Title: Ionization Chambers I
1Ionization Chambers I
- Introduction
- Free-Air Ion Chambers
2Introduction
- The ionization chamber is the most widely used
type of dosimeter for precise measurements, such
as those required in radiotherapy - Such chambers are commercially available in a
variety of designs for different applications,
and may be constructed in a machine shop when
special designs are required
3Introduction (cont.)
- If the ion-collecting gas volume can be
determined by means other than calibration in a
known field of ionizing radiation, the chamber
becomes an absolute dosimeter - This is, however, not usually practicable outside
of national standards laboratories, and in any
case it is preferable to work with dosimeters
having calibrations traceable to such a laboratory
4Introduction (cont.)
- We will begin by discussing free-air ionization
chambers - Chambers of this type, although seldom seen
except in standards laboratories, experimentally
demonstrate the concepts of exposure, CPE, and
ion-chamber absoluteness
5Free-Air Ion Chambers Conventional Designs
- The definition of exposure requires the
measurement of all the ionization produced by
collision interactions in air by the electrons
resulting from x-ray interactions in a known mass
of air - However, the experimental difficulty of doing
this generally requires one to rely on
charged-particle equilibrium - Only in one special design (to be discussed
later) is dependence upon this requirement to
replace to replace lost electrons avoided
6Conventional Designs (cont.)
- A number of different designs of free-air
chambers have evolved in standardization
laboratories in different countries, some
cylindrical and some plane-parallel in geometry - We will first consider the plane-parallel type,
such as that used at the NBS in calibrating
cavity ion chambers for constant x-ray-tube
potentials from 50 to 300 kV
7Conventional Designs (cont.)
- The following diagram is a schematic plan view of
such a chamber, which is enclosed in a Pb
shielding box to exclude x rays scattering in
from elsewhere - At the front of the box is a tungsten-alloy
diaphragm that is aligned with the x-ray beam
central axis, and passes a beam of
cross-sectional area A0 in the plane of axial
point P - This is the point where cavity chambers to be
compared with the free-air chamber are to be
centered, after the beam has been calibrated and
the free-air chamber is removed
8Schematic plan view of a typical standard
free-air ionization chamber
9Conventional Designs (cont.)
- The plate system inside the box consists of three
coplanar plates on one side of the beam and a
parallel high-voltage plate opposite - The plates are all parallel to the x-ray beam
axis, and equidistant from it - The distance of the plates from the beam is
designed to put them beyond the range of
substantially all the secondary electrons
originating in the beam (e.g., electron e1)
10Conventional Designs (cont.)
- To provide a uniform electric field between the
plates, a set of wires encircles the space
between them at both ends and at the top and
bottom - The chamber height from wire to wire equals the
width from plate to plate - These wires are electrically biased in uniform
steps to establish parallel equipotential planes
between the plates - The guard electrodes also assist in producing
field uniformity
11Conventional Designs (cont.)
- Under these conditions the electric lines of
force (paths followed by and ions) go
straight across the chamber, perpendicular to the
plates - Ions of one sign produced within the larger
shaded volume (V), and not lost in ion
recombination, are thus transported to the
collector plate, electrically connected to the
electrometer input - The dimension l is the collector length plus half
the gap width between collector and guard plate
at each end
12Charged-Particle Equilibrium
- The collecting volume V is penetrated by the
x-ray beam passing through the aperture - The volume V is common to both V and the volume
occupied by the beam itself V is shown
crosshatched in the diagram - V is the actual volume of origin of the secondary
electrons whose ionization we wish to measure
13CPE (cont.)
- The lateral dimensions of the chamber are great
enough to accommodate electrons like e1, which
remain within V and thus produce all their
ionization where it will be collected and
measured - The electrons like e2, which originate within the
defined volume of origin V, may have paths that
carry some of their kinetic energy out of V,
where the remaining ionization they produce will
not reach the collector, but will go to the
grounded guard plate instead - This ionization must be replaced by other
electrons such as e3 that originate in the beam
outside of volume V
14CPE (cont.)
- For x-ray tube potentials up to 0.5 MeV the
electrons have nearly equal tendencies to move
forward and backward in the chamber, due to their
initial angular distribution being predominantly
sideways to the beam direction, and the effect of
scattering in the air - Thus the attenuation of the x-rays in the
distance l, separating the place of origin of
corresponding electrons e2 and e3, tends to
cancel, and the charge compensation is nearly
exact - Moreover, the effective center of origin of
electrons is the geometric center P of V and V
15CPE (cont.)
