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Title: Lecture 6 Author: Montek Singh Last modified by: Montek Singh Created Date: 3/13/2000 2:52:39 AM Document presentation format: Letter Paper (8.5x11 in)
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Origin is TV, so let's look at that. Relies on your brain to do two things ... 50-60 Hz or more to not see flicker. Your brain interprets as moving imagery. 5 ...
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Design for testability (DFT) refers to those design techniques that ... All clocks must be controlled from PIs. Clocks must not feed data inputs of flip-flops. ...
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STIL ScanStructure information is being applied at Test, with mixed reviews ... 1. Got Milk ? 2002 Synopsys, Inc. ( 22 ) Scenario 3: Hidden Scan. Procedures ...
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For a while it was an active development project at Microsoft ... make it possible to code for many pieces of hardware. Do they stifle innovation? ...
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VLSI Design For Testability Lecture 7: Design For Test: Partial Scan, Scan Rules, Scan Compression Instructor: Shianling Wu Director, NE USA, European, & Asian Operations
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Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey http://cm.bell-labs.com/cm/cs/who/va January 2003
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System chips are increasingly designed by embedding reusable cores. ... standard for core providers, core users, and EDA tool developers are sketched. ...
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Completing a successful project (introduction) Design for testability
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Fundamentals of Digital Test and DFT Vishwani D. Agrawal Rutgers University, Dept. of ECE New Jersey http://cm.bell-labs.com/cm/cs/who/va January 2003
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Use only clocked D-type of flip-flops for all state variables. At least one PI pin must be available for test; more pins, if available, can be used ...
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A View-Independent Graphics Rendering Architecture ... of Verilog. 6000 lines. of C# on. host PC. The UNIVERSITY of NORTH CAROLINA at CHAPEL HILL ...
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Design synthesis: Given an I/O function, develop a procedure ... Data obtained courtesy of Phil Nigh (IBM) 2003. Agrawal: Digital Test and DFT. 15. Computed DL ...
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In scan mode, cell shifts in value from previous scan cell ... Circuit Under Test (CUT) takes the scanned-in test vector as input ...
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Gate count, number of flip-flops, and sequential depth do not explain the problem. ... Scan and non-scan flip-flops are controlled from separate clock PIs: ...
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Based on analyzable fault models, which may not map onto real defects. ... Two (0, 1) or three (0, 1, X) states for purely Boolean logic circuits ...
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... speed test. Timing design and delay test ... High-speed testers are expensive. Built-in self-test (BIST) ... Testing: Some form of at-speed test is necessary. ...
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Design Cycles. System/Architectural Design. Logic Design. Physical Design/Layout. Fabrication ... fabricated, fast automated design, low cost. Prototyping, ...
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The UNIVERSITY of NORTH CAROLINA at CHAPEL HILL. Topics. Look at RE pipeline ... RE stole memory cycles to refresh display. Commodity parts lowered cost of RE. 20 ...
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port ( d0, d1, d2, en, clk : in bit; q0, q1, q2 : out bit ); end; ... port ( clk, reset : in bit; multiplicand, multiplier : in integer; product : out integer ) ...
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Reminder: Homework 1 is due Thursday. Questions? ... Introduced some principles of computer animation. Lasseter's 'Principles of Traditional Animation Applied ...
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Module path delay. Delay between input port and output port. ELEN 468 Lecture 30 ... at least log2N bits register to store the encoded representation of states ...
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Strap on bd. 30. The UNIVERSITY of NORTH CAROLINA at CHAPEL HILL. Xess XSTOOLs ... CCLK on the Programming File properties. Move strap. Download appropriate ...
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... sequential test. At speed test. Summary. 3 ... Two methods of at-speed test. External test: ... High-speed testers are expensive. Built-in self-test (BIST) ...
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