MSV300 Series

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MSV-300 Series
JASCOs Semiconductor/FPD Solutions

• UV/Vis/NIR

Microspectrophotometer
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Sample Capabilities

• Optical elements
• Transmission characteristics of micro-filters
• Reflective characteristics of micro-dichroic
  mirrors
• Semiconductors
• Band-gap measurement of microscopic areas
• Film thickness measurements
• Functional materials
• Optical properties of crystals
• Automobile Industry
• Transmission properties of protective films
  
• Academic
• Optical constants of crystals (organic or
  inorganic compounds)
• Optical properties of transistors

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Spectrophotometer Specification
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Microscope Specification