Alloy Thin Films by Multi-Target Sputtering - PowerPoint PPT Presentation

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Alloy Thin Films by Multi-Target Sputtering

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Alloy Thin Films by Multi-Target Sputtering Karla L. Perez MSE/REU Final Presentation Adv. Prof. King and Prof. Dayananda August 5, 2004 Overview Introduction ... – PowerPoint PPT presentation

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Title: Alloy Thin Films by Multi-Target Sputtering


1
Alloy Thin Films by Multi-Target Sputtering
  • Karla L. Perez
  • MSE/REU
  • Final Presentation
  • Adv. Prof. King and Prof. Dayananda
  • August 5, 2004

2
Overview
  • Introduction
  • Research Project
  • Processing
  • Measuring Film Thickness
  • Optical Microscope
  • AFM
  • Alloy Thin Film Deposition
  • Composition
  • Conclusion

3
Application of Thin Films
  • Antireflection coatings for camera lenses
  • Optical filters for communication
  • Decorative coatings on plastics
  • Silicon chips
  • Metallic coatings
  • To provide insulating layers between conductors

4
Research Project
  • The main goal is to create alloy thin films with
    uniform composition and thickness
  • Study the compositions of pure metal thin films
    and their thickness
  • Pure metal components to be used Ag, Cu, Ta, Mo,
    Ni, Fe, Ti
  • Design a system which will enable us to manage
    the composition and geometry of the alloy thin
    films

5
Processing
  • Sputtering
  • It is a type of Physical Vapor Deposition. It is
    carried out at high vacuum in a chamber connected
    to a high voltage DC supply.
  • Argon gas is pumped into the chamber and creates
    argon plasma. The Argon plasma is directed to the
    target and its atoms are vaporized. The vaporized
    material is then deposited on the substrate.

6
Measuring Film Thickness
  • Optical Microscope
  • Differential Interference Contrast (DIC)

Ag 20min 4cm
7
Measuring Film ThicknessOptical Microscope
Cu 10min 4cm
Ag 20min 4cm
8
Measuring Film ThicknessOptical Microscope
Ag 10 min 4cm
Ag 20min 4cm
9
Measuring Film Thickness
  • Atomic Force Microscope (AFM)
  • Tapping mode Measures the topography by tapping
    the surface with an oscillating tip. This
    eliminates the shear forces which can damage soft
    samples and reduce image resolution.

10
Measuring Film Thickness
11
Measuring Film ThicknessAFM
Ag 20min 2cm
12
(No Transcript)
13
Measuring Film ThicknessAFM
Mo 30min 2cm
14
(No Transcript)
15
Measuring Film ThicknessAFM
Cu 30min 2cm
16
(No Transcript)
17
Ag 30min 2cm
52.40
14.19
18
Alloy Thin Film Deposition
  • Deposit alloy thin films using a sputter coater
    with a Copper-Silver target

19
Composition of Ag-Cu Thin Film
92.7
50.3
7.3
Position on slide
20
Composition of Ag-Cu Thin Film
95.6
50.3
4.4
Position on slide
21
Conclusion
  • The thickness of the film varies according to
    their position relative to the target.
  • Films deposited are thicker in the middle.
  • Deposited one alloy thin film
  • The same composition gradients of silver and
    copper do not occur in the middle of the film.

22
Acknowledgements
  • Prof. King
  • Prof. Dayananda
  • Prof. Kvam
  • NSF Grant

23
Questions???
  • Thank you!!!
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