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Il Joong Kil

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Title: Il Joong Kil


1
Status Update ATLAS Semi-Conducter Tracker
(SCT) Module Production at Melbourne
  • Il Joong Kil
  • AusHEP
  • November, 2004

http//epp.ph.unimelb.edu.au/epp/sctprod/sctprod.h
tml
2
Talk Outline
  • Introduction SCT Overview
  • Where we were in 2003
  • QA Processes
  • 2004 - Pre-qualification - Qualification
  • Melbourne SCT Modules
  • Issues
  • SCT Production 2005
  • SCTDB
  • Conclusion

Melbourne SCT Production TeamGareth F.
MoorheadJared WintonSteve GregoryScott Moncrief
3
ATLAS Inner Detector
  • ATLAS Inner Detector
  • Pixel Detector
  • 3 layers, 8 disks
  • r 4.8 - 16 cm, 140 M channels
  • SemiConductor Tracker (SCT)
  • (Silicon strip detector)
  • r 27 - 52 cm, 6.3 M channels
  • Transition Radiation Tracker (TRT)
  • (Straw tube detector)
  • r 56 - 107 cm, 330 k channels

Tracking and Vertex reconstruction Axial magnetic
field 2T
4
The Semi-Conductor Tracker (SCT) Layout
  • 4 Barrel cylinders, 2 x 9 End-cap disks
  • 4088 Silicon modules (2112 Barrel and 1976
    Forward (four different kinds))
  • 61 m2 silicon, 6.2 M channels
  • 15,392 Wafers
  • Resolution Barrel ?(R?) 16 ?m ?(z) 580 ?m
  • Resolution Forward ?(R?) 16 ?m ?(R) 580 ?m
  • (From Technical Design Report)

? 1.0
? 1.5
? 2.0
  • 9 Wheels each in 2 Endcaps
  • 1.4 lt ? lt 2.5

? 2.5
5
Outer Endcap Module Components
6
By the end of 2003
  • Assembly
  • Lack of real hybrids
  • CiS wafers are more delicate than Hamamatsu
  • Persistent problem with silicon-spine
    registration (Phase 1)
  • Metrology
  • After the installation of Mitutoyu QV302
    metrology system (AUS70,000)
  • The new metrology system aided us in better
    identifying mechanical discrepancies between our
    modules and the specifications
  • Bonding
  • Problems with bonding consistency. Our bonding
    procedure creates gt100 noisy silicon strips per
    detector (upper specification limit 12)
  • Bonding was considerably time consuming
  • General
  • We were not pre-qualified by the end of 2003

7
Coming into 2004
  • New bonder arrived in January (AUS250,000)
  • Clean-room extension and temperature control
    (Jan-Feb)
  • Assembly jig reworked to resolve Z metrology
    problem

8
QA (Quality Assurance) Processes
9
QA Metrology
  • We are currently using the software developed by
    Tom Atkinson who worked tireless and without
    complaint (program called Tri-Metro aka I
    cant believe its not SAS)

All modules from 57 and onwards are mechanically
in specification
10
QA Wire Bonding
  • Process of the bonding may introduce defects to
    the modules
  • New wire bonder (HK Bondjet 715M), has been
    installed in January to combat this
  • MEL58 and MEL60 were used to get a set of
    parameters for MEL61 which gave good results. The
    parameters used are still under discussion.
  • Changing the wire type is being considered for
    the improvement of the bonding conditions
  • Wire type being used 25 ?m AlW alloy wire
  • Others with CiS wafers use 17 ?m wire

11
QA IV Tests
discontinued for the production
  • 2 IV tests under consideration
  • Reception test on the wafers before the assembly
  • IV curve test of the module from SCTDAQ
  • Both are being tested for the voltage range of
    0350V ensuring the current does not exceed 5?A
  • Both tests are done at a temperature of 20? with
    a tolerance of 1?
  • Specification keeps changing

12
QA Electrical Test (DAQ)
  • Full Characterisation Test (ABCD Test)
  • SCTDAQ is used
  • Temperature of the module throughout the test is
    to be stabilised at 10? permitting 3? tolerance
    at the maximum
  • Long Term Electrical Test (LTT)
  • No LTT has been run yet (currently under
    development)
  • The sequence of full characterisation is run for
    the extensive period of time (about 24 hours)
  • The temperature of the modules being tested
    should be monitored and the test should be
    terminated once the temperature becomes unstable

13
QA RC Plot of MEL65
14
Pre-Qualified Module Qualification Candidates
  • Pre-Qualified Module MEL61
  • Pre-Qualification approved during July/August
  • All the mechanical specifications have been met
  • Only partial electrical test is done at
    Melbourne, the rest along with the thermal
    cycling test is done at Geneva
  • Qualification Candidates
  • 5 consecutive qualifying modules are required for
    the qualification
  • MEL63 Bonding parameter modified, too many
    defects
  • MEL64 Front side bad, but the back side is
    really good The bonding parameter used
    in the backside is our current fixed bonding
    parameters
  • MEL65 The first module that is in electrical
    specification
  • MEL6667 A few amount of defects but within the
    specification
  • MEL6869 Built and in mechanical spec, but not
    tested electrically yet

MEL6364 not good
15
Melbourne Modules Metrology
Within these lines in spec.
16
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17
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19
Melbourne Metrology Defects Summary
20
Issues resolved
  • All the mechanical problems are now resolved
  • to name few, XY survey, Z survey, assembly phase
    1?2 discrepancies
  • Although changing wire type to 17 ?m is suggested
    by other institutes, we will try to achieve the
    spec. with our current wire
  • Electrical testing
  • High voltage card (HV) did not function correctly
  • Fixed at late October by Gareth
  • All the electrical tests were done with a bias
    voltage of 100V until recently corrected to 150V
    as in the specification

21
Issues to be resolved
  • For both assembly and metrology systems, we are
    still getting some difficulties with finding the
    correct fiducials
  • Bonder settings need to be confirmed
  • Thermal cycling to be ready fairly soon
  • Electrical testing
  • Still unsure of the official specification
  • Front-end tuning is it acceptable?
  • Would VDC patch card replace pseudo-optical
    cable?
  • Long term electrical testing set-up

22
What we expect in 2005
  • Qualified
  • Expected by the end of 2004
  • Start production
  • 100 modules by April, 2005
  • we would like to increase our production to 6
    modules/week

23
SCTDB SCT Database
  • Central database for the SCT registrations and
    test results is managed within the framework of
    the Oracle 9i database server
  • Not all part of the database is accessible only
    limited permissions

24
SCTDB Upload
  • Database entry of each module is uploaded to the
    database (called SCTDB) via either web or java
    applications
  • Web each information is entered manually ?
    tedious!
  • Java much quicker and better way to upload but
    the data files are needed prior to any uploads
    except for the electrical testing where SCTDAQ
    generates correctly formatted results

25
Java Upload Example
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