Ntb_si_probe2

1
04291853 Ntb_si_probe2
Q178, k4.8 nm, DA900 mV, senst. 18.88
nm/V Nanotube length 35 nm, f51.26 kHz
Ntb_Si_probe2_low_ampl_trace Ntb_Si_probe2_low_amp
l_retrace
Ntb_Si_probe2_low_ediss_trace Ntb_Si_probe2_low_ed
iss_retrace
Ntb_Si_probe2_low_phase_trace Ntb_Si_probe2_low_ph
ase_retrace
Ntb_Si_probe2_low_forcgrad_trace Ntb_Si_probe2_low
_forcgrad_retrace
New data for a Ntb tip on a silicon surface
2
04291901.2 Ntb_si_probe2
Q178, k4.8 nm, DA2200 mV, senst. 18.88
nm/V Nanotube length 35 nm, f51.26 kHz
Ntb_Si_probe2_interm_ampl_trace Ntb_Si_probe2_inte
rm_ampl_retrace
Ntb_Si_probe2_interm_ediss_trace Ntb_Si_probe2_int
erm_ediss_retrace
Ntb_Si_probe2_interm_phase_trace Ntb_Si_probe2_int
erm_phase_retrace
Ntb_Si_probe2_interm_forcgrad_trace Ntb_Si_probe2_
interm_forcgrad_retrace
New data for a Ntb tip on a silicon surface
3
04291904.4 Ntb_si_probe2
Q178, k4.8 nm, DA900 mV, senst. 18.88
nm/V Nanotube length 35 nm, f51.26 kHz
Ntb_Si_probe2_high_ampl_trace Ntb_Si_probe2_high_a
mpl_retrace
Ntb_Si_probe2_high_ediss_trace Ntb_Si_probe2_high_
ediss_retrace
Ntb_Si_probe2_high_phase_trace Ntb_Si_probe2_high_
phase_retrace
Ntb_Si_probe2_high_forcgrad_trace Ntb_Si_probe2_hi
gh_forcgrad_retrace