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MOS Field-Effect

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Title: MOS Field-Effect


1
MOS Field-Effect Transistors (MOSFETs)
1
2
MOSFET ( Voltage Controlled Current Device)
  • MOS Metal Oxide Semiconductor
  • Physical Structure
  • FET Field Effect Transistor
  • The current controlled mechanism is based on an
    electric field established by the voltage applied
    to the control terminal GATE
  • Uni-polar Current is conducted by only one
    carrier
  • IGFET Insulated Gate FET
  • CMOSFET Complementary MOSFET
  • 1930 was Known, 1960s Commercialized
  • 1970s Most commonly used VLSI
  • NMOSFET/PMOSFET n/p-channel enhancement mode
    MOSFET

3
MOSFET
  • Small Size
  • Manufacturing process is simple
  • Requires comparatively low power
  • Implement digital analog functions with a fewer
    resistors very large scale Integrated (VLSI)
    circuit
  • Study Includes
  • Physical structure
  • Operation
  • Terminal characteristics
  • Circuit Models
  • Basic Circuit application

4
Figure 4.1 Physical structure of the
enhancement-type NMOS transistor
5
Device Structure
  • Types n channel enhancement MOSFET
  • p channel enhancement MOSFET
  • n Channel MOSFET
  • Fabricated on a p-type substance that provides
    physical support for the device.
  • Two heavily doped n-type region are created
  • n Source (S) n for lightly doped n type
    silicon
  • n Drain (D) n for heavily doped n type
    silicon
  • Area between source Drain
  • Thin Layer of Silicon dioxide (SiO2) is grown
    with thicker of tox 2-50 nanometers An
    excellent electrical insulator
  • Metal is deposited on top of the oxide layer to
    form the Gate electrode. Metal contact is made to
    Source Drain and the substrate (Body)

6
Figure 4.1 Physical structure of the
enhancement-type NMOS transistor
Cross-section. Typically L 0.1 to 3 mm, W
0.2 to 100 mm, and the thickness of the oxide
layer (tox) is in the range of 2 to 50 nm.
7
Device Structure
  • Four terminals
  • Source (S)
  • Gate (G)
  • Drain (D)
  • Body (B)
  • L Length of channel region
  • W Width of the substrate
  • tox Thickener of An oxide Layer

8
Device Structure
  • Metal oxide semiconductor - name is derived from
    its physical structure
  • Insulted Gate FET (IGFET) gate is
    electrically insulated from the device body
  • Current in gate terminal is small (10-15 A)
  • Substrate forms pn junctions with the source
    drain region is kept reversed biased all the
    time
  • Drain will be at a positive voltage relative to
    the source, two junctions are at cutoff mode if
    substrate is connected to the source. Thus Body
    will have no effect on operation of the device.

9
Principle of operation
  • Voltage applied to the Gate controls current flow
    between Source Drain with direction from Drain
    to Source in channel region
  • It is a symmetrical device thus Drain Source
    can be interchanged with no change in devices
    characteristics
  • With no bias gate voltage, two back-to-back
    diodes exist in series between drain and source.
  • No current flows even if vDS is applied. In fact
    the path between Source Drain (1012?) has very
    high resistance

10
Figure 4.2 The enhancement-type NMOS transistor
with a positive voltage applied to the gate. An n
channel is induced at the top of the substrate
beneath the gate.
11
Creating a Channel for Current Flow
  • Source Drain are grounded and a positive
    voltage (vGS) is applied to the gate.
  • Holes are repelled-leaving behind a carrier
    depletion-region.
  • Depletion region is populated with the bounded
    negative charges associated with the acceptor
    atoms and are uncovered because the neutralizing
    holes have been push downward into the substrate.

