Research activity at CMAM

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Research in materials science using ion beams at
CMAM, Madrid
Aurelio Climent-Font Center for Micro-Analysis of
Materials Universidad Automoma Madrid Spain
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Centro de Micro-Análisis de Materiales is a
research laboratory located in UAM campus,
equipped with an electrostatic accelerator for
ions. It is running since September 2002
Analysis of materials using IBA technics applied
in differents fields of knowledge
Applications based on the modification of the
properties of materials by ion irradiation and
implantation
Basic studies on ion matter interaction
Provides service to external users managed by the
Parque Científico de Madrid
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5 MV parallel fed Cockcroft-Walton tandem
accelerator
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Terminal voltage ripple for TV values from 0.1
to 5 MV
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External u-beam
Nucl. Phys
Environment
Implantation
Surf. Phys
TOF-ERD
Standard
Internal microbeam
Mag. Spectrograph
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Standard beam line Chamber
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Internal Microbeam
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Magnetic spectrograph
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Time of flight end station
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External microbeam
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Other laboratories and auxiliary workshops

• Small clean room
• Multipurpose laboratory (polishing unit, furnace,
  metallographic microscope, spectrometric
  ellipsometry, profilometer, AFM, )
• Optical laboratory
• Mossbauer set up (57Fe)
• Sputtering set up for thin films growth
• Small electronics workshop
• Small mechanical workshop
• Mounting and testing workshop

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Scientific activity in progress

• Induced magnetic properties on graphite by ion
  irradiation.
• Growth and characterization of magnetic Fe
  nitrides and Cu nitrides thin films.
• Study of advanced semiconductor heterostructures
  based on gallium nitride.
• Formation of ordered nanostructures by ion
  implantation through masks.
• Theoretical modeling of ion beam amorphization of
  insulators (LiNbO3).
• Production and characterization of optical
  waveguides in LiNbO3 by ion irradiation.
• Characterization of luster ceramics, archaeometry
  in general
• Development of new experimental extension lines
  and procedures.
• Magnetic spectrograph nanobeam
• TOF-ERDA
• TRIC (Trajectories of ions in crystals) computer
  simulation program of LEIS, MEIS and HEIS spectra
• General use of ion beams for IBA techniques and
  modification of materials
• Low energy nuclear physics (CSIC nuclear physics
  line)

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Ion beam modification

• Insulating crystals
• LiNbO3
• Basic study of electronic and nuclear damage
• Modification of the refractive index (wave
  guides)
• Semiconductor crystals
• Si
• Modification of electrical properties
• Graphite (HOPG)
• Induction of magnetic properties

Formation of nanostructures

• Si, TiNO

Ion beams used

• H, Li, C, N, O, Si, F, Cu, I, Hf, Au, etc.

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Ion beam Analysis

• RBS (He, Li, Si)
• non-RBS (He, H)
• external (H)
• ERDA (He, Si, Cl, I, Au)
• PIXE (H, He)
• external (H)
• PIGE (H)
• NRA (15N)
• external
• Channeling (He)

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Personnel at CMAM

• Scientific
• AGULLÓ LÓPEZ, Fernando
• CLIMENT-FONT, Aurelio
• ESCOBAR GALINDO, Ramón
• MARTÍN MARERO, David
• MUÑOZ MARTÍN, Ángel
• OLIVARES VILLEGAS, José
• PRIETO DE CASTRO, José Emilio
• RAMOS, Miguel Angel
• SMITH, Richard
• YNSA ALCALÁ, Mª Dolores
• CRESPILLO, Miguel
• Administration
• GRANADOS, Ana
• RENES OLALLA, Beatriz

• Technical staff
• ÁLVAREZ ECHENIQUE, Jorge
• JOCO, Victor
• MAIRA VIDAL, Aránzazu
• NAKBI, Abdennacer
• NARROS FERNÁNDEZ ,Jaime
• RODRÍGUEZ NIEVA, Antonio
• VILASECA, Carolina
• PhD Studentes
• GORDILLO GARCÍA, Nuria
• GUTIÉRREZ NEIRA, Carolina
• MANZANO, Javier
• REDONDO CUBERO, Andrés

Thank you for your attention
www.uam.es/cmam