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Background on Gigabit Ethernet

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Background on Gigabit Ethernet ECE 4006 C G3: Karen Cano, Scott Henderson, Di Qian Dec, 5 2002 Ethernet History (Timeline) 1973 (2.94Mbps) First developed at ... – PowerPoint PPT presentation

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Title: Background on Gigabit Ethernet


1
Background on Gigabit Ethernet
  • ECE 4006 C
  • G3 Karen Cano, Scott Henderson, Di Qian
  • Dec, 5 2002

2
Ethernet History (Timeline)
  • 1973 (2.94Mbps) First developed at Xeroxs Palo
    Alto Lab (Robert Metcalfe and David Boggs)
  • 1979 - (10Mbps) Improvement by DEC, Intel and
    Xerox. The DIX standard. Thick Ethernet System
  • 1983 - Formally standardized as IEEE 802.3

3
Timeline (cont)
  • 19831989 Improvements on bus topology and
    transmission distance.
  • 1990 version IEEE 802.3i, 10Base-T technology.
  • 1995 - (100Mbps) version IEEE 802.3u, also call
    Fast Ethernet.

4
Timeline (cont)
  • 1998 (1 Gbps) version IEEE 802.3z, fiber
    optics and IEEE 802.3ab, twisted pair. Also know
    as Gigabit Ethernet.
  • Present (10 Gbps) standard completed in 2002.

5
Project Tasks
  • 1. Research on the transmitting and receiving
    modules.
  • 2. Examine the testing board
  • 3. Search for the components
  • 4. Testing the evaluation board with purchased
    components
  • 5. Connecting the purchased components with parts
    from other groups.

6
Project Goal
  • Duplicate the data transmitting and receiving
    module functionality of the Gigabit Ethernet
    technology with purchased components that provide
    optimum performance at a minimum price.

7
Possible Solutions
  • Transmitting module (laser source)
  • VCSEL
  • Receiving module (Photo-detector)
  • PIN photodiode
  • Other Specs
  • - SC connectorized (optical)
  • - SMA connectorized (electrical)
  • - 850nm
  • - Multimode (fiber)
  • - relatively low cost

8
Laser Basics
  • What is a Laser?
  • Light Amplification by Stimulated Emission of
    Radiation
  • How? 1) Electrons in low-energy
    levels bumped into high levels by injection of
    energy
  • 2) When an electron drops to a lower energy
    level, excess energy is given off as light.

9
VCSELs
  • Vertical Cavity Surface Emitting Lasers
  • Physical makeup
  • Bragg mirrors
  • Active region
  • Fabrication techniques
  • Molecular beam epitaxy
  • Vapor phase epitaxy

10
VCSELs
  • In EELs no pre-cleaving tests can be performed,
    testing VCSELs is much cheaper
  • Less current required for VCSELs
  • Output beam easier couple into fiber and much
    less divergent than EELs
  • Smaller and faster than EELs

11
VCSELs vs. EELs
  • Edge Emitting Lasers - give out their light from
    the sides or edges, therefore no pre-cleaving
    tests can be performed
  • Since VCSELs emit light from the top and bottom,
    they do not have this problem. Testing them is
    much cheaper

12
Interesting Facts
  • In a typical VCSEL, as many as 60 individual
    semiconductor layers are stacked within a
    structure 10 microns thick.
  • 20,000 individual laser die can be fabricated on
    a single 3 inch wafer.

13
Multimode
  • Multimode- light is injected into the core and
    can travel many paths through the cable (i.e.
    rattling in a tube).
  • Each path is slightly different in length, so the
    time variance this causes, spreads pulses of data
    out and limits the bandwidth.

14
Singlemode
  • Fiber has such a narrow core that light takes one
    path only through the glass.
  • Not limited to modal-bandwidth.
  • Very small amount of pulse-spreading is
    consequential only in Gigabit speed applications.

15
Photodetectors
  • Necessary for light pulse detection
  • Wide variety of of types
  • Photoconductors
  • Avalanche photodiodes
  • PIN photodiodes
  • MSM photodiodes

16
Photoconductors
  • Operation based on varying conduction
  • Many important factors affecting bandwidth
  • Transit time
  • Surface area of photon acceptor region
  • Noise ratio (Johnson noise)
  • Quantum efficiency

17
Avalanche Photodiodes
  • Exemplify the gain-bandwidth tradeoff
  • Use the p-n junction model to operate
  • Take advantage of the avalanche effect
  • Carrier multiplication
  • Associated gain
  • Time constant associated with avalanche
  • Bandwidth penalty

18
PIN Photodiode
  • PIN
  • Reason for name
  • Doped region, undoped region, doped region
  • Unity gain
  • Functions under reverse bias
  • Most important parameter for operation
  • Transit time

19
Bandwidth vs. Depletion Width
  • Transit time
  • Time for subatomic particle to get from one
    electrode to the other
  • Based on quickest, typically electron
  • e- mobility gt h mobility
  • Capacitance limited

20
Transit Time (continued)
  • Dependence on intrinsic region length
  • Minimizing this region
  • High bandwidth applications

21
MSM Photodiode
  • Metal-Semiconductor-Metal
  • Associated work functions
  • Atomic level metal-semiconductor marriage
  • High speed (up to 100GHz)
  • Majority carrier devices
  • Not developed for Gigabit Ethernet on scale as
    large as PIN

22
Concluding, thus far..
  • Obvious choices for devices
  • VCSEL_at_850nm
  • PIN photodiode w/ acceptable bandwidth
  • Multimode fiber
  • SC optical connectors
  • SMA electrical connectors
  • Gigabit Ethernet is a popular application
  • If you are buying less than five-million devices
    then be prepared to stand at the end of the line.
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