12
Channel for Current Flow
  • Positive gate attracts electrons from the n
    source drain region into the channel region.
  • Due to electrons accumulated under the gate, an
    n region is created connects source drain
    region.
  • Thus if voltage is applied between source
    drain, current flows due to mobile electrons
    between drain source.
  • n region forms a channel n channel MOSET
    (NMOSFET)

13
Channel for Current Flow
  • An n channel MOSFET is formed in a p type
    substrate. Known as Inversion Layer.
  • The value of vGS that causes sufficient number of
    mobile electrons to be accumulate in the channel
    region to form conducting channel is called
    threshold Voltage Vt.
  • Vt for n channel is positive value is 0.5
    to 1V

14
Channel for Current Flow
  • Gate channel region form a parallel plate
    capacitor, with oxide layer as the capacitor
    dielectric.
  • Positive charge is accumulated on gate electrode
    negative charge on channel electrode.
  • An electric field thus develops in the vertical
    direction.
  • Capacitor charge controls the current flow
    through the channel when a voltage vDS is
    applied.
  • Gate Channel

15
Figure 4.3 An NMOS transistor with vGS gt Vt and
with a small vDS applied.
The device acts as a resistance whose value is
determined by vGS. Specifically, the channel
conductance is proportional to vGS Vt and
thus iD is proportional to (vGS Vt) vDS.
16
Applying a Small vDS
  • vDS is applied (vDS 50mV) causes iD to flow
    through induced n channel.
  • Direction is opposite to that of the flow of
    negative charges.
  • Magnitude of iD depends upon density of electrons
    and in term on vGS .
  • vGS Vt
  • Negligible current iD as the channel has been
    just induced.
  • vGS gt Vt
  • iD current increases, increases conductance of
    the channel is proportional to Excess gate
    voltage (vGS - Vt )
  • vGS - Vt is known as Excess gate Voltage ,
    Effective Voltage Overdrive Voltage (VOV)
  • MOSFET operatrates as a linear resistance whose
    value is controlled by vGS.
  • vGS above Vt enhances the channel named
    Enhanced Mode operation enhanced type MOSFET
  • iD iS, iG 0

17
Figure 4.4 The iDvDS characteristics of the
MOSFET
When the voltage applied between drain and
source, vDS, is kept small. The device operates
as a linear resistor whose value is controlled by
vGS.
18
Figure 4.5 Operation of the enhancement NMOS
transistor as vDS is increased. The induced
channel acquires a tapered shape, and its
resistance increases as vDS is increased. Here,
vGS is kept constant at a value gt Vt.
19
The drain current iD versus the drain-to-source
voltage vDS for an enhancement-type NMOS
transistor operated with vGS gt Vt.
20
Increasing vDS causes the channel to acquire a
tapered shape. Eventually, as vDS reaches vGS
Vt the channel is pinched off at the drain end.
Increasing vDS above vGS Vt has little effect
(theoretically, no effect) on the channels shape.
21
Derivation of the iDvDS characteristic of the
NMOS transistor.
22
Drain Current iD
  • Directly Proportional to
  • Mobility of Electrons in the channel µn (µm2/V)
  • Gate Capacitance per unit gate area Cox (µF/ µm)
  • Width of the substrate (µm)
  • Gate-Source Voltage vGS (Volts)
  • Drain-Source Voltage v DS (Volts)
  • Indirectly Proportional to
  • Length of the channel (µm)

23
iD vDS relationship
Troide Mode
Saturation Mode
24
The p Channel MOSFET
  • Fabricated on an n-type substrate with p regions
    for Drain Source
  • Holes are the current carriers.
  • vGS vDS are negative
  • Threshold voltage Vt is negative.
  • Both NMOS PMOS are utilized in Complementary
    MOS or CMOS circuits

25
Complementary MOS or CMOS
Cross-section of a CMOS integrated circuit. Note
that the PMOS transistor is formed in a separate
n-type region, known as an n well. Another
arrangement is also possible in which an n-type
body is used and the n device is formed in a p
well. Not shown are the connections made to the
p-type body and to the n well the latter
functions as the body terminal for the p-channel
device.
26
iD vDS Charateristics
  • Modes of operation
  • Cutoff
  • Triode (Saturation in BJT)
  • Saturation ( Active in BJT)

