Ai760 MultiFunction Analog Test Instrument

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Ai-760 Multi-Function Analog Test Instrument

• November 12, 2009
• Carl Heide
• Product Manager Teradyne, Inc.

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Teradyne provides Core Components for ATE
Digital Test Instruments
Analog Test Instruments
M9-Series Digital
Ai-760 Analog
Di-Series Digital
Ai-710 Analog
Bi-410 Bus
Bus Test Instruments
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Background
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Value of Test

• Often seen as Non-Value Added portion of the
  program
• Consequence Extreme pressure for cost reduction
• Military/Commercial Aerospace value test because
  the cost of failure is much higher.
• Consequence Logistics managers push for reduced
  footprint Automatic Test Systems (ATS) with added
  capability and long lifecycles
• A compact flexible system that meets current and
  future needs is the forefront of test in Mil/Aero.

Ai-760
IFTE-V3
IFTE-V6
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Current TPS Implementation

• TPS developers develop TPSs in a top-down,
  sequential manner because
• Current Test Requirement Documents (TRDs) are
  written in a sequential manner.
• Apply Source
• Expect Voltage
• Repeat for channels 2-n
• Limited number of test assets available to use in
  the ATS.
• Multiple assets for parallel test have not been
  historically cost-effective.
• Single instruments with a lot of switching
  offered lower initial costs
• Easier to focus on a single action at a time vs.
  combining multiple actions in parallel.
• A single for loop vs. multiple channel setup
  with combined triggering.

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Implications of Current TPS Development

• Runtimes are long
• UUT is not being tested in an operational
  environment.
• Sequential testing leads to higher RTOK(NEOF)
  rate vs. testing the UUT in a more operational
  mode.
• ATS configuration is derived from a list of
  single instruments leading to a larger footprint
  and more switching

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Ai-760
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Ai-760 Comprises All Major Analog Instrumentation

• Digital Multimeter (DMM)
• Digital Storage Oscilloscope (DSO)
• Arbitrary Waveform Generator (AWG, ARB)
• Timer/Counter (UTC, T/C)
• Digitizer (ADC, DIG)

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The Ai-760 Integrates Multiple Functions into a
Single Instrument
(BIB)
DSO

• DMM module
• 6-1/2 digit DMM
• DSO module
• 1 GHz Sampling rate
• 600MHz Bandwidth
• 4-to-2 multiplexer on front end
• 8 Multi-Function Analog Channels each with
• 200 MSa/s AWG
• 200 MHz UTC
• 50 MSa/s ADC

DMM
MFA CLK
MFA
MFA Channels
DMM
DSO
MFA Triggers Utility
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The Ai-760 Is a High-Functionality, High-Density
Subsystem Providing

• Physical Consolidation of traditional instruments
  into a single system with increased functionality
  and decreased footprint
• Unified Control of the sub-system functions that
  decreases programming cost and increases
  repeatability and quality of test
• Configuration Flexibility from Multi-function
  Analog (MFA) Channels that simplifies system and
  ITA design, decreases development time, and
  enables concurrent control and monitoring of the
  UUT environment
• Parallel Test capability that facilitates
  operational test for higher throughput and
  quality of test

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High-density Operational Test and Analog
Instrument Consolidation

• Consolidation of conventional instrumentation
• Parallel and operational test from simultaneous
  use of multiple channels
• Smaller footprint from reduced slot space
  requirements

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Physical Consolidation of Traditional Instruments
Into a Single Subsystem
DMM DSO 8 channels of AWGs, ADCs and T/Cs in
1 VXI slot
Reduced tester footprint with increased
capabilities
Sparing logistics savings from reducing the
number of unique parts spared
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Example Costs Savings
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Example 1 System Replication

• 1 System, 10 years into 20 year lifecycle

• Replace obsolete instrument
• Extend system lifetime
• Increase capabilities
• Reduce lifecycle costs

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Example 1 Benefits of Ai-760

• Consolidate 5 VXI slots
• DMM 5 ½ digit1 slot
• DSO 4 channelslt 100 MSa/s, 500 MHz bandwidth
  2 slots
• AWG 1 channel lt 100 MSa/s 1 slot
• UTC - 2 channels 200 MHz 1 slot
• Into 1 VXI slot with increased capabilities
• DMM - ¼ slot
• 6½ digits
• 8 channels each with AWG/UTC/ADC - ½ slot
• More AWGs, 200 MSa/s each
• More UTCs
• ADCs, 50 MSa/s
• DSO- ¼ slot
• 42 to connect probe and ITA
• 1 GSa/s, 600 MHz bandwidth
• Tight integration of triggering for synchronous
  and asynchronous operational test

