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DEMOCRITUS UNIVERSITY OF THRACE SPACE RESEARCH
LABORATORY   The Space Research Laboratory of the
Democritus University of Thrace (DUTH/SRL) in
Xanthi, Greece, has extensive experience (over 30
yrs) in the Development of Space Instruments and
Subsystems through its participation as P-I or
Co-I in a long series of International Space
Missions including ULYSSES, GEOTAIL, INTERBALL
TAIL (Main Probe and Sub-satellite), INTERBALL
AURORA (Main Probe and Sub-satellite), ACE,
CLUSTER-II. Most importantly DUTH/SRL has
acquired 18 years expertise in the development of
Rad-Hard Sensor Interface ASICs and
Systems-on-a-Chip (SoC), which have been used for
several pioneering NASA Missions including
CASSINI, IMAGE, MESSENGER, STEREO, Pluto New
Horizons, etc. Recently DUTH/SRL is actively
involved with the development of Rad-Hard Sensor
Interface ASICs for ESA
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ISTP International Solar Terrestrial
Programme DUTH/SRL Participation w. experiments
on 12 S/C
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ULYSSES
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INTERBALL DUTH/SRL Participation in DOK-2
Instrument
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ACE/EPAM Experiment
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DUTH/SRL Activities in the development of
Advanced Space Instruments and Systems Space
Science Instruments Energy and time
measurements for radiation detection and imaging
(Particle and fields instruments, x-ray,
gamma-ray, UV-Imaging), Laser Altimeter, TOF
Mass Spectrometer Instruments.   Spacecraft
Electronics Localized Distributed Smart
Sensor Data Acquisition and Controls,
Housekeeping.   Analog-Digital Integrated
Circuits and system on a chip Full-custom,
rad-hard, technology independent layout design,
Design for Testability.
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DEMOCRITUS UNIVERSITY OF THRACE SPACE RESEARCH
LABORATORY   Integrated Circuits for Space
Applications   During the last 18 years the
Space Research Laboratory of the Democritus
University of Thrace (DUTH/SRL) has acquired
pioneering expertise in the development of new
radiation-hardened, low power, space qualified
mixed Analog/Digital microelectronics devices for
spacecraft instruments and subsystems. The
expertise encompasses the Design, Simulation,
Verification, Testing, Packaging and Space
Qualification of dedicated ASICs, which are used
for the end-to-end development of bigger
subsystems.
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• DUTH/SRL Advanced ASICs for Space Heritage
• DUTH/SRL in cooperation with the Space Department
  of the Applied Physics Laboratory of the Johns
  Hopkins University (APL/JHU) was successfully
  involved in several Advanced Space Technology
  projects for a series of NASAs New Missions
  including
• CASSINI,
• IMAGE,
• CONTOUR,
• MESSENGER,
• NEW HORIZONS,
• JIMO (Europa Orbiter),
• STEREO.
• with DUTH/SRL personnel both on-site at APL and
  at the University of Thrace

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DEMOCRITUS UNIVERSITY OF THRACE SPACE RESEARCH
LABORATORY    Temperature Remote Input Output
(TRIO) Data Acquisition System on a Chip. TRIO
is a versatile low power mixed signal data
acquisition ASIC device suitable for S/C
Housekeeping monitoring the health status of
spacecraft science instruments. TRIO can also
be used as a general purpose ADC. The chip has
been fabricated on a 0.8 µm CMOS process. The
TRIO Smart Sensor Chip has been selected as an
integral part of NASAs X-2000 advanced
technology generic spacecraft. Several hundred
TRIO Devices are now used in a number of
exploratory space missions.
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IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC
SYSTEMS VOL. 40, No. 3 JULY 2004, p862
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• Time of Flight (TOF) Chip
• The Time of Flight Chip consists of two main
  cores
• Dual channel Constant Fraction Discriminator
  (CFD)
• Time to Digital Converter (TDC).
• The CFD is also fabricated as a stand-alone chip.
  
• The TDC measures time intervals with a maximum of
  50ps resolution. The pulse shrinking method is
  used for the digitization of the time interval
  between a start and a stop input pulse. The TDC
  has a dynamic range of 11 bits and power
  consumption below 20 mW at an event rate of 500
  Kevents/sec.
• The chip was designed to operate in a wide
  temperature and power supply range, and for a
  wide LSB range (tested 50 - 800 ps). High
  counting rate (over 1Mevents/sec for LSB100ps)
  was also a priority.
• The TOF chip is used in the HENA (High Energy
  Neutral Atoms) instrument of the IMAGE NASA
  mission

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Constant Fraction Discriminator (CFD) Chip The
Constant Fraction Discriminator (CFD) chip is a
two-channel time pick-off circuit. The device
targets a broad class of science instruments that
use the TOF principle such as particle
spectrometers, delay line position sensing etc.
In a typical application the start-stop events
are generated by secondary electrons or photons
hitting a micro-channel plate (MCP) that provides
an amplification of 10E5 to 10E6. Typical input
dynamic range is 1100. Four CFD devices
fabricated in a 0.8µ CMOS technology are already
flying on the NASA/IMAGE mission as part of the
High Energy Neutral Atom (HENA) imaging
instrument that measures particle energy and
species in the range 10 KeV to 1MeV. The CFD
is baselined for several instruments on a number
of missions including Messenger and New Horizons.
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The Energy Readout Chip
The chip includes CSA with JFET option, a shaper
and a peak detector. A separate ADC ASIC is also
developed to complete the channel. The first
prototype chips are fabricated in 0.8µ and 0.5µ
CMOS process. Preliminary results indicate 3 KeV
FWHM noise with a 10 pf detector capacitance, 2
µs peaking time constant and 10 mW per channel.
There are several variations of this
development for the diverse scientific
requirements of the differed missions. A highly
integrated low power version has been used for
the NASA New-Horizons mission to Pluto.
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Pressure Sensor Interface ASIC
pSIF-ASIC
DUTH/SRL
ETS
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Pressure Sensor Interface ASIC

• The goal of the project is to design, fabricate,
  test and qualify for space flight an ASIC that
  will interface the PRESENS Pressure Sensor
  Element.
• ASIC Functionality
• Digitize the sensor output voltages by a high
  resolution
• 14(1)-bit ADC.
• Bias the sensor with either a constant voltage
  or a constant
• current.
• Interface up to 4 pressure sensing elements (SIF
  up to 32).
• Store in an internal memory and transmit to an
  external µ-
• controller the digitized sensor data through a
  parallel and
• serial interface.
• Provide a bandgap reference voltage

DUTH/SRL
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Pressure Sensor Interface ASIC
DUTH/SRL
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Pressure Sensor Interface ASIC
pSIF-ASIC CHARACTERISTICS   Accuracy 15
bits Bandwidth gt 500 KHz Radiation Tolerance
TID gt 1 Mrad, SEE Hardness Level LET gt
120 MeV/cm2.mg Power Dissipation 5 mW _at_ fin
500KHz Power supply 2.5 or 3.3 V (Internal
Voltage Regulator) Temperature Range -55 to
125 deg C Technology 0.25 µm UMC Size
4.6 mm X 4.9 mm 22.5 mm2
DUTH/SRL
ETS
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