27
The iDvDS characteristics for a device with kn
(W/L) 1.0 mA/V2.
28
The iDvGS characteristic for an enhancement-type
NMOS transistor in saturation (Vt 1 V, kn W/L
1.0 mA/V2).
29
Large-signal equivalent-circuit model of an
n-channel MOSFET operating in the saturation
region.
30
Finite Output Resistance in Saturation
Increasing vDS beyond vDSsat causes the channel
pinch-off point to move slightly away from the
drain, thus reducing the effective channel length
(by DL).
31
Finite Output Resistance in Saturation
Effect of vDS on iD in the saturation region. The
MOSFET parameter VA depends on the process
technology and, for a given process, is
proportional to the channel length L.
32
Finite Output Resistance in Saturation
Large-signal equivalent circuit model of the
n-channel MOSFET in saturation, incorporating the
output resistance ro. The output resistance
models the linear dependence of iD on vDS
33
Circuit symbol for the p-channel enhancement-type
MOSFET.
34
Characteristics of PMOSFETTriode Mode of
Operation
35
Characteristics of PMOSFETSatuaration Mode of
Operation
36
The Roll of Substrate Body Effect
  • Substrate for many Transistors
  • Body is connected to the most negative power
    supply to maintain cutoff conditions for all the
    substrates to channel junctions
  • Another gate

37
Temperature Effects
  • Vt and Kn are effected by the temperature
  • Vt increases by 2mV per 10C rise in temperature
  • Kn decreases with rise in temperature thus drain
    current increases. The effect is dominant. Thus
    ID decreases with increase in temperature
  • MOSFET in Power circuits

38
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39
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40
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41
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42
Graphical construction to determine the transfer
characteristic of the amplifier in (a).
43
Circuit for Example 4.9.
44
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45
Biasing the MOSFET using a large drain-to-gate
feedback resistance, RG.
46
Biasing the MOSFET using a constant-current source
47
Conceptual circuit utilized to study the
operation of the MOSFET as a small-signal
amplifier.
48
Recap Transfer Function
49
Transfer characteristic showing operation as an
amplifier biased at point Q.
50
Conceptual circuit utilized to study the
operation of the MOSFET as a small-signal
amplifier.
The DC BIAS POINT
To Ensure Saturation-region Operation
51
Signal Current in Drain Terminal
52
Figure 4.35 Small-signal operation of the
enhancement MOSFET amplifier.
53
Total instantaneous voltages vGS and vD
54
Small-signal p models for the MOSFET
55
Common Source amplifier circuit Example 4-10
56
Small Signal T Model NMOSFET
57
Small Signal Models
T Model
58
Single Stage MOS Amplifier
59
Amplifiers Configurations
60
Common Source Amplifier (CS) Configuration
61
Common Source Amplifier (CS)
  • Most widely used
  • Signal ground or an ac earth is at the source
    through a bypass capacitor
  • Not to disturb dc bias current voltages
    coupling capacitors are used to pass the signal
    voltages to the input terminal of the amplifier
    or to the Load Resistance
  • CS circuit is unilateral
  • Rin does not depend on RL and vice versa

62
Small Signal Hybrid p Model (CS)
63
Small Signal Hybrid p Model (CS)
64
Small-signal analysis performed directly on the
amplifier circuit with the MOSFET model
implicitly utilized.
65
BJT / MOSFET
66
Common Source Amplifier (CS) Summary
  • Input Resistance is infinite (Ri8)
  • Output Resistance RD
  • Voltage Gain is substantial

