dopants into substrate
  • Oxidation Form layer of SiO2 (glass)
  • Deposition and etching Add aluminum/copper wires

negative voltage (rel. to body) (GND)
positive voltage (Vdd)
NMOS/NFET
PMOS/PFET
- - -

- - -

current
current
channel shorter length, faster transistor (dist.
for electrons)
body/bulk GROUND
body/bulk HIGH
(S/D to body is reverse-biased)
6
FETs as Switches
  • NFETs and PFETs can act as switches

CMOS logic
bulk node not shown
pull-up OFF pull-up ON
pull-down OFF Z (floating) 1
pull-down ON 0 smokin!
CMOS assuming PU and PN network are perfect
switches and switch simultanously, no current
flow and no power consumption!
and structure
or structure
7
Logic Gates
  • CMOS complimentary in form and function
  • NMOS devices (positive logic) form pull-down
    network
  • PMOS devices (negative logic) form pull-up
    network
  • Implication CMOS transistor-level logic gates
    implement functions where may the inputs are
    inverted (inverting gates)
  • Add inverter at inputs/outputs to create
    non-inverting gate

inv
NOR2
NAND2
NAND3
8
Compound Gates
  • Combine parallel and series structures to form
    compound gates
  • Example
  • Use DeMorgans law to determine complement
    (pull-down network)

C
A
B
D
Y
C
A
B
D
9
Pass Transistors/Transmission Gates
  • NMOS passes strong 0 (pull-down)
  • PMOS passes strong 1 (pull-up)

Pass transistor
Transmission gate
10
Tristates
11
Multiplexer
Transmission gate multiplexer
Inverting multiplexer
12
Multiplexer
4-input multiplexer
13
Latches
Positive level-sensitive latch
14
Latches
Positive edge-sensitive latch
15
IC Fabrication
  • Inverter cross-section

field oxide
16
IC Fabrication
  • Inverter cross-section with well and substrate
    contacts

(ohmic contact)
17
IC Fabrication
  • Chips are fabricated using set of masks
  • Photolithography
  • Inverter uses 6 layers
  • n-well, poly, n diffusion, p diffusion,
    contact, metal
  • Basic steps
  • oxidize
  • apply photoresist
  • remove photoresist with mask
  • HF acid eats oxide but not photoresist
  • pirana acid eats photoresist
  • ion implantation (diffusion, wells)
  • vapor deposition (poly)
  • plasma etching (metal)

18
IC Fabrication
Furnace used to oxidize (900-1200 C)
Mask exposes photoresist to light, allowing
removal
HF acid etch
piranha acid etch
diffusion (gas) or ion implantation (electric
field)
HF acid etch
19
IC Fabrication
Heavy doped poly is grown with gas in furnace
(chemical vapor deposition)
Masked used to pattern poly
Poly is not affected by ion implantation
20
IC Fabrication
Metal is sputtered (with vapor) and plasma etched
from mask
21
Layout Design Rules
  • Design rules define ranges for features
  • Examples
  • min. wire widths to avoid breaks
  • min. spacings to avoid shorts
  • minimum overlaps to ensure complete overlaps
  • Measured in microns
  • Required for resolution/tolerances of masks
  • Fabrication processes defined by minimum channel
    width
  • Also minimum width of poly traces
  • Defines how fast a fabrication process is
  • Lambda-based (scalable CMOS) design rules define
    scalable rules based on l (which is half of the
    minimum channel length)
  • classes of MOSIS SCMOS rules SUBMICRON, DEEP
    SUBMICRON

22
Layout Design Rules
23
Layout Design Rules
  • Transistor dimensions are in W/L ratio
  • NFETs are usually twice the width
  • PFETs are usually twice the width of NFETs
  • Holes move more slowly than electrons (must be
    wider to deliver same current)

24
Layout
3-input NAND
25
Design Flow
  • Design flow is a sequence of steps for design and
    verification
  • In this course
  • Describe behaviors with VHDL/Verilog code
  • Simulate behavioral designs
  • Synthesize behaviors into cell-level netlists
  • Simulate netlists with cell-delay models
  • Place-and-route netlists into a physical design
  • Simulate netlists with cell-delay models and
    wire-delay models
  • Need to define a cell library
  • Function
  • Electrical characteristics of each cell
  • Layout

26
Cell Library (Snap Together)
Layout
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