- Consequently the volume Vas a whole is in
charged-particle equilibrium - That is, the ionization produced by all of the
electrons originating in the beam within V is
equal to all of the ionization produced within
V, and the correct amount of charge is thus
measured (neglecting the small effects of
scattered photons, bremsstrahlung, and ionic
recombination, yet to be discussed)
16CPE (cont.)
- Notice that the distance from the boundaries of V
to each end of the lead box must be greater than
the maximum electron range also, to avoid
perturbing the CPE condition - In summary, one can say that the distance from
the volume of origin V to an obstruction in any
direction must exceed the electron range, to
preserve CPE in the volume V - Note that elementary volumes within V are not in
CPE only the volume V as a whole satisfies CPE
17Accurate Definition of the Mass of Air, m, in the
Definition of Exposure
- Defining the mass of air, m, by which the
measured charge is to be divided to obtain the
exposure can be simplified by noticing that each
photon passing through the defining aperture
passes through the volume V, except for those
attenuated or scattered away in the air - If the fluence is ?0 (photons/m2) at the aperture
of area A0 (m2), then ?0A0 photons will enter
18Mass of Air (cont.)
- Ignoring air effects, the fluence ? decreases in
proportion to the inverse square of the distance
from the source, as the beam proceeds through the
chamber - Simultaneously the area A increases in proportion
to the square of the distance from the source - Thus ?A remains constant and equal to ?0A0
through the chamber
19Mass of Air (cont.)
- Evidently then the number of electrons produced
by ?A photons in traversing the volume V, of
length l (m), will be constant, irrespective of
the actual cross-sectional area A of the beam in
V, so long as the path length of each x ray in
passing through V is not significantly increases
by the angle ? the x-ray makes with the central
axis - In all practical cases the source is sufficiently
distant that l/cos ? ? l, and this error is
negligible - Consequently one can replace the actual volume of
origin V by a cylindrical volume Vc A0l (m3),
which is multiplied by the air density ? (kg/m3)
to obtain the defined mass m (kg) of air
20Mass of Air (cont.)
- The exposure at the aperture (point P) is thus
determined by the measurement, which must be
corrected upward by the air attenuation occurring
in the distance between P and the midpoint P in
V - If Q (C) is the charge produced in V, the
exposure at point P is given (in C/kg) by - where x is the distance from P to P, and µ
is the air attenuation coefficient
21Proof that the Exposure is Defined at the Plane
of the Aperture
- Although the foregoing argument is reasonable, a
more rigorous proof of exactly what it is that is
measured by a free-air chamber would be desirable - Let A0 be the aperture area, at distance y from
the source S in the following figure - ?0 is the energy fluence at point P in the plane
of the defining aperture - A disc-shaped mass element of air dm0 ?A0 ds is
located at P
22The free-air chamber geometry discussed in the
proof
23Proof (cont.)
- The electrons resulting from x-ray interactions
in dm0, if allowed to dissipate all their energy
in air, would produce a charge of either sign
equal to
24Proof (cont.)
- Consider now a second elemental mass of air dm,
at a distance s from the source, and a part of
the volume V occupied by the beam and the
collecting volume V - dm is irradiated by an energy fluence ?(s)
-
25Proof (cont.)
- Thus the ionization produced by the electrons
that originate in dm will be given by -
26Proof (cont.)
- We assume that this charge is all collected and
measured (i.e., that CPE exists for volume V,
and that no ionic recombination occurs) - The charge due to electrons from elemental mass
dm is less than that from dm0 by the amount of
beam attenuation in the intervening air column
27Proof (cont.)
- The total charge Q generated by electrons
originating in all of V is - where s1 is the distance from the x-ray
source to the front plane of V
28Proof (cont.)
- Letting x s y and x1 s1 y, the above
integral can be recast in the form
29Proof (cont.)
- Since x1 (l/2) is the distance from the
aperture P to the midpoint P of volume V, we see
that Q is the charge due to the electrons
originating in the cylindrical mass ?A0l, exposed
to the energy fluence ?0 that exists at the
aperture P, and corrected for attenuation in air
through the distance from P to P
30Proof (cont.)
- The exposure at point P (aperture) is
31Proof (cont.)
