Title: I have seen this happen !
1I have seen this happen !
2You have exceeded your storage allocation
3Creating a n-p junction on a p-type silicon
wafer
- A n-p junction is a diode and a solar cell
- It can also be the start of a n-p-n bipolar
transistor or a FET transistor - Starting with a n-type wafer would create a p-n
junction
4When creating a doped junction in silicon
- There are two situations
- Using a limited source
- Using a infinite source
- Each situation has a different mathematical
calculation to determine diffusion depth
5With an infinite source, the dopant is constantly
suppliedExample phosphorus gas continually
supplied
P P P P P P P P
P P P P P P P P P
P P P P P P P P
P P P P
- Clean silicon wafer
- P-type
6With an limited source, the dopant has a fixed
amount availableExample spin on phosphorus film
P P P P P P P P P
P P P
- Clean silicon wafer
- P-type
7For the solar cell being fabricated for this lab
8Start with a clean p-type silicon wafer
- Clean silicon wafer
- P-type
9A SiO2 layer is deposited via PECVD on the
backside to prevent backside doping
- Clean silicon wafer
- P-type
Backside SiO2
10Using a liquid n-type phosphorus spin on dopant,
a layer of phosphorus is left on the surface
Spin on phosphorus (n) dopant
- Clean silicon wafer
- P - type
Backside SiO2
11To avoid contamination, a separate spinner is
used for the spin on dopants
Spin at 3 KRPM for 20 seconds. Spin is preset
for correct conditions
Wafer held with vacuum. Vacuum switch is located
on control panel
This spinner is located in the yellow room
closest to the garment change out room
12Liquid dopants are located in the dry box. Use
P509 and always check the expiration date
Use P509 expiration date 1-30-2012
13High temperature tube furnace for 9500C diffusion
Furnace 6 is for phosphorus doping only. Do not
cross contaminate apparatus and tweezers. Verify
correct temperature before using
14After diffusion _at_ 9500C a n-region is created in
the silicon. Time and temperature determine the
depth of the n doped region
n doped silicon
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Backside SiO2
15An HF etch removes any residual phosphorus on the
surface and the backside SiO2
n doped
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16A n/p junction has been formed
n doped
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17Solid phosphorus sources are available
18Liquid POCl3 with a nitrogen carrier gas is also
used as a phosphorus dopant. POCl3 will form
HCl on exposure to moist air or water !
Nitrogen carrier gas in
To high temperature furnace tube
Constant temperature cooler (200C)
19A photo-mask will need to be created using AutoCAD
- Due to the current limitations on the tester in
the clean room, cell size is limited to a maximum
of - 10 cm2
20Current solar light simulator in Cameron clean
room with Keithley 4200 I/V tester _at_ 1 amp max
21Example of a photo-mask transparency
22AutoCAD dimension drawing must be submitted for
approval
- Dimension Drawing is due in 2 weeks
- Any pattern for top side conductor is acceptable.
Multiple top side conductor patterns preferred - Cell size can vary from 2 cm2 to 10cm2
- Patterns must be in-line to cut with the dicing
saw
23A new solar cell tester will be available in EPIC
with higher current capability (10 amp)
24The new tester will provide the capability to
test standard size industrial cells
125mm x 125mm cell