Nikhef Annual Meeting 13 Dec 2001 Future Vertexing - PowerPoint PPT Presentation

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Nikhef Annual Meeting 13 Dec 2001 Future Vertexing

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Monolithic pixels. Proposal submitted to DESY PRC ... Monolithic:part of the CMOS is used as detector element. Will it work ? dec 2001. els koffeman ... – PowerPoint PPT presentation

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Title: Nikhef Annual Meeting 13 Dec 2001 Future Vertexing


1
Nikhef Annual Meeting13 Dec 2001 Future
Vertexing
  • Els Koffeman
  • for
  • Nikhef Vertex Group

2
Topics
  • No report on Zeus, Hermes, Alice, LHC-B, Atlas
    in spite of much progress
  • No report on beautiful infrastructure
  • RD vertex detectors
  • Very High Luminosity Hadron Colliders
  • Extreme radiation hardness (1x 1016 /cm-2)
  • Linear Colliders
  • High precision (1-5 micron point resolution)
  • Low material (0.1 X0 per layer)
  • small detectors
  • Medipix
  • Time Projection Chamber

3
Electronic Department
  • Recent projects
  • Alice analoge buffer/line driver, digital
    control ic (jtag glue logic), power supply is
    prevented for single event latchup
  • LHCB analog line driver en comparators voor
    beetle chip
  • pixel 4 bits adc per pixel
  • zeus fail safe token voor helix
  • general low noise amplifier
  • Four FTE engineers working on VLSI
  • Education
  • EPFL (Lausanne)
  • Advanced Analog IC Design (5 people)
  • Advanced Digital IC Design (3 people)
  • Practical Aspects in Analog Mixed Mode ICs (3
    people)
  • Transistor-level Analog IC Design (2 people)
  • expected low voltage analog IC (2 people)

4
Quick Reminder
  • Silicon as a sensor
  • 300 micron thick wafer
  • High resistivity, purity
  • Surface strips, pixels, pads
  • Silicon as readout
  • Poor quality wafer
  • Photolitography makes Integrated Circuits
  • All structure contained in few micron thickness
  • Most important component is transistor
  • Current technology CMOS 0.25 micron

Silicon pixel,pad,strip
contact
gate
P
5
Signal!
6
Crystal Damage ! (vacancy, interstitials)
Leakage currents Need High Voltage Less collected
charge
Charge generation Inside CMOS!
Transistor performance degrades Chip blows up
7
RD vertexing
  • CERN
  • RD 19 Pixels
  • RD 39 Cryogenic operation of silicon
  • RD 42 Diamond detectors
  • RD 48 ROSE radhard silicon
  • RD 49 Radhard Electronics
  • Proposal for new RD group
  • LCFI (linear collider flavour identification)
  • CCD detector for TESLA
  • 8 UK institutes, CERN, SLAC
  • MIMOSA
  • Monolithic pixels
  • Proposal submitted to DESY PRC
  • Strassbourg, Geneve, Nikhef, Liverpool, Glasgow,
    RAL,

8
Radiation Hardness of Silicon
  • The leakage current damage parameter is material
    independent
  • Radiation damage very different for different
    particles (expressed in hardness factor K)
  • 24 GeV protons K 1
  • Slow neutrons K0.9
  • Fast neutrons K1.7
  • Gamma 60-Co K2x10-6
  • Effective doping changes (or increasing
    depletion voltage) improved by oxygenation of the
    material
  • A macroscopic damage parameter model has been
    developed which can be used to predict detector
    parameters in a given radiation environment
    including annealing effects

9
Radiation harder with oxygen?
  • Two methods were found to highly oxygenate
    silicon.
  • Firstly, at the ingot growing stage.
  • Secondly by diffusion of oxygen into ANY wafer
    using a high temperature drive-in
  • Technology has been successfully transferred to
    several silicon detector manufacturers
    (SINTEF,Micron, ST, CIS) and full-scale
    microstrip detectors have been produced.

10
Pixel systems
  • MCM multi chip module
  • traditional 300 um thick pixel sensor bump
    bonded to a chips with amplifiers and readout.
  • CCD
  • Charge collection in thin surface layer
  • charge transferred through the wafer
  • Monolithic pixel
  • use standard CMOS wafer
  • simple readout per pixel

chip
sensor
Surface
sensor
sensor
11
Monolithic Pixels
  • No depletion layer
  • charge diffusion only
  • lt 1000 electrons
  • cell
  • Monolithicpart of the CMOS is used as detector
    element
  • Will it work ?

12
MIMOSA - I
4000 pixels !
1.2 x 1.2 mm2
13
MIMOSA
Signal / noise 40 Efficiency 99 Resolution
NIKHEF proposed a ladder concept thickness 0.05
mm 12 cm long 3 x 2 cm wide 0.9 g silicon
0.8 g support
14
Diamond Pixel detector
15
Medipix- recent developments
  • Chip Design (0.25 mm) (TMR EU project)
  • DAC's for Alice/LHCb chip (radhard)
  • DAC's for Medipix2 chip
  • MUROS2 Interface for Medipix2
  • Multi-Chip Board for 2x4 multichip Medipix2
    imager
  • Dynamical Defectoscopy
  • micro-crack development in Aluminium (Marie Curie
    EU project)

16
Multi-Chip Board
Vbias
PCDIO
Chipboard
MUROS2
10 Mhz
SCSI-5 Cable 160 Mhz LVDS
8 ASIC chips Medipix2 chip size 14 x 16
mm2 1 Sensor 28 x 56 mm2 (fully sensitive
area) 512 x 1024 Pixels of 55 x 55 mm2
(0.5 Megapixel) Prototype, useful for e.g. Small
Animal Imaging
17
3 different micro ADC's
David San Segundo Bello
lt100 x 100 mm area lt1 mW power
18
Chipboard Top layer metal
High Density Interconnect Technology 9 metal
layers (5 in kapton build-up) 1840 staggered
m-via's 366 drilled-through via's 80 SMT
capacitors
19
X-ray Defectoscopy
Si
GaAs
Si FlatField Correction
5 mm
0.5 mm
20
TPC for a linear collider
  • Traditional TPC signal collected on wires
  • Principle of GEM introduced by Sauli
  • Used in conjunction with MSGCs or plain
    electrodes
  • New idea get the electrons directly in a chip!
  • (Harry v.d Graaf, Jan Visschers, Erik Heijne)
  • If successful (with 60 60 micron pitch)
  • Resolution limited by diffusion
  • Optimise gas max for this
  • Much better track separation
  • Can improve all time favorite Aleph TPC with
    30-40

21
TPC medipix chip
Medipix chip
kathode
Sensitive area
1mm
1m
GEM
22
TPC plans
  • Build proto type
  • If charge measured gt connect to Medipix chip.
  • Develop prototype for TESLA.
  • Need 15 m2 of chips!

23
Conclusion.
  • Medipix
  • Diamond
  • CMOS sensors
  • micro-electronics
  • Novel TPC

RD is in good shape
we need a vertex group !
Do we need a vertex group ?
24
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