Title: MOS Field-Effect
1MOS Field-Effect Transistors (MOSFETs)
1
2MOSFET ( Voltage Controlled Current Device)
- MOS Metal Oxide Semiconductor
- Physical Structure
- FET Field Effect Transistor
- The current controlled mechanism is based on an
electric field established by the voltage applied
to the control terminal GATE - Uni-polar Current is conducted by only one
carrier - IGFET Insulated Gate FET
- CMOSFET Complementary MOSFET
- 1930 was Known, 1960s Commercialized
- 1970s Most commonly used VLSI
- NMOSFET/PMOSFET n/p-channel enhancement mode
MOSFET
3MOSFET
- Small Size
- Manufacturing process is simple
- Requires comparatively low power
- Implement digital analog functions with a fewer
resistors very large scale Integrated (VLSI)
circuit - Study Includes
- Physical structure
- Operation
- Terminal characteristics
- Circuit Models
- Basic Circuit application
4Figure 4.1 Physical structure of the
enhancement-type NMOS transistor
5Device Structure
- Types n channel enhancement MOSFET
- p channel enhancement MOSFET
- n Channel MOSFET
- Fabricated on a p-type substance that provides
physical support for the device. - Two heavily doped n-type region are created
- n Source (S) n for lightly doped n type
silicon - n Drain (D) n for heavily doped n type
silicon - Area between source Drain
- Thin Layer of Silicon dioxide (SiO2) is grown
with thicker of tox 2-50 nanometers An
excellent electrical insulator - Metal is deposited on top of the oxide layer to
form the Gate electrode. Metal contact is made to
Source Drain and the substrate (Body)
6Figure 4.1 Physical structure of the
enhancement-type NMOS transistor
Cross-section. Typically L 0.1 to 3 mm, W
0.2 to 100 mm, and the thickness of the oxide
layer (tox) is in the range of 2 to 50 nm.
7Device Structure
- Four terminals
- Source (S)
- Gate (G)
- Drain (D)
- Body (B)
- L Length of channel region
- W Width of the substrate
- tox Thickener of An oxide Layer
8Device Structure
- Metal oxide semiconductor - name is derived from
its physical structure - Insulted Gate FET (IGFET) gate is
electrically insulated from the device body - Current in gate terminal is small (10-15 A)
- Substrate forms pn junctions with the source
drain region is kept reversed biased all the
time - Drain will be at a positive voltage relative to
the source, two junctions are at cutoff mode if
substrate is connected to the source. Thus Body
will have no effect on operation of the device.
9Principle of operation
- Voltage applied to the Gate controls current flow
between Source Drain with direction from Drain
to Source in channel region - It is a symmetrical device thus Drain Source
can be interchanged with no change in devices
characteristics -
- With no bias gate voltage, two back-to-back
diodes exist in series between drain and source. - No current flows even if vDS is applied. In fact
the path between Source Drain (1012?) has very
high resistance
10Figure 4.2 The enhancement-type NMOS transistor
with a positive voltage applied to the gate. An n
channel is induced at the top of the substrate
beneath the gate.
11Creating a Channel for Current Flow
- Source Drain are grounded and a positive
voltage (vGS) is applied to the gate. - Holes are repelled-leaving behind a carrier
depletion-region. - Depletion region is populated with the bounded
negative charges associated with the acceptor
atoms and are uncovered because the neutralizing
holes have been push downward into the substrate.
12Channel for Current Flow
- Positive gate attracts electrons from the n
source drain region into the channel region. - Due to electrons accumulated under the gate, an
n region is created connects source drain
region. - Thus if voltage is applied between source
drain, current flows due to mobile electrons
between drain source. - n region forms a channel n channel MOSET
(NMOSFET)
13Channel for Current Flow
- An n channel MOSFET is formed in a p type
substrate. Known as Inversion Layer. - The value of vGS that causes sufficient number of
mobile electrons to be accumulate in the channel
region to form conducting channel is called
threshold Voltage Vt. - Vt for n channel is positive value is 0.5
to 1V
14Channel for Current Flow
- Gate channel region form a parallel plate
capacitor, with oxide layer as the capacitor
dielectric. - Positive charge is accumulated on gate electrode
negative charge on channel electrode. - An electric field thus develops in the vertical
direction. - Capacitor charge controls the current flow
through the channel when a voltage vDS is
applied. - Gate Channel
15Figure 4.3 An NMOS transistor with vGS gt Vt and
with a small vDS applied.
The device acts as a resistance whose value is
determined by vGS. Specifically, the channel
conductance is proportional to vGS Vt and
thus iD is proportional to (vGS Vt) vDS.
