Radiation Effects

1
Radiation Effects

• Radiation Damage
• Cumulative Effects
• Gradual performance degradation
• Displacement Damage
• Total Ionizing Damage (TID)
• Single Event Effects
• Single Event Upset (SEU)
• Catastrophic Single Event Effects such as Single
  Event Latch-Up (SEL) or Burn-Out (SEB)

2
CMS Hadron Calorimeter
HCAL Barrel, Endcap, Outer, and Forward
Calorimeters
3
HCAL Radiation Environment

• Radiation Dose over 10 LHC yrs
• (known to within a factor of 3)

Neutron F Ch.
Had. F Max. TID HCAL
Total Egt100keV 2-20MeV Egt20MeV Egt5MeV
Rads/10y Barrel FEE box 3.1E11
1.3E11 4.3E10 2.4E10 2.7E8
190 Endcap FEE box 6.5E10
2.8E10 5.2E9 2.8E9 1.6E8
71 Exp. Hall HF Shield
2.0E11 1.0E11 5.6E10 3.5E10
1.5E9 330
Relevant radiation testing level for SEE
4
FE/DAQ Readout

18 HTRs per HCAL
Readout Crate
C
D
H
H
H
H
H
H
LEVEL 1
P
C
T
T
T
T
T
T
DDU/FED
TRIGGER
U
C
R
R
R
R
R
R
8 1.6Gbit/s fiber per
1 Gbit/s
HTR
L1 Accept
TTC

• Components to Qualify
• HPDs
• 6-Channel FE Boards
• Clock Control Monitoring
• Custom Hubs
• Calib. Modules (LEDs)
• Optical Links (Plasma Optics
• Fiber Graded-Index Multimode
• rad qualified by Atlas, MT
• ferrule based connectors rad
• qualified by CMS Tracker Group)

Radiation Environment
CONTROL MODULE
VR
QIE
CCA
Shield Wall
QIE
QIE
FE READOUT
CCA
MODULE
QIE
1.6 Gbit/s
QIE
CCA
QIE
HPD
5
Testing Strategy

• Plan
• Test all electronic devices up to the expected
  10yr radiation levels of 1 kRad and 4E11 n/cm2
  (1E11 n/cm2 testing for SEE studies based on
  Egt20 MeV fluence )
• Test individual components
• SEE/device/fluence x (1E11 n/cm2/10yr) x
  devices
• Spec parts
• SEU requirement is device specific
• QIE reset every orbit
• Require lt 1 SEL/10yr or SEL sensing circuit
• Require HPD susceptibility of ltlt 1 SEB/10yr
• Require bi-polars operate after 10 yr TID level

• SEL can lead to severe failure
• Set spec based on board failures
• SEL/device/fluence x (1E11 n/cm2/10yr) x
  devices
• Try to achieve ltlt1 CCM failure/10yr and ltlt 1 FE
  board failure/10yr
• Problem limited by available beam time and
  component activation
• Diff chip types - CCM (10 chips) FE (11 chips)
  
• lt1/100 of a failure/yr for CCM chip
• lt1/110 of a failure/yr for FE board chip
• Set spec lt 1 SEL/10yr for full FE system or CCM
  system
• Irradiate multiple devices give high dose
• Full board tests of final FE boards and CCM
  boards
• All tests performed at Indiana U Cyclotron
  Facility (200 MeV beam) unless otherwise noted

6
Testing Status

• Component testing
• All components tested and validated (Test devices
  only for QIE/CCA) (FERMILAB-CONF-02-224-E)
• All components operate well beyond 10yr dose
  levels
• Acceptable SEU levels expected
• SEL limit of lt 1 SEL / 10yr for FE system and lt 1
  SEL / 10yr for CCM system achieved for each
  component

• FE Board/CCM/Hub Testing
• Production board tests completed (Mar 2004)
• SEL and SEU
• Tested up to 10yr dose levels for full system
• boards x 10yr level

7
Clock Control Monitoring
PZT222A Transistor (3 total)
TTCrx
ACTEL FPGA A54SX32A
ACTEL FPGA A54SX72A
LV Regulator (7 total)
Temp Sensor AD570
OpAmp OP184
FRAM (Ramtron Tested)
RS 485 DS36276 (3 total)
Optocoupler 6N134
QPLL (2 total)
Analog MUX ADG 706
MC100VELT22 CMOS diff LVPECL (7 total)
AD670 8-bit A/D (Analog Devices Tested)
MC100LVEP111 (2 total)
8
CCM Shell
9
CCM

• Test for latch-up/readback errors (132
  modules in system)
• Actel part programmed with triple module
  redundancy
• Write/read registers continuously during
  irradiation
• Dosed 5 CCM Modules Fluence 1.85 x 10yr dose
  for full CCM system (132 Modules)
• No read errors no latch-ups seen
• Readback problems after 2.9E12 p/cm2 (175
  kRad)
• A/D stops working ? Actel part stops working (OK
  - HCAL dose is 1kRad)
• Set limit of lt 1 SEL in syst./18.5yrs operation
• QPLL locks Expect 0.4 locks/CCM/yr

10
Custom Hub
ACTEL FPGA A54SX32A
LV Regulator (2 total)
PZT222A Transistor
OpAmp OP184
QPLL1
LVDS Receiver DS26LS32 (3 total)
LVDS Driver DS26LS31 (5 total)
11
Custom Hubs

• Test for latch-up/readback errors (18
  modules in system)
• Write/read registers continuously during
  irradiation
• Dosed 5 Custom Hubs Fluence 12.3 x 10yr dose
  for full system (18 Modules)
• No read errors no latch-ups seen
• Readback problems after 2.5E12 p/cm2 (150
  kRad)
• Actel part stops working
• Set limit of lt 1 SEL in system/123yrs operation

12
Radiation Validation Status Plans

• All components tested and validated
  (FERMILAB-CONF-02-224-E FERMILAB-CONF-01-250-E)
  
• All components operate well beyond 10yr dose
  levels
• Acceptable SEU levels expected from component
  level testing
• SEL limit of lt 1 SEL / 10yr for CCM system
  achieved for each component
• SEL/readback test conducted on CCM Modules
• SEL immune to 14yr level for full system
• QPLL locks are low level and recoverable
• Rad tests conducted on Custom Hubs
• SEL immune to 123yr level for full system
• CCM Module production started April 2004