Title: The Instrument: US Subsystems and Requirements
1The Instrument US Subsystems and Requirements
- Dr. Clarence M. Korendyke
- US Project Scientist
- Naval Research Laboratory
- 202-767-3144
- e-mail koren_at_cyclops.nrl.navy.mil
Dr. Charles M. Brown EIS US Instrument
Scientist Naval Research Laboratory 202-767-3578 e
-mail cbrown_at_ssd5.nrl.navy.mil
2EIS Optical-Mechanical Layout
Plan View
Elevation
3MIR/SLA/GRA Electrical Interfaces
4Lifecycle Requirements
5Articulated Telescope Mirror (MIR) Requirements
- Mount the Optic With Minimal Distortion Over the
Applicable Temperature Range - Tilt the Optic to Move the Solar Image (4)
Perpendicular to the Slit - Sense the Relative Position of the Optic Tilt
With lt1 Arcsec Accuracy - Translate the Optic 8 mm Perpendicular to the
Optical Axis - Sense the Position of the Optic to lt20 Microns
6MIR Hardware Description/Summary
Linear Ball Slide
Flexpivot
Translation Motor and Drive Assy
Mirror
PZT
7Focussing Grating (GRA) Requirements
- The GRA Shall Mount the Grating With Minimal
Distortion Over the Operational Temperature Range - The GRA Shall Provide a Focussing Capability of
1 cm to Permit Adjustment of the Spectrometer
Focus - The EIS Grating Will Be Bonded Into a Cell
Mounted Onto a Crossed Roller Slide Translation
Stage - Translation Stage Will Be Driven With a Geared
Stepper Motor and Ball Screw Combination. The
Mechanism Will Be Operated in Open Loop Mode. The
Position Will Be Sensed With Optical Encoders
8GRA Hardware Description/Summary
Grating
Motor and Ball Screw Assy
Crossed Roller Bearing Slide
9Slit Assembly (SLA) Requirements
- The SLA Shall Support the Shutter Assembly
- The SLA Shall Be Able to Position the
Spectrometer Slits and Slots to Be Reproducible
in the Telescope Focal Plane - The Spectrometer Slits Shall Be Reproducibly
Positioned to lt2 Microns Perpendicular to the
Optical Axis and lt26 Microns Along the Optical
Axis. A Performance Goal for the Mechanism Will
Be lt1 and lt13 Microns, Respectively - Positioning Will Be Accomplished Using a Geared
Stepper Motor With the Direction of Motion Along
the Optical Axis
10Slit Assembly (SLA) Requirements (Continued)
- The Load Position Will Be Sensed Utilizing a
Shaft Resolver - The Present Optical Design Does Not Permit the
Resolver to Be Directly Attached to the End of
the Shaft, and the Resolver Is Instead Coupled to
the Output Shaft With Anti-backlash Gearing This
Approach Should Suffice to Meet Specified Goals.
The Backlash Inherent in the System Is Expected
to Be 3 Arcminutes With a 15 Arcminute Step
Size. This Corresponds to an Uncertainty of 10
Microns in the Position of the Slit Along the
Optical Axis With a 50 Micron Step Size - The Resolver Will Have an Absolute Accuracy of
lt15 Arcminutes Sufficient to Discriminate Between
Individual Steps
11SLA Hardware Description/Summary
Shutter Motor and Encoder
Shutter
Slit Paddle Wheel
Slit Motor and Encoder
12Shutter Mechanism Requirements
- The SLA Shall Include the EIS Instrument Shutter
- The Shutter Shall Be Able to Take a 50 ms
Exposure - lt5 Photometric Error Over the Slit for These
Short Exposures
13Shutter Assembly Hardware Description/Summary
14Requirements for the Filter Clamshell
- Vacuum Tight Enclosure
- P lt1 Torr for Launch TBD 140 dB Acoustic Loads
Expected - Hold Time gt1 Week TBD
- Reliable Calibrated Internal Pressure Sensor
- Clean
- Minimal Central Obstruction
- Pumpout/Backfill Valve With Filter and Throttle
- No Pressure Differential Allowed Front/Back (Air
Passages) - Sunshade for Filter Frame
- No Shock on Opening
- Vacuum Harness for Pre-Launch Ops
15Front Filter Assembly (FFA) Requirements
- A FFA Shall Be Provided to Block Heat and Visible
Light From the EIS Instrument - The FFA Shall Also Serve As a Bandpass Filter for
the EUV Range of Interest - The Filter Will Consist of a 1500 Å Thick
Aluminum Film Mounted on a Nickel Mesh. The
Aluminum May Be Coated With a Few Å of Carbon to
Reduce Oxidation and to Improve Rejection of
Light in Unwanted Solar Lines - The FFA Will Provide a 1 Transmittance
Uniformity - The FFA Shall Be Compatible With Ultra High
Vacuum (UHV), and It Shall Provide the Necessary
Mechanical Strength, and the Capability to
Withstand Torr-Level Pressure Differentials
16Front Filter Assembly (FFA) Requirements
(Continued)
- The Front Filter Will Be a 200 mm Clear Aperture
Diameter and It Will Be Segmented Into Four
Quadrants, Each Separately Replaceable - A Lightweight Aluminum Frame Shall Support the
Mesh - A Clamping Frame Shall Secure the Filters to the
Clamshell Assembly. The Frames Will Be Designed
to Minimize the Central Obstruction
17Requirements for the Al Filters
- For the Entrance Filter
- lt1500 Å Al on Ni Mesh (gt80 Open)
- ? lt0.1
- T gt30 _at_ 304 Å
- T lt5 X 10-5 for Visible IR
- 20 cm Clear Aperture, in Quadrants
- For the Spectrometer Entrance Filter
- lt1500 Å Al on Ni Mesh (gt80 Open)
- T gt30 _at_ 304 Å