67
Common-source amplifier with a resistance RS in
the source lead
68
The Common Source Amplifier with a Source
Resistance
  • The T Model is preferred, whenever a resistance
    is connected to the source terminal.
  • ro (output resistance due to Early Effect) is not
    included, as it would make the amplifier non
    unilateral effect of using ro in model would be
    studied in Chapter 6

69
Small-signal equivalent circuit with ro neglected.
70
Small-signal Analysis.
71
Voltage Gain CS with RS
72
  • Source Resistance can be used to control the
    magnitude of the signal vgs thus ensure that
    vgs does not become too large to cause non-linear
    distortion
  • vgs ltlt 2(VGS-Vt) ltlt 2VOV

73
Common Source Configuration with Rs
  • Rs causes a negative feedback thus improving the
    stability of drain current of the circuit but at
    the cost of voltage gain
  • Rs reduces id by the factor
  • (1gmRs) Amount of feedback
  • Rs is called Source degeneration resistance as it
    reduces the gain

74
Small-signal equivalent circuit directly on
Circuit
75
A common-gate amplifier based on the circuit
76
Common Gate (CG) Amplifier
  • The input signal is applied to the source
  • Output is taken from the drain
  • The gate is formed as a common input output
    port.
  • T Model is more Convenient
  • ro is neglected

77
A small-signal equivalent circuit
78
A small-signal Analusis CG
79
A small-signal Analusis CG
80
Small signal analysis directly on circuit
81
The common-gate amplifier fed with a
current-signal input.
82
Summary CG
  • 4. CG has much higher output Resistance
  • CG is unity current Gain amplifier or a Current
    Buffer
  • CG has superior High Frequency Response.

83
Common Gate
  • Rin in independent of RL Rin 1/gm gm in
    order of mA/V.
  • Input resistance of the CG Amplifier is
    relatively low (in order of 1kv) than CS
    Amplifier
  • Loss of signal
  • CG is acts as Unity gain current amplifier
    current buffer useful for a Cascade circuitry

84
A common-drain or source-follower amplifier.
85
Small-signal equivalent-circuit model
86
Small-signal Analysis CD
87
(a) A common-drain or source-follower amplifier
output resistance Rout of the source follower.
88
(a) A common-drain or source-follower amplifier.
Small-signal analysis performed directly on the
circuit.
89
Common Source Circuit (CS)
90
Common Source Circuit (CS) With RS
91
Common Gate Circuit (CG) Current Follower
92
Common Drain Circuit (CD) Source Follower
93
Summary Comparison
94
Quiz No 4
27-03-07
  • Draw/Write the Following

BJT BJT MOSFET MOSFET
Types npn pnp nMOS pMOS
Symbols
p Model
T Model
gm
Re/rs
rp/rg

95
Problem 5-44
96
SOLUTION DC Analysis
97
SOLUTION DC Analysis
IE
IB
gm 40mA/V
98
Solution Small Signal Analysis
99
Solution Small Signal Analysis
100
Solution Small Signal Analysis Input Resistance
ib

vb
-
Rin
101
Solution Small Signal Analysis Output Resistance
Itest
IE
IRC
IE/(1ß)
Rout
102
Solution Small Signal Analysis Voltage Gain

veb
-
-
Vo


vi
-
103
Solution Small Signal Analysis Voltage gain

veb
-

vi
-
104
Solution Small Signal Analysis Voltage Gain

vi
-
105
Solution Small Signal Analysis Voltage Gain
106
Solution Small Signal Analysis Voltage Gain
-
Vo


vi
-
107
Problem
108
Small Signal Model MOSFET CD
109
Solution Small Signal Analysis
110
Solution Small Signal Analysis Input Resistance
Ig0
Rin
111
Solution Small Signal Analysis Output Resistance
Itest
ID
IRD
0 V
Vtest
IG0
Rout
112
Solution Small Signal Analysis Voltage Gain

vsg
-
-

vo
vi

-
113
Solution Small Signal Analysis Voltage gain

vsg
-

vi
-
114
Solution Small Signal Analysis Voltage Gain

vi
-
115
Solution Small Signal Analysis Voltage Gain
116
Solution Small Signal Analysis Voltage Gain
-


vi
-
117
Solution Small Signal Analysis
118
Transistor Pairings Amplifiers
  • Common Emitter Common Base (CE-CB)
  • Common Emitter Common Collector (CE-CC)
  • Common Collector - Common Emitter (CC-CE)
  • Common Collector - Common Base (CC-CB)