16Applying a Small vDS
- vDS is applied (vDS 50mV) causes iD to flow
through induced n channel. - Direction is opposite to that of the flow of
negative charges. - Magnitude of iD depends upon density of electrons
and in term on vGS . - vGS Vt
- Negligible current iD as the channel has been
just induced. - vGS gt Vt
- iD current increases, increases conductance of
the channel is proportional to Excess gate
voltage (vGS - Vt ) - vGS - Vt is known as Excess gate Voltage ,
Effective Voltage Overdrive Voltage (VOV) - MOSFET operatrates as a linear resistance whose
value is controlled by vGS. - vGS above Vt enhances the channel named
Enhanced Mode operation enhanced type MOSFET - iD iS, iG 0
17Figure 4.4 The iDvDS characteristics of the
MOSFET
When the voltage applied between drain and
source, vDS, is kept small. The device operates
as a linear resistor whose value is controlled by
vGS.
18Figure 4.5 Operation of the enhancement NMOS
transistor as vDS is increased. The induced
channel acquires a tapered shape, and its
resistance increases as vDS is increased. Here,
vGS is kept constant at a value gt Vt.
19The drain current iD versus the drain-to-source
voltage vDS for an enhancement-type NMOS
transistor operated with vGS gt Vt.
20Increasing vDS causes the channel to acquire a
tapered shape. Eventually, as vDS reaches vGS
Vt the channel is pinched off at the drain end.
Increasing vDS above vGS Vt has little effect
(theoretically, no effect) on the channels shape.
21Derivation of the iDvDS characteristic of the
NMOS transistor.
22Drain Current iD
- Directly Proportional to
- Mobility of Electrons in the channel µn (µm2/V)
- Gate Capacitance per unit gate area Cox (µF/ µm)
- Width of the substrate (µm)
- Gate-Source Voltage vGS (Volts)
- Drain-Source Voltage v DS (Volts)
- Indirectly Proportional to
- Length of the channel (µm)
23iD vDS relationship
Troide Mode
Saturation Mode
24The p Channel MOSFET
- Fabricated on an n-type substrate with p regions
for Drain Source - Holes are the current carriers.
- vGS vDS are negative
- Threshold voltage Vt is negative.
- Both NMOS PMOS are utilized in Complementary
MOS or CMOS circuits
25Complementary MOS or CMOS
Cross-section of a CMOS integrated circuit. Note
that the PMOS transistor is formed in a separate
n-type region, known as an n well. Another
arrangement is also possible in which an n-type
body is used and the n device is formed in a p
well. Not shown are the connections made to the
p-type body and to the n well the latter
functions as the body terminal for the p-channel
device.
26iD vDS Charateristics
- Modes of operation
- Cutoff
- Triode (Saturation in BJT)
- Saturation ( Active in BJT)
27The iDvDS characteristics for a device with kn
(W/L) 1.0 mA/V2.
28The iDvGS characteristic for an enhancement-type
NMOS transistor in saturation (Vt 1 V, kn W/L
1.0 mA/V2).
29Large-signal equivalent-circuit model of an
n-channel MOSFET operating in the saturation
region.
30Finite Output Resistance in Saturation
Increasing vDS beyond vDSsat causes the channel
pinch-off point to move slightly away from the
drain, thus reducing the effective channel length
(by DL).
31Finite Output Resistance in Saturation
Effect of vDS on iD in the saturation region. The
MOSFET parameter VA depends on the process
technology and, for a given process, is
proportional to the channel length L.
32Finite Output Resistance in Saturation
Large-signal equivalent circuit model of the
n-channel MOSFET in saturation, incorporating the
output resistance ro. The output resistance
models the linear dependence of iD on vDS
33Circuit symbol for the p-channel enhancement-type
MOSFET.
34Characteristics of PMOSFETTriode Mode of
Operation
35Characteristics of PMOSFETSatuaration Mode of
Operation
36The Roll of Substrate Body Effect
- Substrate for many Transistors
- Body is connected to the most negative power
supply to maintain cutoff conditions for all the
substrates to channel junctions - Another gate
37Temperature Effects
- Vt and Kn are effected by the temperature
- Vt increases by 2mV per 10C rise in temperature
- Kn decreases with rise in temperature thus drain
current increases. The effect is dominant. Thus
ID decreases with increase in temperature - MOSFET in Power circuits
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42Graphical construction to determine the transfer
characteristic of the amplifier in (a).
43Circuit for Example 4.9.
