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RunIIb Silicon Database

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Title: RunIIb Silicon Database


1
  • RunIIb Silicon Database
  • Eckhard von Toerne
  • Kansas State U.
  • July 24th, 2003

2
D0 Database Layout
3
Run IIb Database Status
RunIIb database decision to use use ATLAS
database design and to modify it to D-Zero
needs Designer Group Stu Fuess, V. Sirotenko, S.
Krzywdzinski Liason E. von Toerne Document was
distributed to everybody that summarizes the
division of tasks. O http//www.phys.ksu.ed
u/evt/D0database/RunIIbDatabaseSpecifications.doc
Data are provided by ContentProvider at the test
sites. Raw data will be made accessible at the
test sites in web readable directories or
d0server directories at Fermilab. O
http//www.phys.ksu.edu/evt/D0database/testing_si
tes.xls
4
Current Status of Design
o http//www-d0online.fnal.gov/sdb-dev/
  • Detailed specifications are with the database
    designers, including data formats and
    web-locations
  • Tables will be filled with pre-production data
    for testing as soon as the database becomes
    available (less than 3 weeks)

5
Do and Donts of Data Files
D0_L1_RIIb Flatness.RTN 071703 091724 Gordie
Gillespie 4 Point Reference Plane Flatness FLT
0000.000 Flatness Grid X -0000.004 Y
-0000.005 Z 0000.332 X 0007.895 Y
-0000.000 Z 0000.348 X 0015.795 Y
0000.004 Z 0000.357 X 0023.695 Y
0000.007 Z 0000.367 X 0031.593 Y
0000.007 Z 0000.370 X 0039.494 Y
0000.007 Z 0000.374 X 0047.392 Y
0000.005 Z 0000.370 X 0055.292 Y
0000.009 Z 0000.367 X 0063.192 Y
0000.006 Z 0000.363 X 0071.091 Y
0000.007 Z 0000.349 X 0078.993 Y
0000.008 Z 0000.331 X 0000.002 Y
0002.384 Z 0000.333 X 0007.895 Y
0002.389 Z 0000.349 X 0015.795 Y
0002.394 Z 0000.358 X 0023.696 Y
0002.398 Z 0000.368 X 0031.594 Y
0002.397 Z 0000.371 X 0039.495 Y
0002.398 Z 0000.372 X 0047.394 Y
0002.397 Z 0000.375
Bad Example
6
Do and Donts of Data Files
Sensor ID L1-0022 Serial-Number 0022 Operator
Gordie Gillespie Recorded 07/17/2003 Analysed
07/17/2003 Mechanical-Grade A Thickness 323
microns Flatness 50 microns Cut-Tolerance-sides
3.9 microns Cut-Tolerance-ends 3.9
microns Maximum Fiducial Tolerance 3
microns raw data
follows (orignal file D0-Sensor-L1-0022.txt)
D0_L1_RIIb
Flatness.RTN 071703 091724 Gordie Gillespie
4 Point Reference Plane Flatness FLT 0000.000
Flatness Grid X -0000.004 Y -0000.005 Z
0000.332 X 0007.895 Y -0000.000 Z
0000.348 X 0015.795 Y 0000.004 Z
0000.357
Good Example Thanks to Jim Fast
7
Graphical User Interfaces
  • Database designer received our request for
    graphical user interfaces for
  • Mechanical Assembly (Gangs, Modules, Staves)
  • Shipping Information

Shipment example (no true functionality yet)
8
Current Status of Sensor Testing Sites
  • Testing sites need to be certified for
    interaction with Database (this is in addition to
    overall certification)
  • Stony Brook basically certified
  • KSU basically certified
  • Fermilab not certified
  • Up until now KeyTest data were incomplete
    New format by Frank and EVT
  • Rochester received no input from U.R.
  • not certified

9
Sensor Units
  • Mandatory Units
  • Resistance Mega-Ohm
  • HV-current nano-Amps (same unit for Strip und
    Sensor currents)
  • Capacitance pFarad
  • Voltage Volts
  • Temperature degree Celsius
  • Humidity percent
  • Distance microns
  • Conductivity pA/ Volts

10
Summary
  • If you have not published your data -gt do it
    NOW
  • If you are not providing measurements that the QA
    document specifies-gt contact your L3 manager and
    me.
  • D0 expects every testing site to be certified for
    Database interaction. (this is in addition to
    being certified by Level 3 management)
  • After a long journey, sensor testing is getting
    closer to production conditions
  • Hybrids testing is the next big target.
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