Title: LtStruct output content and Petals qualification'
1LtStruct output content andPetals qualification.
- History
- ARC system qualifciation procedure CMS IN
2004/018 - Defect Analyser CMS IN 2004/043
- talk V.Zhukov 12/2004 ModTest meeting
- proposal for petals quaification(Aachen TEC
meeting) - www-ekp.physik.uni-karlsruhe.de/zhukov/Cms/petala
ccept.ps - manual LTStruct
- www-ekp.physik.uni-karlsruhe.de/zhukov/Cms/Ltstru
ct/ltxtructsoft.html
No 'offical' document How to qualify a
petal Need to test 2-3 real petals to summarize
the experience and write a document. In
Karlsruhe 2 'final' petals are assembled and
tested. Would like to have one more tested
somewhere(Aachen?Starsbourg? ) to understand
difference in setups
2Current Structure of the LtStruct output root
file
- one file per structure test. Many Records per
file with basic set of tests at different
conditions (T cycles) - only 3 records forseen to
be used for qualification. (first warm , cold,
last warm)
No clear idea what to put in summary
File can be huge (1Gb)! Reduce number of tests
and amount of stored info(SaveMode)
Compatible e with the ARC test output some
extra parameters related to AOH
3Root file types of information - Module(AOH)
related test results pedestal,noise, current,
etc. all (almost) compatible with the ARC
output(or ARC is compatible to Lt) errors (i2c,
daq,apv) - Module environment DCU measurement ,
Ileak,HV (external measurement) -Online
Analysis (bad channel, status) base on absolute
(as for ARC) and relative cuts for bad channels.
The cuts are defined in settings xml and not
tuned! Dont expect reasonable flags out of it
unless YOU tuned the cuts! - Setup related
temp, humidity etc. - General run number,
record tag for defectanalyzer,etc.
Yes, it is a bit mess! Therefore I started
this DefectAnalyzer which reprocess all
offline and produce xml db file.
4DefectAnalyzer
Visualize stored information from different
Records, files, Modules. Working for most of
variables... Highly advized to play with it
and contribute to developments. Produce bad
channel flags for individual tests based on
absolute cuts. Write results in the same
file. BUT need to normalize data due to AOH!
Proposal Normalize on the average per chip
values (noise, cal.) not yet in public CVS. How
to combine results of different tests (which
tests?) and grade the petal? Proposal use
CalprofRun Tpeak, Acal (in peakinvon) with HV
and without (for Acal calrun can be used which is
very fast) to find bad channel use PedRun (ped,
noise) only for defect confirmation use
TimeTune,OptoScan Atickmarks(header) to qualify
AOH use IV run (Ileak at HVtest) to qualify
sensor Quality of the test CMN criteria as
usuall tick marks amplitude (optoconnection)
How to combine cold and warm measurements? In
OR!
5Not yet fully implimented in DefectAnalyzer
Grading petals proposal
Bad channels on Module s and Petals lt1 and
module grade A. Petal with lt50 of grade B
A 1-2 module grade B. Petal without
module C and not A B gt2 module grade C.
Petals not A,B C
HV performance Ileak(HVtest) at Twarm Not use
Db, many problems to access current info! Just
absolute cut. Ipetaltot(temp,petal type) lt Imax1
grade A. IminltIpetalltImax2 grade B, others C
Nerrors. (tricky since can be related to the
setup) different types i2c,apv,daq. If
Nerr(type)gtNmax -gtgrade A(B,C) F
Cooling dT masured by DCU should be in the
range defined by the Tmap. Need a reference map
for all measured points and different
temperatures from Aachen! (or need to test many
petals and get average spread)
6How to proceed No plug in play yet! Need
common efforts. Need to get more experiences ,
more variables can appear in the root file
(normalisation factors, more realistic online
analysis). Structure is unlikly to change!
Debugging and Logistic are important make
testing files publicly available, inspect all
parameters, try to understand results of
analysis. Report bugs.
- Hot subjects
- stabilty (errors) performance. Split setup and
petal related problems - T performance. Temperature map implimentation.
- Grading criteria and Db xml file in defect
analyzer.