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45Biasing the MOSFET using a large drain-to-gate
feedback resistance, RG.
46Biasing the MOSFET using a constant-current source
47Conceptual circuit utilized to study the
operation of the MOSFET as a small-signal
amplifier.
48Recap Transfer Function
49Transfer characteristic showing operation as an
amplifier biased at point Q.
50Conceptual circuit utilized to study the
operation of the MOSFET as a small-signal
amplifier.
The DC BIAS POINT
To Ensure Saturation-region Operation
51Signal Current in Drain Terminal
52Figure 4.35 Small-signal operation of the
enhancement MOSFET amplifier.
53Total instantaneous voltages vGS and vD
54Small-signal p models for the MOSFET
55Common Source amplifier circuit Example 4-10
56Small Signal T Model NMOSFET
57Small Signal Models
T Model
58Single Stage MOS Amplifier
59Amplifiers Configurations
60Common Source Amplifier (CS) Configuration
61Common Source Amplifier (CS)
- Most widely used
- Signal ground or an ac earth is at the source
through a bypass capacitor - Not to disturb dc bias current voltages
coupling capacitors are used to pass the signal
voltages to the input terminal of the amplifier
or to the Load Resistance - CS circuit is unilateral
- Rin does not depend on RL and vice versa
62Small Signal Hybrid p Model (CS)
63Small Signal Hybrid p Model (CS)
64Small-signal analysis performed directly on the
amplifier circuit with the MOSFET model
implicitly utilized.
65BJT / MOSFET
66Common Source Amplifier (CS) Summary
- Input Resistance is infinite (Ri8)
- Output Resistance RD
- Voltage Gain is substantial
67Common-source amplifier with a resistance RS in
the source lead
68The Common Source Amplifier with a Source
Resistance
- The T Model is preferred, whenever a resistance
is connected to the source terminal. - ro (output resistance due to Early Effect) is not
included, as it would make the amplifier non
unilateral effect of using ro in model would be
studied in Chapter 6
69Small-signal equivalent circuit with ro neglected.
70Small-signal Analysis.
71Voltage Gain CS with RS
72- Source Resistance can be used to control the
magnitude of the signal vgs thus ensure that
vgs does not become too large to cause non-linear
distortion - vgs ltlt 2(VGS-Vt) ltlt 2VOV
73Common Source Configuration with Rs
- Rs causes a negative feedback thus improving the
stability of drain current of the circuit but at
the cost of voltage gain - Rs reduces id by the factor
- (1gmRs) Amount of feedback
- Rs is called Source degeneration resistance as it
reduces the gain
74Small-signal equivalent circuit directly on
Circuit
75A common-gate amplifier based on the circuit
76Common Gate (CG) Amplifier
- The input signal is applied to the source
- Output is taken from the drain
- The gate is formed as a common input output
port. - T Model is more Convenient
- ro is neglected
77A small-signal equivalent circuit
78A small-signal Analusis CG
79A small-signal Analusis CG
80Small signal analysis directly on circuit
81The common-gate amplifier fed with a
current-signal input.
82Summary CG
- 4. CG has much higher output Resistance
- CG is unity current Gain amplifier or a Current
Buffer - CG has superior High Frequency Response.
83Common Gate
- Rin in independent of RL Rin 1/gm gm in
order of mA/V. - Input resistance of the CG Amplifier is
relatively low (in order of 1kv) than CS
Amplifier - Loss of signal
- CG is acts as Unity gain current amplifier
current buffer useful for a Cascade circuitry
84A common-drain or source-follower amplifier.
85Small-signal equivalent-circuit model
86Small-signal Analysis CD
87(a) A common-drain or source-follower amplifier
output resistance Rout of the source follower.
88(a) A common-drain or source-follower amplifier.
Small-signal analysis performed directly on the
circuit.
