Title: Characterization
1- Characterization
- of Component Susceptibility
- to Radio Frequency Interference
stephane.baffreau_at_insa-tlse.fr http//www.lesia.i
nsa-tlse.fr/baffreau
2 Content
- 1. Electromagnetic Compatibility (EMC) Context
-
- 2. Main Immunity Measurement Methods
- 3. Our Test Setup
- 4. Our Future Works
- 5. Conclusion
3 1. EMC Context
Emission
Susceptibility
? Electronic systems are the main EMC actors. ?
The associated components are parasitic sources
or victims. ? Similar EMC problems exist in
aircraft systems.
4 1. EMC Context
The Main Powerful Parasitic Sources
Aggressed Device
? RF Interference generates disturbances from IC
failures to IC destruction.
5 2. Main Immunity Measurement Methods
Work Bench Faraday Cage (WBFC)
? Common mode methodology. ? Frequency range
150kHz - 1 GHz. ? Emulates real case equipment.
6 2. Main Immunity Measurement Methods
Bulk Current Injection (BCI)
? Very Similar to Automotive BCI. ? Inductive
coils to inject and monitor RFI injected.
7 2. Main Immunity Measurement Methods
Bulk Current Injection (BCI)
? Very specific board. ? Frequency range DC -
400 MHz. ? Focused on bus interface (RS232, CAN).
8 2. Main Immunity Measurement Methods
Direct Power Injection (DPI)
? Frequency range 10 kHz - 1 GHz ? Well adapted
to perform measurement on power supply or
specific pins. ? Complex setup although based on
a simple capacitance
9 3. Our Test Setup
10 3. Our Test Setup
Measurement results
? Coupling capacitance must be carefully
determined. ? Reproducible measurements. ?
Methodology well adapted to inject RFI through
power supply or specific pins.
11 4. Our Future Works
? Regina, internal measurement of RF
injection. ? Radio Frequency detector. ?
Defensive software approach.
12 5. Conclusion
? EMC context was presented. ? Main parasitic
powerful sources were illustrated. ? Main IC
immunity measurement standards have been shown. ?
Our test methodology have been presented. Test
bench. Main measurement characteristics. ? Our
perspectives have been described.