AFM Artifacts

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AFM Artifacts
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Outline

• Probe Artifacts
• Scanner Artifacts
• Image Processing Artifacts
• Vibrations/Contamination/Electronic
• Scan Parameters

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Probe
400 x 400 nm
8 nm diameter sphere, line profile 92 nm in x
direction
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Probe
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Probe
91 X 91 µ
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Probe
700 X 700 nm
700 X 700 nm
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Scanner
Large angle between AFM Scanner/Sample
Identify artifact by changing the scanner/sample
angle
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Scanner
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Scanner
Z Calibration at one point does not assure
calibration at other points in the total Z range.
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Scanner
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Scanner
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Scanner
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Scanner
X-Y orthogonality
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Scanner
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Light Lever Sensor Artifacts
Oscillations caused by laser diffraction in the
LL force sensor
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Image Processing
Original image
Line leveled image
Line leveledparticles excluded
All images 1.6 X 1.6 µ
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Image Processing
Image Filtering
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Image Processing
NanoTube AFM Image
850 X 850 nm
Image Filtering
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Vibrations
With vibrations
Without Vibrations
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Contamination
Surface Contamination
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Electronic
Electronic Noise
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Scan Parameters