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FAULTTOLERANT TECHNIQUES FOR NANOCOMPUTERS

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Title: FAULTTOLERANT TECHNIQUES FOR NANOCOMPUTERS


1
FAULT-TOLERANT TECHNIQUES FOR NANOCOMPUTERS
  • GARIMELLA SUDHEEREE 585 Fault Tolerant Computing

2
NANOCOMPUTERS
  • A Nanocomputer is a computer whose physical
    dimensions are microscopic.
  • The proposed Nanometer-Scale devices should
    eventually permit very large scale of
    integration of the order of 1012 devices per
    chip. ( However this is still at academic level).
  • Current state-of-the-art microprocessors have
    more than 40 million transistors by 2012 they
    could have five billion.

3
Nanocomputers contd.
  • Nanoelectronic devices are more fragile than the
    conventional devices, and will be sensitive to
    external influences such as
  • Radiation related effects
  • High Temperature
  • Electromagnetic Interference
  • Parameter Fluctuations etc.
  • Hence, fault-tolerant architectures will
    certainly be necessary in order to produce
    reliable systems that are immune to manufacturing
    defects and to transient errors.

4
Introduction
  • The nanometer-sized electronic devices are prone
    to errors at both Manufacturing and service
    level.
  • The present day manufacturing failure rate of
    CMOS is approximately 10-7 to 10-6.
  • Failure rate for highly experimental devices such
    as molecular transistors is currently just below
    unity.
  • Failure rate cannot be exactly predicted for
    nanoscale devices but it will be significantly
    poorer than the present day transistors.

5
Fault Tolerant Techniques
  • The proposed fault tolerant techniques for
    nanocomputers are
  • R- Fold modular redundancy (RMR)
  • Cascaded triple modular redundancy (CTMR)
  • NAND Multiplexing
  • Reconfiguration.
  • The first two techniques are mainly used to
    correct transient errors.
  • Finally reconfiguration technique is suitable for
    tackling manufacturing defects.

6
R-Fold Modular Redundancy
  • RMR is a generalization of TMR.
  • In Triple modular redundancy three units work in
    parallel and their outputs are compared with a
    majority gate.
  • Similarly in RMR R units work in parallel ( where
    R 3,5,7,9..).

7
Cascaded Triple Modular Redundancy
  • The TMR process can be repeated by combining
    three of the TMR units with another majority
    gate to form a second order TMR unit with even
    higher reliability

8
NAND Multiplexing
  • NAND multiplexing was proposed by Von Neumann 50
    years ago.
  • This method is similar to RMR, but instead of
    majority gate to decide output, the output is
    carried out on a bundle of wires (Given as
    Nbundle ).
  • IT has two stages
  • Executive stage.
  • Restorative stage.

9
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10
NAND Multiplexing Contd.
  • The executive stage, performs the basic function
    of the processing unit in parallel.
  • The restorative stage, reduces the degradation
    caused by the executive stage and thus acts as a
    non-linear amplifier of the output.
  • The signals to and from units are not carried in
    single lines but in bundles and the unit is
    replicated the appropriate number of times.

11
NAND Multiplexing Contd.
  • If the inputs and processing units are perfectly
    reliable then the lines comprising each output
    should be identically stimulated (1) or
    unstimulated (0).
  • However, due to errors in the input data as well
    as errors occurring in the processing of the
    inputs from faulty devices, not all of the output
    lines in each output will be identically
    stimulated.
  • Thus, for multiplexed networks, the final outputs
    are considered to be 1 if more than (1 -a)Nbundle
    lines are stimulated and 0 if less than aNbundle
    lines are stimulated. ( 0ltalt0.5, is predefined
    critical level).

12
Reconfiguration
  • This technique is used for overcoming
    Manufacturing defects.
  • Defective devices are assembled in groups to form
    CLBs (Configurable logic blocks).
  • These CLBS are grouped together to form AFTBS
    (Atomic fault-tolerant blocks)
  • The AFTBs are then grouped together, NA at a
    time, to
  • form a cluster which then performs some
    desired function.

13
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14
Results
15
Emerging architectures for nanocomputers
16
Conclusions
  • The implications of these results are that the
    future usefulness of various nanoelectronic
    devices may be seriously limited if they cannot
    be made in large quantities with a high degree of
    reliability.
  • It is theoretically possible to make very large
    functional circuits, even with one dead device in
    ten, but only if the dead devices can be located
    and the circuit reconfigured to avoid them.

17
Current Nanocomputers
  • Spray on Nanocomputer
  • Teramac custom computer which uses
    Reconfiguration technique.

18
Referances
  • Fault tolerant techniques for Nanocomputers by K
    Nikolic, A Sadek and M Forshaw.
  • Fault tolerant techniques for Nanocomputers NAND
    Multiplexing By Jie Han and Pieter Jonker.
  • http//www.hpl.hp.com/personal/Bruce_Culbertson/Te
    ramacBib.html

19
  • QUESTIONS ??
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