- T lt 5 X 10-7 for Visible IR
- 0.5 cm X 1.5 cm Rectangular
18FFA Hardware Description/Summary
Quadrant of Trace Entrance Filter
19Spectrometer Entrance Filter (SEF) Requirements
- A Small Diameter Aluminum Filter Shall Be
Provided to Mount Behind the EIS Spectrometer
Slit - The SEF Shall Provide Additional Reduction of the
Visible Light Within the Spectrometer, Especially
in the Event That the FFA Degrades Due to Orbital
Debris and Micrometeorites - The SEF Shall Have a Clear Aperture of 20 mm. It
Shall Be Placed Near the Slit, but Far Enough
Away (gt8 mm) That the Mesh Will Be Totally Out of
Focus at the Detector - Table 3-6 of the EIS Subsystems and Components
Contract End Item Specification, EIS_Comp_Spec,
Lists the Required Filter Properties
20SEF Hardware Description/Summary
Luxel TF Aerospace Al filter
21EIS Instrument Classification Mission
Classification
Recommended Guidelines for EIS Instrument
Components
22Mission Analysis Approach
Independent Agent
Tailored to Meet Guidelines of EIS Instrument
Component Contract End Item (CEI) Specification
Recommended Approach for EIS Instrument Components
23Safety, Reliability, and Quality Assurance
(SRQA) Requirements
- SRQA and Verification Compliance Matrix (VCM)
Requirements Defined in EIS Instrument Component
CEI Specification (EIS_comp_spec) - Configuration Management Plan uses MSFC MPG
8040.1Guidelines for Flight Models (DRD
874CM-001) - Contamination Control Implementation Plan in
Consonance with UKs EIS Instrument Requirements
(DRD 872MP-001) - Product Assurance Program for Flight Models Meets
ISO 9000 Guidelines (DRD 872QE-001) - Includes Preliminary/Final Hazard Analysis Inputs
to UKs EIS Instrument Safety Plan - Includes Reliability Assurance and
Parts/Materials/Processes Approach - Verification Plan Defines Verification Approach,
Structure, and Description (DRD 872VR-001)
24Other Factors
- Parts, Materials, and Processes (PMP) Selected to
Assure Maximum Reliability and Performance in
Space Environments - Vacuum Stability via Total Mass Loss (TML) of
gt1.0 and Volatile Condensable Material (VCM) of
gt0.1 Per NRP-1124 - Traceability Achieved by Categorizing EEE Parts
Into Sets Groups and Tracing Parts Through
Fabrication, Assembly, Test, and Delivery - Electrostatic Discharge (ESD) Control According
to Processes Implementing MIL-STD-1686 Guidelines - Closed-Loop Failure Reporting and Corrective
Action System (FRACAS) for Failures Occurring
During the Flight Model Acceptance Testing Phases - Deliverable Shipping Container Compatible With
the Anticipated Transportation Environmentals - Documentation Uses Established Practices for
Spaceflight Equipment - Deliverable As-built Engineering Drawings for
Flight Models - Schematics, Assembly Drawings, Parts Lists, Test
Procedures/Reports, and Calibration Data
25Project Planning and Control (1 of 3)
- During Phase B, the Following Management Tools
(Delivery Dates) Will Be Developed to Allow
Adequate Definition of the Hardware, Services,
Materials, Subcontracts and Other Services of the
Project - Configuration Management Plan (31 December 1999)
- EIS Component Specification Contract End Item
(Updates A/R Under Configuration Management) - Preliminary Design Review Package (15 February
2000) - Interface Control Documents (15 February 2000)
- Project Management Plan (31 December 1999)
- Monthly Progress Reports (Monthly)
26Project Planning and Control (2 of 3)
- Phase B Management Tools Continued
- Financial Management Reports (Monthly)
- Work Breakdown Structure and Dictionary (30
November 1999) - Risk Management Plan (31 December 1999)
- Contamination Control and Implementation Plan (15
February 2000) - Product Assurance Plan (31 December 1999)
- System Error Budget (15 February 2000)
- Verification Plan (31 December 1999)
27Project Planning and Control (3 of 3)
- During Phase C/D, the Following Management Tools
(Delivery Dates) Will Be Developed to Allow
Adequate Definition of the Hardware, Services,
Materials, Subcontracts and Other Services of the
Project - All Management Tools Developed Under Phase B
Shall Be Updated As Necessary - Critical Design Review Package (15 February 2001)
- Pre-Environmental Review Package (15 February
2002) - Flight Readiness Review Package (15 September
2002) - Verification Test Report (15 September 2002)
28Product Assurance
- EIS Instrument Component Product Assurance
Guidelines Shall Be Defined in the Product
Assurance Plan Submitted During Phase B - The Product Assurance Plan Shall Address
- Safety Implementation of Industrial and System
Safety Throughout the Project Lifecycle - Quality Implementation of All Elements of the
Quality Assurance Program Throughout the
Lifecycle of the Project - Reliability Definition of the Procedures and
Controls for Implementing the Programmatic
Reliability and Maintainability Requirements
29EIS Instrument Component Work Breakdown Structure
(WBS)
30EIS Instrument Component Schedule Summary