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EELS analysis of carbon structures

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EELS, electron energy loss is characteristical to the material ... Properties of high-density amorphous carbon films deposited by laser ablation ... – PowerPoint PPT presentation

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Title: EELS analysis of carbon structures


1
EELS analysis of carbon structures
Gergely Kovách MTA MFA
  • Nanotube seminar
  • 2005. 05. 09.

2
Electron spectroscopy
  • EELS, electron energy loss is characteristical to
    the material
  • XPS, binding energy of C1s (284.6eV, 285.4eV)
    core level electron, energy loss of core level
    electron

3
Electron energy loss in solids
a zero loss b fonons c band transitions
d surface plasmons e bulk plasmons f inner
shell absorption edge
4
Hybridization of C atoms
  • Energy difference in hybridized orbitals
  • Broadening of ? bonds
  • Also valid for amorphous structure

-Pre edge feature in C1s-2p absorption 1s-2p(?)
5
Core level absorption spectra of C samples
DLC Graphite Evap. C
STEM at 100 kV
J. Yuan, Micron 515 (2000)
sp2/sp3 obtained from peak intensity
6
Polarization of 1s-2pz transition
Anisotropic response of 1s-2p dipole transition
-gt difficulties in quantitative analysis
7
sp2/sp3 ratioPlasmon energy shift
8
sp2/sp3 ratiousing reference material
9
sp2/sp3 ratioC1s binding energy
10
Own measurements
11
References
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    129-281
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    Robertson, G. A. J. Amaratunga, W. I. Milne, J.
    Koskinen Phys. Rev. B 48, 47774782 (1993) Phys.
    Rev. B 48, 4777 (1993)
  • R.F.Egerton, Electron Energy-Loss Spectroscopy in
    the Electron Microscope (1986)
  • J. Bruley, L.M. Brown and S.D. Berger. Inst.
    Phys. Conf. Ser. 78 (1985), p. 561.
  • S. D. Berger, D. R. McKenzie, and P. J. Martin,
    Philos. Mag. Lett. 57, 285 (1988) CASINSPEC.
  • J. Kulik et. al. Phys. Rev. B Vol. 52, No. 22.
    15812 (1995)
  • J. Yuan, L.M. Brown, Micron 31 (2000) 515
  • G. Kovach, H. Csorbai, G.Z. Radnoczi, et al.,
    Mat. Sci. Forum 414-4 127-132, 2003 Properties
    of high-density amorphous carbon films deposited
    by laser ablation
  • S. Rey et. al. Appl. Phys. A 71 433 (2000)
  • 14 Y. Lifshitz, Diam. Rel. Mat. 8, 1659 (1999)
    Phys. Rev. B 48, 47774782 (1993)
    http//prola.aps.org/abstract/PRB/v48/i7/p4777_1
  • D. L. Pappas, K. L. Saenger, J. Bruley, W. Krakow
    and J. J. Cuomo, J. Appl. Phys. 71, 5675
    (1992) ADS SPIN INSPEC
  • J. J. Cuomo et al., Appl. Phys. Lett. 58, 466
    (1991) ADSCAS SPIN INSPEC.
  • J. Kulik et al., J. Appl. Phys. 76, 5063
    (1994) ADSCAS SPININSPEC.
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