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Characterization

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stephane.baffreau_at_insa-tlse.fr. http://www.lesia.insa-tlse.fr/~baffreau. Sonia Bendhia, Etienne SICARD, St phane BAFFREAU. Mohamed Ramdani ... – PowerPoint PPT presentation

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Title: Characterization


1
  • Characterization
  • of Component Susceptibility
  • to Radio Frequency Interference

stephane.baffreau_at_insa-tlse.fr http//www.lesia.i
nsa-tlse.fr/baffreau
2
Content
  • 1. Electromagnetic Compatibility (EMC) Context
  • 2. Main Immunity Measurement Methods
  • 3. Our Test Setup
  • 4. Our Future Works
  • 5. Conclusion

3
1. EMC Context
Emission
Susceptibility
? Electronic systems are the main EMC actors. ?
The associated components are parasitic sources
or victims. ? Similar EMC problems exist in
aircraft systems.
4
1. EMC Context
The Main Powerful Parasitic Sources
Aggressed Device
? RF Interference generates disturbances from IC
failures to IC destruction.
5
2. Main Immunity Measurement Methods
Work Bench Faraday Cage (WBFC)
? Common mode methodology. ? Frequency range
150kHz - 1 GHz. ? Emulates real case equipment.
6
2. Main Immunity Measurement Methods
Bulk Current Injection (BCI)
? Very Similar to Automotive BCI. ? Inductive
coils to inject and monitor RFI injected.
7
2. Main Immunity Measurement Methods
Bulk Current Injection (BCI)
? Very specific board. ? Frequency range DC -
400 MHz. ? Focused on bus interface (RS232, CAN).
8
2. Main Immunity Measurement Methods
Direct Power Injection (DPI)
? Frequency range 10 kHz - 1 GHz ? Well adapted
to perform measurement on power supply or
specific pins. ? Complex setup although based on
a simple capacitance
9
3. Our Test Setup
10
3. Our Test Setup
Measurement results
? Coupling capacitance must be carefully
determined. ? Reproducible measurements. ?
Methodology well adapted to inject RFI through
power supply or specific pins.
11
4. Our Future Works
? Regina, internal measurement of RF
injection. ? Radio Frequency detector. ?
Defensive software approach.
12
5. Conclusion
? EMC context was presented. ? Main parasitic
powerful sources were illustrated. ? Main IC
immunity measurement standards have been shown. ?
Our test methodology have been presented. Test
bench. Main measurement characteristics. ? Our
perspectives have been described.
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