AMICSA 2006 - PowerPoint PPT Presentation

About This Presentation
Title:

AMICSA 2006

Description:

AMICSA 2006 summary AMICSA 2006 in numbers 48 participants From 12 countries GR, FR, UK, NE, GE, IT, BE, USA, SWI, SWE, AU From 26 different institutions/companies ... – PowerPoint PPT presentation

Number of Views:27
Avg rating:3.0/5.0
Slides: 9
Provided by: Philippe278
Category:

less

Transcript and Presenter's Notes

Title: AMICSA 2006


1
AMICSA 2006 summary
2
AMICSA 2006 in numbers
  • 48 participants
  • From 12 countries GR, FR, UK, NE, GE, IT, BE,
    USA, SWI, SWE, AU
  • From 26 different institutions/companies
    DUTH/Space Research Lab, A2S, EADS Astrium, E2V
    (ex Atmel Grenoble), ESA, CNES, National
    Semiconductor, TRAD, Aurelia, NTUA,
    STMicroelectronics, SODERN, SRON, Fraunhofer Inst
    IC, IHP, IMST, NISR, TESAT, ETH, SUPAERO, Saab,
    IMEC, AAS, Austria Space Research Inst,
    Nucletudes, ISD.
  • 17 presentations in 2 days, plenty of
    discussions, questions and answers

3
AMICSA - Applications
  • CMOS Image sensors
  • Video processing chain
  • ADC/DAC/HSSL high speed low power telecom
    processors (mobile broadband)
  • CAN transceivers
  • TM acquisition data handling IO control
  • Magnetometer front end
  • Slow sampling high resolution

4
AMICSA Technology (I/II)
  • PROCESSES
  • CMOS
  • Bipolar
  • BiCMOS
  • Si / SiGe
  • bulk /epi / SOI
  • FOUNDRIES
  • AMS (Austria)
  • AMIS (Belgium)
  • STMicroelectronics (France)
  • IHP (Germany)
  • Infineon (Germany)
  • XFab (UK)
  • UMC (Taiwan)

5
AMICSA Technology (II/II)
  • EDA tools, HDL DK
  • Tanner
  • Cadence
  • Calibre (Mentor)
  • Pspice / Hspice
  • ADMS (Mentor)
  • VHDL-AMS / Verilog-A
  • Astrium UK ADC simulator
  • MPW programmes
  • Europractice
  • CMP
  • MOSIS
  • vendor specific

6
AMICSA Radiation effects
  • Mitigation Techniques
  • (technology and function dependent)
  • enclosed/bigger transistors
  • guardband rings / STI / LOCOS
  • avoid diffusion resistors in favor of oxide R
  • epi layer / hetero-epi
  • buried-layers
  • low gain artificially provoked parasitic
    transistors
  • DRC isolation rules
  • SOI
  • thinner gate oxide
  • hardened libraries (re-size, cell-topology)
  • ADC offset auto-zeroing (analog and digital
    correction)
  • architecture hardening (open vs closed loop)
  • redundancy and voting/comparing
  • Rad Threats
  • (TID, SEE)
  • leakage currents
  • Vth shifts
  • parasitic transistors/ latch up
  • gate rupture
  • data corruption (bit flips)
  • transient pulses

7
AMICSA Future Challenges
  • Easier selection of process, foundry, design kit
    tools, rad mitigation techniques, quality level
  • Lower cost access to design kits, manufacturing
    services
  • Simulation tools. Characterising COTS (NPR,etc)
  • Supporting EU foundries in low volume market
  • Coordinating/reusing EU resources (e.g. rad
    tests, new libs/DK IPs), preserving industry
    competition and individual commercial interests
  • Finding more resources for more tech/components
    evaluation and qualification. Sharing results !
  • Maintaining good (better) communication channels
    (ESCC Working Groups , AMICSA 2008 ?,
    Harmonisation/Tech Dossiers)

8
AMICSA THANKS !
  • to all participants
  • to sponsors DUTH / ESA / National Semiconductor
  • to organizers
  • Boris Glass and ESA Conference Bureau
  • Professor Emmanuel Sarris and DUTH / Space
    research Lab team !!
Write a Comment
User Comments (0)
About PowerShow.com