89Common Source Circuit (CS)
90Common Source Circuit (CS) With RS
91Common Gate Circuit (CG) Current Follower
92Common Drain Circuit (CD) Source Follower
93Summary Comparison
94Quiz No 4
27-03-07
BJT BJT MOSFET MOSFET
Types npn pnp nMOS pMOS
Symbols
p Model
T Model
gm
Re/rs
rp/rg
95Problem 5-44
96SOLUTION DC Analysis
97SOLUTION DC Analysis
IE
IB
gm 40mA/V
98Solution Small Signal Analysis
99Solution Small Signal Analysis
100Solution Small Signal Analysis Input Resistance
ib
vb
-
Rin
101Solution Small Signal Analysis Output Resistance
Itest
IE
IRC
IE/(1ß)
Rout
102Solution Small Signal Analysis Voltage Gain
veb
-
-
Vo
vi
-
103Solution Small Signal Analysis Voltage gain
veb
-
vi
-
104Solution Small Signal Analysis Voltage Gain
vi
-
105Solution Small Signal Analysis Voltage Gain
106Solution Small Signal Analysis Voltage Gain
-
Vo
vi
-
107Problem
108Small Signal Model MOSFET CD
109Solution Small Signal Analysis
110Solution Small Signal Analysis Input Resistance
Ig0
Rin
111Solution Small Signal Analysis Output Resistance
Itest
ID
IRD
0 V
Vtest
IG0
Rout
112Solution Small Signal Analysis Voltage Gain
vsg
-
-
vo
vi
-
113Solution Small Signal Analysis Voltage gain
vsg
-
vi
-
114Solution Small Signal Analysis Voltage Gain
vi
-
115Solution Small Signal Analysis Voltage Gain
116Solution Small Signal Analysis Voltage Gain
-
vi
-
117Solution Small Signal Analysis
118Transistor Pairings Amplifiers
- Common Emitter Common Base (CE-CB)
- Common Emitter Common Collector (CE-CC)
- Common Collector - Common Emitter (CC-CE)
- Common Collector - Common Base (CC-CB)
119Problem 6-127(e)
120DC Analysis 6-127(e)
121Small Signal Model
122Small Signal Model
123Small Signal Model
Rin
124Small Signal Model
vbe2
vbe1
-
-
Rout
125Small Signal Model
126Problem6-127(f)Replacing BJT with MOSFET
127Small Signal Model
128Small Signal Model
129Small Signal Model
Rin
Rout
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131Problem 6-127(f)
132Solution P6-127(f)
vbe2
-
veb1
-
133Solution P6-127(f)
134Problem 6-127(f) with MOSFET
135Solution P6-127(f)
vgs2
-
vsg1
-
136Solution P6-127(f)
ig10
vi
-
137Comparison BJT/MOSFET Cct
138Problem 6-123
VBE0.7 V ß 200 Kn(W/L)2mA/V2 Vt1V
Figure P6.123
139DC Analysis
Figure P6.123
140DC Analysis
VBE0.7 V ß 200 Kn(W/L)2mA/V2 Vt11V Vt225mV
1mA
2V
0.7V
IG0
I0.7/6.80.1mA
141Small Signal Model
142Small Signal Model
143Small Signal Model Voltage Gain
ig0
vi
vbe2
-
-
144Small Signal Model Input Resistance
ii
ig0
vi
-
Rin
145Small Signal Model Output Resistance
IRG
Itest
Vtest vo
Rout
146The Miller Theorem.
147The Miller equivalent circuit.
148Miller Theorem
149Miller theorem
- Miller theorem states that impedance Z can be
replaced by two impedances Z1 connected between
node 1 and ground and Z2 connected between node 2
and ground where
150Miller theorem
- Miller equivalent circuit is valid only as long
as the rest of the circuit remains unchanged - Miller equivalent circuit cannot be used directly
to determine the output resistance of an
amplifier. It is due to the fact for output
impedance test source is required and thus
circuit has a major change.
151Circuit for Example 6.7.
152Circuit for Example 6.7.
153Example
K-100 V/V, Z 1 M O
154OBSERVATIONS
- The Miller replacement for a negative feedback
results in a smaller resistance by a factor of
(1-K) at the input. - The multiplication of a feedback impedance by a
factor (1-k) is referred as Miller Multiplication
or Miller Effect
155Small Signal ModelCE with RE includng r0
156A CE amplifier with emitter degeneration Input
Resistance
7
2
3
1
4
6
5
157A CE amplifier with emitter degeneration Input
Resistance
158A CE amplifier with emitter degeneration to
determine Avo.
Open Circuit Voltage Gain
Figure 6.49
159A CE amplifier with emitter degeneration to
determine Output Resistance
6
7
5
4
3
1
2
160A CE amplifier with emitter degeneration to
determine Short-Circuit Trans-conductance Gm
161Active-loaded common-base amplifier
Figure 6.33
162Active-loaded common-base amplifier to determine
Input Resistance
7
4
5
3
6
2
1
Figure 6.33
163Active-loaded common-base amplifier With output
open-circuit
6
7
5
4
3
8
2
1
Figure 6.33
164A CB amplifier to determine Output Resistance
6
7
5
4
3
1
2
165Quiz No 8 DE 28 EE
166Quiz No 8 DE 28 EE