Immunity Prediction of Integrated Circuits using ICEMC

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Immunity Prediction of Integrated Circuits using
IC-EMC
IEC 47A WG2 Toulouse Nov 2007

• Etienne SICARD, Alexandre BOYER
• alexandre.boyer_at_insa-toulouse.fr
• http//www.ic-emc.org

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Credits

• European project MEDEA Parachute (2005-2007)
• European project PIDEA EMCPack (2006-2008)
• French project Aerospace-Valley EPEA (2007-2010)

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Summary
1. IC Immunity issues 2. What is IC-EMC 3.
Susceptibility Prediction 4. Case Study S12X 5.
Conclusion
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1. IC Immunity Issues
More interference sources
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1. IC Immunity Issues
Supply voltage
10V
External voltage
90nm
0.25?m
45nm
1V
32nm
0.18?m
0.13?m
22 nm
18 nm
65nm
Internal voltage
10 Noise margin
0.1V
Year
1995
2000
2005
2010
2015
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1. IC Immunity Issues
Immunity level
very high
IC Customer request
Customer pressure
high
IC provider customer gap
medium
IC perf with guidelines
10 dB
low
IC perf without guidelines
very low
2000
2005
2010
2015
2020
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1. IC Immunity Issues
Immunity must be validated before fabrication
Models
DESIGN
Architectural Design
Design Entry Design Architect
EMC Simulations Compliance ?
FABRICATION
NO GO
EMC compliant
GO
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2. What is IC-EMC
A demonstrator for predicting EMC of integrated
circuits

• A simple tool dedicated to predict EMC of ICs
• An electric circuit schematic editor
• An interface to WinSpice analog simulator
• A set of post-processing tools
• A library of EMC/IC elements
• A set of EMC-related goodies

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2. What is IC-EMC
Why is it free?

• Developed within MEDEA Parachute (2005-2007),
  PIDEA EMCPack (2006-2008), EPEA (2007-2010)
• IC foundries customers support the tool
  development and publishing
• Promotes and defends the European vision of EMC
  of ICs

Why is it non-confidential?

• Standard-based tool IBIS (IEC 62014-1), ICEM
  (IEC 62014-3), SPICE
• Integrated Circuit parameters models from ITRS
  roadmap
• Eases industrial exchanges between IC customers
  and providers

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2. What is IC-EMC
Electric circuit schematic editor
IC, package and PCB model
Basic symbols
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3. Susceptibility Prediction
Target Measurement Methods
Radiated immunity in GTEM
Direct Power Injection

• Only for harmonic disturbances, not for transient
  immunity
• Should predict conducted, radiated mode and
  near-field susceptibility
• Should use one single core and IO model for all
  methods
• Should be non-confidential and based on standards
• Recently added to IC-EMC

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3. Susceptibility Prediction
Susceptibility Simulation flow
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3. Susceptibility Prediction
Key role of Coupler from I,V to power
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3. Susceptibility Prediction
Example DPI on 330 ohm load, 1V criterion
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3. Susceptibility Prediction
Step-by-step procedure
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3. Susceptibility Prediction
Measurement/Simulation on 330 ohm load, 1V
criterion
Over 1.0V
Iterative, time-consuming approach
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4. Case Study S12X
S12X Structure and PDN model
ICEM model including IA, PDN and external
decoupling
16-bit automotive micro-controller with interrupt
coprocessor
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4. Case Study S12X
DPI setup, testboard and macromodel
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4. Case Study S12X
Injection Path Model and Impedance Validation
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4. Case Study S12X
DPI measurement/Simulation comparison
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Conclusion

• An environment for immunity prediction at IC
  level has been developed
• The tool includes the coupler and injection path
  model
• Conducted susceptibility successfully predicted
  on several ICs
• The model model is based on the ICEM approach
• The demonstration tool and manual are online at
  www.ic-emc.org
• Demos at EmcCompo 07, EMC Europe 08, EMC Asia
  Pacific 08

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Publications

• E. Sicard "Issues in Electromagnetic
  Compatibility of integrated circuits Emission
  and Susceptibility", in Microelectronics
  Reliability, Volume 45, Issues 9-11 ,
  September-November 2005, Pages 1277-1284
• S. Bendhia, M. Ramdani, E. Sicard,
  Electromagnetic Compatibility of Integrated
  Circuits, book published by Springer, Dec. 2005,
  0-387-26600-3 (More information on
  www.springeronline.com.
• A. Boyer, S. Bendhia, E. Sicard, Modeling of a
  Mixed Signal Processor Susceptibility to
  Near-Field Aggression, proceedings of the IEEE
  International Symposium on EMC, Hawaii, Jul 2007.
  
• A. Boyer, S. Bendhia, E. Sicard "Modelling of a
  Direct Power Injection Aggression on a 16 bit
  Microcontroller Input Buffer", EMC Compo 07
  Torino, Nov 2007, Italy
• E. Sicard, A. Boyer "IC-EMC v1.5 User's Manual",
  INSA editor, ISBN 978-2-87649-052-9, June 2007,
  160 pp