Warm Electronics: Components/Subsystems Test Results - PowerPoint PPT Presentation

1 / 9
About This Presentation
Title:

Warm Electronics: Components/Subsystems Test Results

Description:

errors occurred during thermal vacuum acceptance tests ... failure seems to be temperature dependent (possibly a week soldering) ... – PowerPoint PPT presentation

Number of Views:25
Avg rating:3.0/5.0
Slides: 10
Provided by: albrechtp
Category:

less

Transcript and Presenter's Notes

Title: Warm Electronics: Components/Subsystems Test Results


1
Warm Electronics Components/Subsystems Test
Results
PACS SVR
  • B. Voss

2
BOLC FM
  • errors occurred during thermal vacuum acceptance
    tests
  • three housekeeping channels found unstable during
    cold start up test (-30C)
  • failure seems to be temperature dependent
    (possibly a week soldering)
  • tests are stopped and BOLC is sent back for
    repair
  • tests will be resumed and partly repeated
    (vibration in at least one axis)

3
DEC/MEC QM
  • equipped with complete nominal section
  • currently running at MPE
  • long duration tests
  • digital interfaces without errors or malfunctions
  • analogue interfaces OK except
  • SPU current housekeeping, known problem with
    wrong gain setting in DEC/MEC. Corrected for FM
  • CRE interfaces tested OK during acceptance test,
    but no long term tests available.

4
DEC/MEC FM
  • in production
  • schedule delayed by two main problems
  • FPGA swap on both DEC Base boards
  • repair envisaged due week 29
  • rearranging test order because of availability of
    test facilities
  • erroneous SPU boards
  • FM will be temporary equipped with erroneous SPU
    boards thus EMC and environmental test can be
    performed in time
  • only small likelihood of malfunction during tests
  • later exchange of the SPU boards and delta
    acceptance

5
DEC/MEC FM
  • new schedule by CSL
  • repair due week 29
  • functional test and vibration due week 32
  • thermal vacuum due week 33
  • functional retest due week 34
  • EMC test at ESTEC due week 35
  • delivery to MPE begin of September

6
DPU PFM
  • functional Tests at CGS OK
  • thermal Tests OK
  • EMC Test OK (minor NCRs, solved/accepted)
  • possible problems
  • CFM2 showed corrupted memory after some hours of
    operation at MPE
  • AVM2 in same configuration is running stable
  • possible reasons currently under investigation
    (HW or SW problem?)
  • errors not reproducible at CGS
  • PFM now at MPE for comparative tests

7
SPU PFM
  • thermal tests OK
  • EMC test OK (minor deviations already accepted)
  • functional test failed under special conditions
  • during acceptance test campaign 15.05.06
    malfunction occurred (CRISA FPL-NC-1214-077-CRS)
  • start-up SW reports error during application
    upload command
  • error affects read from DSP program memory (PRAM)
    with special bit patterns (all 1s to all but one
    bit 0s)
  • error is systematic and affects all DSP boards
    (PACS SPU, PACS DECMEC and LFI REBA)

8
SPU PFM
  • reason of error
  • not clearly understood yet, but most likely a
    ground bouncing problem when switching output
    stages in the PRAMs
  • repair
  • repair of EBB with additional ground wires on the
    board improved the situation
  • modification of flight spare currently under
    progress

9
Harnesses
  • Warm Interconnect Harness
  • QM at MPE
  • QM showed different weaknesses (bad bonding,
    wrong back shells, swapped wires in cable
    bundles)
  • FM production will take care of these
  • Cryo Harness
  • complete and tested
  • differences in resistance measurements compared
    to MPE test harness
  • reason under investigation but most likely due to
    different measurement systems
Write a Comment
User Comments (0)
About PowerShow.com