- The measured charge (assuming no recombination
occurs) per unit mass in cylindrical volume A0l
is -
32Proof (cont.)
- Hence the exposure at point P is related to the
value of Q/m by - where m is the mass of air in the cylindrical
volume A0l
33Scattered X-rays in the Chamber
- In the preceding treatment µ was taken to be the
narrow-beam attenuation coefficient for the
x-rays passing through air - This supposes that scattered photons do not
result in measurable ionization in the chamber - That is not strictly the case, as can be seen
from the following diagram - Initially ignoring the plastic tube, we see that
photons h?1 and h?2 are x-rays scattered out of
the beam, which interact with other air atoms to
launch electrons e1 and e2, respectively, thus
producing excess ionization in the volume V
34Measurement of the ionization due to scattered
x-rays in a free-air chamber by the plastic-tube
method
35Scattered X-rays (cont.)
- Likewise photon h?3, a bremsstrahlung x-ray
emitted by electron e3, may give rise to another
electron e4, which produces unwanted ionization,
since the exposure is supposed to exclude
ionization due to bremsstrahlung produced by the
electrons that originate in the defined mass of
air
36Scattered X-rays (cont.)
- The ionization contribution due to scattered and
bremsstrahlung x-ray can be determined as follows - A tube of nearly air-equivalent material such as
Lucite, extending the full length of the
ion-chamber enclosure, is positioned inside the
chamber so that the x-ray beam passes through it
from end to end without striking it - The tube must have walls thick enough to stop the
electrons originating inside it, but thin w.r.t.
attenuation of the scattered x rays, so that they
may escape unimpeded
37Scattered X-rays (cont.)
- The plastic is completely coated with conducting
graphite, and biased at half of the potential of
the HV plate to minimize field distortion - The ratio of the ionization measured with the
tube in place to that with the tube removed will
approximate the fraction fs of the total
ionization that is contributed by scattered and
bremsstrahlung x rays
38Other Causes of Electric-Field Distortion in
Parallel-Plate Chambers
- Parallel-plate free-air chambers such as the NBS
design must have a uniform electric field between
the high-voltage plate and the collector-guard
plates, to assure that the dimensions of the
ion-collection volume V and the length of the
volume V are accurately known - The electrical lines of force must go straight
across, perpendicular to the plates
39Electric-Field Distortion (cont.)
- To accomplish this, in addition to the
graded-potential guard wires already mentioned,
it is also important that - all the plates be parallel to each other and to
the beam axis, which must be perpendicular to the
front and back boundaries of the volume V, - the collector and guard plates be coplanar, and
- the collector be kept at the same electrical
potential as the guards (usually at ground)
40Electric-Field Distortion (cont.)
- Even the contact potentials of the surfaces of
these plates must be the same (e.g.,
electroplated with nonoxidizing metal) if local
electric-field distortion near the gaps between
them is to be avoided - Null-type electrometer circuits, which maintain
the input potential at its initial value
throughout the period of charge collection, are
essential for this application
41Electric-Field Distortion (cont.)
- The first diagram illustrates the distorting
effects of non-coplanarity of the guard and
collector plates, and the second diagram of
having the collector surface at a different
potential than that of the guard - Note that ?HV averaging removes the error in the
second diagram, but not in the first
42Effect of collector (C) misalignment with guards
(G)
43Effect of collector plate surface potential being
higher ( 1 V) than guard plates
44Variable-Length Free-Air Chamber
- This chamber consists of two telescoping
cylinders with the x-ray beam passing along their
axis through holes at the centers of the two flat
ends - The holes are covered by windows W of conducting
plastic to keep out stray electrons and provide
electrostatic shielding for the collecting
electrode inside - The x-ray beam is defined by passing it through
an aperture of known area in a fixed diaphragm,
aligned with the chamber axis
45The variable-length type of free-air chamber
46Variable-Length Chamber (cont.)
- The ions formed throughout the chamber are
collected on an off-center telescoping metal rod,
correcting for ion recombination as necessary - The chamber shell is operated at high potential
(e.g., ?5000 V) and is enclosed in a Pb-lined box
to keep out scattered x rays - The diameter of the collecting rod is made small
enough, and its position far enough from the
x-ray beam, that only a very small (lt0.01) loss
of ionization results from electrons striking it
47Variable-Length Chamber (cont.)
