Title: How to make the specimen visible
1- How to make the specimen visible
- CONTRAST!
- Definition of Contrast
- Techniques
- Brightfield
- Phase
- Darkfield
- Pol
- DIC (Differential Interference Contrast)
- Fluorescence
- Optical Sectioning an expansion of Fluorescence
Agenda
2C ONTRAST
50 Units
0 Units
100 Units
50
50
50 Units
50 100 / 50 100 -0.33
50 0 / 50 0 1
50 50 / 50 50 0
3Common Illumination Techniques
- Brightfield
- Darkfield
- Phase Contrast
- Polarized Light
- DIC (Differential Interference Contrast)
- Fluorescence (and related techniques)
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5Brightfield
- For naturally absorbing or stained samples
- True Color Representation
- Proper Technique for Measurements
- Spectral
- Dimensional
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8Bacillaria
9Paramecium bursaria
Condenser diaphragm open
Condenser Diaphragm almost closed
10Paramecium bursaria
Different Staining Techniques
Indian Ink Staining
Feulgen Staining
Silver Staining
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12Phase Contrast (Frits Zernike 1934)
- - Halo effect gt Reduced resolution
- No staining necessary
- Good Depth of Field
- Easy alignment
- Orientation independent
- Repeatable setup
- Works with plastic dishes
13- Required Components for Phase Contrast
- Objective with built-in Phase Annulus
- Condenser or Slider with Centerable Phase Ring
for illumination (Ph0, 1, 2 or 3)
Required Adjustment Superimpose Phase Ring of
condenser over (dark) phase plate of objective
(after Koehler Illumination)
14- Illumination bypasses Specimen gt no phase shift
- Illumination passes through thin part of Specimen
gt small phase retardation
- Illumination passes through thick part of
Specimen gt larger phase retardation
Phase Shifts Cells have higher n than water.
Light moves slower in higher n, consequently
resulting in a phase retardation Phase shift
depends on n and on thickness of specimen detail
15- Non-diffracted and diffracted light are focused
via tube lens ?into intermediate image and
interfere with each other ¼¼ ½ wave
shift causes destructive interference i.e.
Specimen detail appears dark ?
- Affected rays from specimen, expressed by the
higher diffraction orders, do not pass through
phase ring of objective gt¼ wave
retarded ?
Tube Lens
- Objective Phase Ring
a) attenuates the non-diffracted 0th Order
b) shifts it ¼ wave forward ?
Objective
Specimen
- Illumination from Condenser Phase Ring ?(0
Order) gt meets phase ring ? of objective
Condenser
16Paramecium bursaria
Phase Contrast
17Rhipidodendron
Phase Contrast
18Cochliopodium
Phase Contrast
19Lyngbya Bacteria
Phase Contrast
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21Darkfield
- No staining necessary
- Detection of sub-resolution details possible
- Excellent, reversed contrast
- Central Darkfield via hollow cone
- Oblique Darkfield via Illumination from the side
- Not useful for Measurements (sizes exaggerated)
22Required conditions for DarkfieldIllumination
Aperture must be larger than objective aperture
I.e. direct light must bypass observer
Low NA Objective
High NA Objective
Iris Diaphragm
23Paramecium bursaria
Polarized Light
Darkfield
24 Polarized Light
- Specimen is placed between 2 crossed polarizers.
- Only light produced by birefringent particles
(e.g. crystals) or coming from the edges of
particles (edge birefringence) is visible. - Looks sometimes like Darkfield
- Orientation-specific (linear Pol)
- Linear / circular Polarized Light
25Birefringent Material
Color of sample and background modified by wave
plate
Background
Brightfield
Polarized Light
Pol Red I
26Polarized Light
When Polarizers are crossed, only items that
rotate the plane of polarization reach the
detector. Wave plate adds color
Polarizer 2 (Analyzer)
Specimen
Polarizer 1
27Required / Recommended Components
- Polarizer (fixed or rotatable)
- Analyzer (fixed or rotatable)
- Strain-free Condenser and Objective
- Rotating, centerable Stage
- Wave plate and/or Compensator
- Crossline Eyepiece
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29DIC (Differential Interference Contrast after
Nomarski)
- High Contrast and high resolution
- Control of condenser aperture for optimum
contrast - Changes GRADIENTS into brightness differences
- 3-D Image appearance
- Color DIC by adding a wave plate
- Best contrast / resolution via different DIC
sliders - Orientation-specific gt orient fine details
perpendicular to DIC prism
30DIC
Observing local differences in phase retardation
31- 9 Image
- 8 Tube lens
- 7 Analyzer (7a with Wave Plate)
- 6 Wollaston Prism behind objective
- 5 Objective
- 4 Specimen
- 3 Condenser with receptacle for prisms
32Wollaston Prism
Birefringence (Different refractive index for
different polarization orientations) Polarized
beam, under 45 to prism, gets split into
ordinary and extraordinary beam
33Required Components for DIC
- Nosepiece with DIC receptacles
- Polarizer (or Sénarmont Polarizer)
- Low Strain Condenser and Objective
- DIC Prisms for Condenser ( I or II or III)
- Appropriate DIC Slider for each objective
- Analyzer (or Sénarmont Analyzer)
- Not needed for New Plas-DIC (up to 40x)
34Paramecium bursaria
DIC
Interference
35Fluorescence
- Easy to set up gt Objective Condenser
- Highly specific technique, wide selection of
markers - Detection and Identification of Proteins,
Bacteria, Viruses - Basics for
- Special Techniques eg. TIRF, FRET, FRAP etc.
- 3-D imaging
- Deconvolution
- Structured Illumination
- Confocal Techniques
36Epi - Fluorescence
Observation port
Excitation Filter
Emission Filter
FL Light Source
Dichromatic Mirror
Example Specimen containing green fluorescing
Fluorochrome
37Epi - Fluorescence Filter Sets
Example
Curve for a typical GFP filter set
38Epi - Fluorescence
(Specimen containing green fluorescing
Fluorochrome)
Observation port
Excitation Filter
Emission Filter
FL Light Source
Dichromatic Mirror
Specimen containing green fluorescing Fluorochrome
39Paramecium bursaria
Fluorescence
40How to improve Fluorescence Imaging in a major
way
41Optical sectioning increased contrast and
sharpness
42Overview of Optical
sectioning Methods
- Confocal and Multi-photon
Laser Scanning Microscopy - Pinhole prevents out-of-focus light getting to
the sensor(s) (PMT - Photomultiplier) (30 70
µm) - Multi Photon does not require pinhole (90 500
µm) - Spinning disk systems
- A large number of pinholes (used for excitation
and emission) is used to prevent out-of-focus
light getting to the camera - E.g. Perkin Elmer, Solamere ( up to 30 µm)
- Structured Illumination
- Moving grid represents the reference for in-focus
information - Zeiss Apotome (10-50 µm)
43Overview of Optical
sectioning Methods- contd -
- Total Internal Reflection Fluorescence (TIRF)
- High NA Objective projects beam at angle which
exceeds critical angle. - Area touching cover slip (evanescent field) is
typically smaller than 200 nm - Deconvolution
- Point-Spread function (PSF) information is used
to calculate light back to its origin - Post processing of an image stack
44Limited Depth of Field With Standard Microcopy
- Amber fossil (Chironomide)
- Thickness app. 300 µm
- Conventional incident light
45Optical Sectioning Extended Focus Software
- Amber fossil (Chironomide)
- Thickness app. 300 µm
- Conventional incident light
- 3D reconstruction
46- Break Period move to lab
- Setting up / adjusting the microscopes for
Brightfield