119
Problem 6-127(e)
120
DC Analysis 6-127(e)
121
Small Signal Model
122
Small Signal Model
123
Small Signal Model
Rin
124
Small Signal Model


vbe2
vbe1
-
-
Rout
125
Small Signal Model
126
Problem6-127(f)Replacing BJT with MOSFET
127
Small Signal Model
128
Small Signal Model
129
Small Signal Model
Rin
Rout
130
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131
Problem 6-127(f)
132
Solution P6-127(f)

vbe2
-

veb1
-
133
Solution P6-127(f)
134
Problem 6-127(f) with MOSFET
135
Solution P6-127(f)

vgs2
-

vsg1
-
136
Solution P6-127(f)
ig10

vi
-
137
Comparison BJT/MOSFET Cct
138
Problem 6-123
VBE0.7 V ß 200 Kn(W/L)2mA/V2 Vt1V
Figure P6.123
139
DC Analysis
Figure P6.123
140
DC Analysis
VBE0.7 V ß 200 Kn(W/L)2mA/V2 Vt11V Vt225mV
1mA
2V
0.7V
IG0
I0.7/6.80.1mA
141
Small Signal Model
142
Small Signal Model
143
Small Signal Model Voltage Gain
ig0


vi
vbe2
-
-
144
Small Signal Model Input Resistance
ii
ig0

vi
-
Rin
145
Small Signal Model Output Resistance
IRG
Itest
Vtest vo
Rout
146
The Miller Theorem.
147
The Miller equivalent circuit.
148
Miller Theorem
149
Miller theorem
  • Miller theorem states that impedance Z can be
    replaced by two impedances Z1 connected between
    node 1 and ground and Z2 connected between node 2
    and ground where

150
Miller theorem
  • Miller equivalent circuit is valid only as long
    as the rest of the circuit remains unchanged
  • Miller equivalent circuit cannot be used directly
    to determine the output resistance of an
    amplifier. It is due to the fact for output
    impedance test source is required and thus
    circuit has a major change.

151
Circuit for Example 6.7.
152
Circuit for Example 6.7.
153
Example
K-100 V/V, Z 1 M O
154
OBSERVATIONS
  • The Miller replacement for a negative feedback
    results in a smaller resistance by a factor of
    (1-K) at the input.
  • The multiplication of a feedback impedance by a
    factor (1-k) is referred as Miller Multiplication
    or Miller Effect

155
Small Signal ModelCE with RE includng r0
156
A CE amplifier with emitter degeneration Input
Resistance
7
2
3
1
4
6
5
157
A CE amplifier with emitter degeneration Input
Resistance
158
A CE amplifier with emitter degeneration to
determine Avo.
Open Circuit Voltage Gain
Figure 6.49
159
A CE amplifier with emitter degeneration to
determine Output Resistance
6
7
5
4
3
1
2
160
A CE amplifier with emitter degeneration to
determine Short-Circuit Trans-conductance Gm
161
Active-loaded common-base amplifier
Figure 6.33
162
Active-loaded common-base amplifier to determine
Input Resistance
7
4
5
3
6
2
1
Figure 6.33
163
Active-loaded common-base amplifier With output
open-circuit
6
7
5
4
3
8
2
1
Figure 6.33
164
A CB amplifier to determine Output Resistance
6
7
5
4
3
1
2
165
Quiz No 8 DE 28 EE
166
Quiz No 8 DE 28 EE
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