LRU Test Methodologies

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LRU Test Methodologies

• May 16, 2006

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• Working Together to Meet the Most Critical System
  Requirements
• Performance for the latest designs
• Flexibility for legacy replacement
• Functional and operational test at all levels of
  assembly
• UUT-Oriented instrumentation software

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The LRU Test Problem
Parallel Digital
Parallel Digital
Serial Bus Digital
Analog
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LRU Test Requirements

• Parallel Digital Test
• Bus-Oriented LRU Ports
• Random I/O Ports
• Serial Digital Test
• Standard Serial Busses
• Custom or Variations of Standard Busses
• Analog Test
• Traditional Sequential Testing
• Parallel Operation
• Concurrent Monitoring

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The Core System Instrumentation Roadmap
M9-Series Digital
Ai-710 Analog
Bi-410 Bus
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The Core System Instrumentation Roadmap
M9-Series Digital
Ai-710 Analog
Bi-410 Bus
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Di-Series Adding Flexibility, Performance, and
Usability in an M9-Compatible Solution
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Flexible Di-Series Pin Electronics Address Legacy
and Performance Requirements
30V Swings for Legacy UUTs
300 mV Swings for LVDS
1ns transitions for LVDS in carefully-controlled
transmission environment
Slow transitions for poorly-controlled
transmission environment of legacy test adapters
Levels, Edge Speed, and Timing Programmed on a
Per-Channel Basis
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Di-Series Handshake Engine Simplifies
Asynchronous Transfers
Asynchronous Write Cycle from Instrument to UUT
Signals from instrument to UUT
Handshake Signal from UUT
Asynchronous delay
Instrument indicates data is available
UUT indicates it is ready to receive data
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The Di-Series Has No Central Resources and is
Configurable in Software
VXI Card Cage

• No Central Resource Board
• Software configurable as one or many Virtual
  Instruments
• Each Virtual Instrument operates independently

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The Di-Series Has No Central Resources and is
Configurable in Software
Virtual Instrument 1
Virtual Instrument 2
Virtual Instrument 3
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LRU-Centric Flexibility Asynchronous Test and
Bus Emulation
33 MHz
10 MHz
Virtual Instrument 2
Virtual Instrument 1
25 MHz

• Concurrent, independent, asynchronous emulation
  test
• Each instrument emulates an LRU bus or
  surrounding signals
• LRU capabilities greatly enhance SRU-test

Virtual Instrument 3
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CSi iStudio Development and Debugging Software

• iStudio is a way to
• Interactively learn to use the instrument
• Create pattern sets
• Import test vectors from external sources
• Debug all tests independent of development
  methodology
• Create tests to run from your current environment

// Pattern 4 patternBlock.IL(IOM,
ADLTCHIN) patternBlock.IG(AddressBus,
0x20ff) patternBlock.IH(RDL, WRL) patternBlock.O
H(RESETOUT) patternModifier.TraceOn() patternBlo
ck.EndPattern(TestInstruction.PassFail)
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The Core System Instrumentation Roadmap
M9-Series Digital
Ai-710 Analog
Bi-410 Bus
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CSi Product RoadmapAi-760 - High-density Analog
Instrument

• Targets replacement of conventional
  instrumentation
• Maintains Ai-710 parallel test capability for
  true operational test
• Dramatically reduces VXI slot requirements

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Ai-760 Block DiagramSingle-Ended Multi-Function
Analog Channels
8 Channels single-ended source single-ended
measure
Triggering System
Arb/ FGEN
Arb
Source
Channel I/O
Measure
Timer Counter
? 8
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Ai-760 Block DiagramDifferential Multi-Function
Analog Channels
4 Channels differential source differential
measure
Triggering System
Arb/ FGEN
Arb
Source
Channel I/O
Measure
Timer Counter
? 4
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iStudio for Ai-760

• Interactive Execution and Control
• DMM
• Scope
• Function Generator
• Standard
• Arbitrary
• Counter
• Digitizer
• Code Generation
• Triggering and Synchronization
• Built-in analysis

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Mixed Signal LRU Test With Multiple Concurrent
Digital and Analog Instrumentation
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Low-Level Synchronization Interface Using
Standard Instrument Drivers
TPS Code

• Synchronization hardware is very capable, but
  complex
• User must understand all hardware details
• Each driver is an island without knowledge of
  other instruments

Instrument Driver
Instrument Driver
Instrument Driver
Instrument Driver
Sync Hardware
Unit Under Test
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iStudio Sync Editor Provides Graphical Setup and
Debug of the Tru-Sync Driver
Graphical Synchronization Editor
Tru-Sync Driver
Instrument Driver
Instrument Driver
Instrument Driver
Instrument Driver
Unit Under Test
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Conclusion

• LRU (box) test requires a greater level of
  asynchronous and concurrent activity than SRU
  (board) test
• The Teradyne CSi Family of hardware and software
  directly addresses LRU test requirements today
• The CSi Roadmap paves the way for the LRU testing
  of the future