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OUTLINE

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Title: 1.1 Silicon Crystal Structure Author: Blyang Last modified by: tking Created Date: 3/28/2000 4:44:02 PM Document presentation format: On-screen Show – PowerPoint PPT presentation

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Title: OUTLINE


1
Lecture 15
  • OUTLINE
  • pn junction I-V characteristics
  • Reading Chapter 6.1
  • NOTE
  • Typically, pn junctions in IC devices are formed
    by counter-doping. The equations derived in
    class (and in the textbook) can be readily
    applied to such diodes if
  • NA ? net acceptor doping on p-side
    (NA-ND)p-side
  • ND ? net donor doping on n-side (ND-NA)n-side

2
Linearly Graded Junction
3
Biased PN Junctions
Note that VA should be significantly smaller than
Vbi (Otherwise, we cannot assume low-level
injection)
4
Effect of Bias on Electrostatics
5
pn Junction Electrostatics, VA ? 0
  • Built-in potential Vbi (non-degenerate doping)
  • Depletion width W

6
  • Electric field distribution e(x)
  • Potential distribution V(x)

7
Peak Electric Field
  • For a one-sided junction
  • therefore

8
Current Flow - Qualitative
9
Current Flow in a pn Junction Diode
  • When a forward bias (VAgt0) is applied, the
    potential barrier to diffusion across the
    junction is reduced
  • Minority carriers are injected into the
    quasi-neutral regions gt Dnp gt 0, Dpn gt 0
  • Minority carriers diffuse in the quasi-neutral
    regions, recombining with majority carriers

10
  • Current density J Jn(x) Jp(x)
  • J is constant throughout the diode, but Jn(x) and
    Jp(x) vary with position

11
Ideal Diode Analysis Assumptions
  • Non-degenerately doped step junction
  • Steady-state conditions
  • Low-level injection conditions prevail in the
    quasi-neutral regions
  • Recombination-generation is negligible in the
    depletion region
  • i.e. Jn Jp are constant inside the depletion
    region

12
Ideal Diode Analysis Approach
  • Solve the minority-carrier diffusion equations in
    quasi-neutral regions to obtain
    Dnp(x,VA),Dpn(x,VA)
  • apply boundary conditions
  • p-side Dnp(-xp), Dnp(-?)
  • n-side Dpn(xn), Dpn(?)
  • Determine minority-carrier current densities in
    quasi-neutral regions
  • Evaluate Jn at x-xp and Jp at xxn
  • J(VA) Jn(VA)x-xp Jp(VA )xxn

13
Carrier Concentrations at xp, xn
Consider the equilibrium (VA 0) carrier
concentrations
n-side
p-side
If low-level injection conditions prevail in the
quasi-neutral regions when VA ? 0, then
14
Law of the Junction
The voltage VA applied to a pn junction falls
mostly across the depletion region (assuming that
low-level injection conditions prevail in the
quasi-neutral regions). We can draw 2 quasi-Fermi
levels in the depletion region
15
Excess Carrier Concentrations at xp, xn
n-side
p-side
16
Example Carrier Injection
A pn junction has NA1018 cm-3 and ND1016 cm-3.
The applied voltage is 0.6 V. Question What
are the minority carrier concentrations at the
depletion-region edges? Answer Question
What are the excess minority carrier
concentrations? Answer
17
Excess Carrier Distribution
  • From the minority carrier diffusion equation
  • We have the following boundary conditions
  • For simplicity, we will develop a new coordinate
    system
  • Then, the solution is of the form

18
  • From the x ? boundary condition, A1 0.
  • From the x xn boundary condition,
  • Therefore,
  • Similarly, we can derive

19
pn Diode I-V Characteristic

p-side
n-side
20
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21
Diode Saturation Current I0
  • I0 can vary by orders of magnitude, depending on
    the semiconductor material
  • In an asymmetrically doped pn junction, the term
    associated with the more heavily doped side is
    negligible
  • If the p side is much more heavily doped,
  • If the n side is much more heavily doped,

22
Summary
  • The total voltage dropped across a pn junction is
    Vbi-VA
  • Depletion-layer width
  • Peak electric field
  • Under forward bias (VA gt 0), the potential
    barrier to carrier diffusion is reduced
  • minority carriers are injected and diffuse in
    the quasi-neutral regions
  • Diode current
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