RICH Update

1
Jianchun Wang Syracuse University 10/16/99 CLEO
Meeting
RICH Update

• Outline
• DAQ problems solved
• Recent results
• Status of DAQ
• Work to be done

2
DAQ Problems Solved

• Software problem
• Corrupted data
• DAQ bug, results in digital 2 V not set
• Hardware problems in digital data boards
• VME buffer/driver destroyed ( 14 boards affected
  )
• Wrong VME and Sequencer code
• ADC buffer damaged ( 20 boards affected )
• Buffer enable conflict
• Timing problem
• Wrong timing caused wrong ADC to be read out

3
Corrupted Data

• Noise expected to be 3-4 ADC counts (500 e)
• DAC address 0-3 was shifted to be 1-4
• Effectively digital 2V not set
• Bug fixed and noise as good as expected
• Parameter monitor and alarm working now

Pedestal RMS (ADC counts)
4
Noise Performance

• Each crate checked, no problem with CC and cable
• Half cylinder tested simultaneously with
  repaired boards
• Total noise 3.6 ADC counts
• Incoherent noise 2.6 ADC counts (400 e)

5
Parameter Monitor

• Parameter monitor Voltages, Bias currents,
  Temperatures
• protect data board, chamber, ensure data quality

Crate 123
Board 4 Board ID RICH ANALOG A025
Board
values Ch. 0 -gt 5 analog 480 4.996
V Ch. 1 -gt -5 analog 343 -5.191 V Ch. 2
-gt 2 digital 470 2.460 V Ch. 3 -gt -2
digital 477 -2.543 V Ch. 4 -gt board temp
509 25.224 C Ch. 5 -gt cal pulse 615
0.097 V Cell values Ch. 0 -gt 2 analog
524 2.013 526 2.015 526 2.015 V Ch. 1
-gt -2 analog 216 -2.288 213 -2.291 214
-2.290 V Ch. 2 -gt Vfp 625 -0.486
628 -0.483 630 -0.480 V Ch. 3 -gt
Vfs 688 0.673 682 0.667 685 0.670
V Ch. 4 -gt Vref 472 -0.673 474 -0.671
479 -0.665 V Ch. 5 -gt prebias 634
0.494 644 0.502 594 0.463 mA Ch. 6 -gt
shabias 298 0.023 321 0.025 325 0.025
mA Ch. 7 -gt iBuf 0 0.000 1
0.000 1 0.000 mA Ch. 8 -gt thermistor 544
22.110 541 22.375 542 22.287 C Ch. 9 -gt
ADC offset 741 1.811 741 1.811 740
1.808 V

• Readout via SBUS
• By Bayar Jian
• Auto measurement and alarm implemented
• Need to integrate into main slow control and
  alarm system

6
Data Boards
7
ADC Buffer Problem

• ADC readout difference is small within one chain
  with no front end electronics connected
• Difference of 256 suggests that bit 8 may be
  wrong

• Buffer damaged and bits shorted
• Wrong buffer enable before initialization and
  during reprogramming
• All 20 boards repaired all digital boards
  modified pull-up resistor array

8
Timing Problem

• Wrong buffer timing or FIFO timing may cause
  wrong ADC selected (duplication, rotation )
• Test chain with no CC4 used to check all boards
• 4 boards found such problem
• All boards are adjusted

9
Wirepulse Calibration

• Calibration pulse sent to anode wire and
  measure induced charge
• Half cylinder shown here
• Signal height quite uniform
• Dead channels 0.4

10
Plane Radiator
11
(No Transcript)
12
Status of DAQ

• DAQ version 9902 and 9904 were used in the runs
  shown
• Version 9902 uses only software trigger on TIM,
  so two crates can not be triggered simultaneously
• Version 9904 use DFC and GCAL send trigger to
  TIM, configuration manager not function
• DAQ version dlib (Y2K) has a successful run on
  two RICH crates. More functions need to be
  tested.
• More details, see Todds talk

13
Work To Be Done

• Read out all RICH crates with new DAQ system
• Measure pedestal, noise performance and
  wirepulse calibration to find any remaining
  problematic boards
• Test new DAQ functions including single channel
  calibration and data sparsification
• Continue coding on online monitor
• Determine the mode for big calibration
• Cosmic ray run