Sources of Component Failures

1
Sources of Component Failures
design errors
soft errors
permanent
transient
Demand integrated silicon debug and fault
diagnosis solutions
soft
deterministic
Failed Components
SEU - soft errors
probabilistic
hard
Design errors
random defects
parametric variations
parametric
catastrophic
Parametric variations
Random Defects
On-Die Temperature variations
2
Integrated Diagnosis for Design Manufacturing

• Three different tasks but similar underlying
  principles
• Design Error Diagnosis
• Complementing either formal verification or
  simulation-based verification
• Silicon Debug
• Diagnosing design bugs using one or several
  fabricated devices
• Fault Diagnosis
• Based on a small number of failed chip data
• Based on a large number of chip data

3
Reconfiguration

• Situation 100M transistors, unlikely all of them
  within spec range and completely functional
• Reconfiguration may be imperative
• Self-test -gt diagnosis -gt reconfiguration
• Done in several steps from wafer probe to field
• Sounds familiar?
• Memory self-test, self-diagnosis, self-repair,
  fault tolerance
• RF adding digital circuitry for self-calibration
  
• fine-tuning performance
• more robust to process, temperature and voltage
  variations
• yield improvement

4
Reliability Re-configurability

• Topics
• Integrated diagnosis for design and manufacturing
• Embedded memory
• Random logic
• Regular ASIC
• Reconfiguration for reliable design
• Self-calibration architectural design
• Timing-error-tolerant architectural design
• DFM new computational and algorithmic aspects
  of OPC PSM for sub-45nm technologies
• Team
• US UCSB
• Taiwan NTHU, NTU
• China ZJU

5
Fundamental Algorithms

• Hybrid Constraint Solver
• Integrating Boolean SAT with Linear Integer
  Arithmetic Solving for Sequential Systems
• For RTL system-level verification, test and
  synthesis applications

6
Education

• Architecture and System issues for nano technology

7
Collaboration

• Kevin Wang UCLA
• Evelyn Hu UCSB
• Andy Yao - TsingHua

8
Prof. Yan

• DFM OPC and PSM for sub-50nm technology
• Formal verification
• Focus on computational and algorithmic aspects of
  nano-electronics