APV25 Interface board

1
APV25 Interface board
APV25 Interface Board
Device Under Test
2
Electrical Scheme
Pulse input from external source
Block Sum
Power Driver
Chip power supply

• The schematic make a sum of a shaped pulse with
  the power supply for both channels

3
Setup
Monitoring System VME crate with SEQSI and I2C
controller Power Supplies Linux PC with VME
bus Pulse generator Termometer
DAQ System Win98 with LabVIEW 6 Oscilloscope
Tektronix TDS520A
4

• DAQ system save a frame of APV25 every 5 sec.
• Chip temperature was checked every 5 sec.
• Monitoring of power consumption was made during
  test

5
Event screenshot
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Pulse Shape
3.5V
3600 pulses _at_ 2Hz
3.5V
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TickMarks of APV25
Start of Pulse
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Linearity of internal gain
Characterizations are made on chips after
irradiation (_at_ 10Mrad) and annealing.
Tests are made with both internal and external
calibration
Before Test
The experimental results do not show differences
in gain and linearity in data acquisition
After 3600 pulses



9
Internal Noise Distribution
The noise is the same after the electrical stress
Before Test
After 3600 pulses
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External Gain and Linearity
The same results are obtained with external
calibration
Before Test
No differences before and after electrical stress
After 3600 pulses
11
External Noise Distribution
Before Test
After 3600 pulses