Test Chip Measurement Update

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Test Chip MeasurementUpdate

• Andy Liu

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Purpose

• Help the chip designer to decide what should be
  included and what interface should the test chip
  should have, based on what can be measured and
  what cannot be measured.
• Design some general purpose measurement
  instruments for the future project (SOS test chip
  and GOL), like portable power supply and current
  measurement.

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Shift Registers - Update

• Because some errors may happen only during a
  flip-flop changes state, a dynamic test is still
  needed.
• Bit error rate test by using an FPGA. It is easy
  for the data rate up to 200 Mb/s, but may be much
  harder at 1gb/s.

DUT Shift registers
Error Counter
Pattern Generator
Comparator
Shift registers
clock
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Portable Power Supply and Current measurement
Voltage Regulator
Current Sensor
Voltage Regulator
Current Sensor
Adjustable voltage output
AC-DC converter
Voltage Regulator
Current Sensor
Voltage Regulator
Current Sensor
Current measurement
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UPS

• Currently 3 UPS batteries are out of lifetime.
• Several new, expensive instruments need to be
  protected.
• Plan purchase three batteries and several new
  UPSes.