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Example 1 Lifecycle Cost Comparison

Does not include factor for logistics savings
from sparing only one instrument instead of four.
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Example 2 Footprint Reduction with Increased
Capability

• 100 Systems, 20 year lifecycle

• Increase future expansion and upgradeability
• Increase capabilities
• Reduce lifecycle costs

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Example 2 Benefits of Ai-760

• Consolidate 4 VXI slots
• DMM 6½ digit 1 slot
• DSO 2 channels1 GSa/s, 250 MHz bandwidth1
  slot
• AWG 2 channels 100 MSa/s, 200MSa/s 1 slot
• UTC - 2 channels 200 MHz 1 slot
• Into 1 VXI slot with increased capabilities
• DMM 6 ½ digit ¼ slot
• DSO - ¼ slot
• 42 to connect probe and ITA
• 1 GSa/s, 600 MHz bandwidth
• 8 channels each with AWG/UTC/ADC - ½ slot
• More AWGs, 200 MSa/s each
• More UTCs
• ADCs, 50 MSa/s
• Tight integration of triggering for synchronous
  and asynchronous operational test

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Example 2 Lifecycle Cost Comparison

Does not include factor for logistics savings
from sparing only one instrument instead of four.
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Flexible Pin Architecture Provides More
Capability in Smaller Space
TPS 1
TPS 2
Ai-760 Analog Subsystem
Ai-760 Analog Subsystem
Traditional Instruments
Traditional Instruments
CH1 CH2 CH3 CH4 CH5 CH6 CH7 CH8
CH1 CH2 CH3 CH4 CH5 CH6 CH7 CH8

• Higher utilization of instruments
• Maintain smallest footprint for ATS
• Spare fewer unique parts
• Reduce custom circuitry in fixture (ITA)

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Ai-760 Block DiagramSingle-Ended Multi-Function
Analog Channels
8 Channels single-ended source single-ended
measure
Triggering System
Arb/ FGEN
Arb
Source
Channel I/O
Measure
Timer Counter
? 8
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Ai-760 Block DiagramDifferential Multi-Function
Analog Channels
4 Channels differential source differential
measure
Triggering System
Arb/ FGEN
Arb
Source
Channel I/O
Measure
Timer Counter
Measure
? 4
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The Ai-760 Series
DSO
MFA
Ai-760-20
DMM
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Funnel and Pinout Using VPC Interconnect
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Software
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Software Enables Interchangeability and
Upgradeability

• Ai-760 IVI Compliant Drivers provide protection
  from future obsolescence.

• DSO IVI Class Compliant Specific Driver
• Supports IviScope class
• Instrument specific extensions for Ai-760 added
  functionality
• DMM IVI Class Compliant Specific Driver
• Supports IviDmm class
• Instrument specific extensions for Ai-760 added
  functionality
• MFA IVI Custom Specific Driver
• Supports IviFGen class
• Instrument specific extensions for Ai-760 added
  functionality
• Will support IviCounter class when it is defined

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IVI Compliant Drivers for All Ai-760 Instrument
Functions
IVI Drivers
Interchangeable IviScope, IviDmm, IviFgen, etc.
Instrument Specific terAiScope, terAiDmm,
terAiFgen, etc.
C
C
COM
COM
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iStudio Software for Ai-760

• Interactive Execution and Control
• DMM
• Scope
• Function Generator
• Standard
• Arbitrary
• Counter
• Digitizer
• Code Generation
• Triggering and Synchronization
• Built-in analysis
• iStudio projects can consolidate Ai-760 tests
  from a TPS

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Benefits of Ai-760

• Add additional AWGs, UTCs, and DACs to
• Lower Test Costs (Reduced TPS runtimes)
• Lower Defect Escape Rate (Better fault coverage)
• Reduce RTOKs (Fewer false failures)
• Add more capability in a smaller package to
• Reduce tester footprint
• Lower lifecycle costs
• Eliminate obsolete instrumentation with state of
  the art multi-function analog core test system.
• Add configuration flexibility to support newer
  generation weapon platforms/avionics.

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Ai-760 Multi-Function Analog Test Instrument

• Carl Heide
• carl.heide_at_teradyne.com