Qualification Test of UFE Board

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Qualification Test of UFE Board
Schematic diagram of UFE Board types and
current status Qualification test
procedures VA UFE test setup Test
results Conclusion C. H. Chung AMS TRD
eeting, July 16 17. 2002 _at_CERN
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Schematic Diagram of UFE
Applied Power
12 bit ADC AD7476
HCC Chip
VA32 HDR12 Preamp. Shaping Multiplexing Peak. T
2.4ms Power55mW
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UFE Board Types
UFE45M21
UFE45S17
ADC
VA
Op. Amp
UFE90S96
UFE90M18
UFE development made up to the present
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Test Procedures
Measurements Gain, Pedestals, Noise, Linearity,
Connectivity
More Qualification Tests Mechanical Vibration
Thermo Vacuum EMI
Production
VA Hybrid
Peaking Time 2.4 ms Gain 2.0 ADC counts
/ fC Pedestals and Noise All channels
within 1 of the mean gain All channels
within 3 non-linearity Connection test with
external CAL
UFE w.o VA
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VA Hybrid Test Setup
VA-DAQ setup IDE Co. Type of VA-chip
VA32HDR12 Number of channels/chip 32 Number
of chips/board 1 Value (pF) of calibration
capacitor10.00E0
Labview w. ROOT
VA DAQ PCB and Adapter board
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VA Test Results(1)
Signal waveform of channel Oscilloscope
Gain fitting vs. input charge
Peaking time Linearity / channel
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VA Test Results (2)
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VA Test Results (3)
Typically all channels within 1 of the mean
gain Mean 1.198 mV/fC, Sigma 0.00337
Click to add text
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UFE Board Test Setup
WIN NT CVI, ROOT
Control signal
Real mode Pedestal and Noise CAL mode Gain
and Nonlinearity
4m
Board Box
Block diagram of DAQ system
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UFE Test Results (1)
Gain 2.01 ADC counts/fC
Noise 1.705 ADC counts
MIP signal in TRD 55 fC _at_80 Xe 20CO2,
gain 3000(3.5105 e-) S/N 55/0.86 64
One Channel Pedestals and Gain linearity
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UFE Test Results (2)
Pedestals and Noise
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UFE Test Results (3)
Non-Linearity Fit-Measured/Fit upto
1.5pC Linear range 01.5pC within 2
nonlinearity
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UFE Test Results (4)
External Connection Test
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Conclusion

• Qualification test setup for VA and UFE board is
  ready and working successfully.
  
• 40 VA Hybrid were tested and two chips were
  malfunctioning.
• 12 UFE boards were produced and tested.
  
  Pedestal, Noise, Gain, Linearity, Nonlinearity,
  Peaking Time, Connectivity
  /Channel/ VA chip/ UFE-Board
• Some problems are under investigation.
  
  Defect on VAs after soldering with UFE,
  connectivity improvement.
• Calibration const. DB data sheet in ASCII
  format on the WWW. http//accms04.physi
  k.rwth-aachen.de/chchung/ams/trd/ufe/

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WWW