Simulated LHC conditions with respect to surface damage!

1
Simulated LHC conditions with respect to surface
damage!
Vbias
The second row will prevent the former problem of
rubber residuals! (Thanks to Anna, Laura,
Alberto, Ettore)
2
Second row to avoid bad contact Due to residuals
of rubber on the Biasing AC row!
3
Ingot pre-qualification

• All measuremens on diode or minisensor
• ? Save large sensors as spares!
• INGOT IV CV on diode (with guard on GND)
• To determine Vdepletion, fluence estimate and
  a-factor.
• PROCESS Cint, Rint, leakage current, Rpoly vs.
  Vbias upto Vdepletion 50V (for 10 strips)
• 10 strips only to ensure fast turnaround and no
  RED Flag cause of one strange value on a single
  strip!

If sensors comes non-diced we propose to use the
FS!
4
Possible additional measurements-no standard
procedure-- not in the standard protocol-

• IV CV on full sensor (FS)
• Complete FS (or baby) characterization
• Leakage current, Rpoly, CaC, Cint
• GCD MOS measurements for x-ray irradiated
  sensors

5
Concerns

• Rint measurement is quite complicated and gives
  only reasonable results at low voltages, for FD
  we can only give a lower limit!

Conclusion

• We think we found a fast and reliable way to
  qualify an ingot, and also the belonging process!

6
Interstrip capacitance of HPK sensor (1 neighbour)
100 fF
3.2 pF