- The chamber dimensions are such that, in its
collapsed condition, electrons originating in the
x-ray beam where it crosses the fixed central
plane cannot reach the walls in any direction - Likewise no electrons from the window W are
capable of reaching the central plane
48Variable-Length Chamber (cont.)
- After an ionization measurement Q1 is made in the
collapsed condition, the chamber volume is
expanded by a length ?L (as much as twofold),
while keeping the chamber midplane and the
defining aperture fixed relative to the x-ray
source - A second ionization measurement Q2 is then made
49Variable-Length Chamber (cont.)
- The ionization component measured from the volume
A is the same as that from A except for a slight
(lt1) increase due to decreased beam attenuation - The same can be said for volumes B and B, except
that the attenuation effect is in the reverse
direction, canceling that for A to A (assuming
linear attenuation, which is accurate to within
0.01 for attenuations lt 1)
50Variable-Length Chamber (cont.)
- Therefore the observed increase in ionization (Q2
Q1) must be due only to the electrons that
originate in crosshatched volume V1 in the center
of the chamber - Those electrons will all run their full range in
air and produce their full complement of
ionization that will be measured directly in
accordance with the definition of exposure - They need not remain in volume V to do this,
since ions are collected from A and B as well
51Variable-Length Chamber (cont.)
- If A0 is the aperture area (m2), ?L is the length
of chamber expansion (m), and ? is the air
density (kg/m3), then the exposure at the
aperture is given by - where x is the distance from the aperture to
the fixed central plane, µ is the narrow-beam
attenuation coefficient for the x-rays in air, fs
is the fraction of Q2 Q1 that is produced by
scattered and bremsstrahlung x rays, and fe is
the fraction lost due to any electrons being
stopped by the collecting rod and inadequate
chamber radius
52Variable-Length Chamber (cont.)
- The advantages of this design of free-air chamber
over conventional designs are several - There is no dependence of the measurement upon
CPE. Since the electrons originating in V1
cannot escape from the ion-collecting volume,
there is no need for replacement of lost
electrons - There is no need for electric-field uniformity,
plate alignment, or maintenance of the collector
at ground potential - The air mass can be defined more accurately, as
the uncertainty in the length of the collecting
volume in a conventional chamber is eliminated.
?L can be determined by a precision screw, or
even gauge blocks if desired
53Variable-Length Chamber (cont.)
- It is necessary to cover the collecting-rod
insulators at both ends of the chamber with
conducting cups to avoid instability caused by
charge collection on the insulator surfaces - In general it is a good idea to minimize the bare
surface area of insulators facing into the
collecting volume of any ion chamber, to avoid
this kind of instability - This holds true for cavity chambers as well as
free-air chambers
54High-Energy Free-Air Ion Chambers
- Free-air chambers are practical mainly with
x-rays generated at energies between 10 and 300
keV - At higher energies the range of the secondary
electrons in air becomes so great that the size
of the chamber becomes prohibitively large
55High-Energy Chambers (cont.)
- Joyet suggested employing a longitudinal magnetic
field in a conventional free-air chamber to bend
electron paths into spirals and thus prevent
their striking the walls even for x-ray energies
up to 50 MeV - Joyet pointed out that, as photons are increased
in energy, the secondary electrons produced in
Compton and pair-production events become more
energetic but more forward directed
56Schematic plan view of a parallel-plate free-air
chamber with magnetic field and solid
air-equivalent filters
57High-Energy Chambers (cont.)
- The maximum side-directed (90) component of the
secondary-electron energy resulting from 50-MeV
photons is only about 3 MeV, as shown by the
dashed curve on the right ordinate of the
following diagram - The solid curve shows the magnetic field strength
necessary to bend such electrons into spiral
paths of radius 6 cm, which would prevent
electrons from striking the wall in the chamber
shown in the previous diagram
58Maximum transverse energy Ee sin ? of the recoil
electrons for incident quanta up to 50 MeV, and
intensity of the magnetic field for the
containment of the recoil electrons between the
parallel plates
59High-Energy Chambers (cont.)
- The fatal flaw in this design is that it is not
really a free-air chamber - To produce CPE in the collecting volume a
sufficiently thick layer of solid
air-equivalent material must be provided
upstream to build up an equilibrium population of
electrons passing through the ion-collecting
region - One may as well make a thick-walled cavity
chamber out of the air-equivalent material instead