Title: Chapter 15: Fundamentals of Sealing and Encapsulation
1Chapter 15 Fundamentals of Sealing and
Encapsulation
- Jason Shin
- Derek Lindberg
215.1 What Is Encapsulation
- Protection Techniques
- Typically low temperature polymers
- Isolation from environmental pollutants
- Mechanical protection
- Performance
- Dimensional stability
- Resistance to thermal excursions
- Permeation (isolation of environmental
pollutants) - Thermal dissipation
315.2.1 Chemical Protection
- Protection from Moisture
- Major contributor to packaging failures
- Rapid water desorption from polymeric packaging
during board assembly is a major cause of
delamination - Vapor pressure build-up within packages sometimes
cracks the plastic cases - Swelling of the encapsulants caused by moisture
pickup is a major driving force of failures at
the interconnection level
4- Protection from Moisture (continued)
- Fricks Law of Diffusion
- Equilibrium water constant
5- Protection from Salts
- In the presents of salts, corrosion of the IC
metallization is accelerated - Operating voltages and materials used for
electrical performance may be sufficient to cause
electrolytic corrosion - Due to small line widths and micrometer or less
pitch, small localized corrosion can produce
major problems - Protection from Biological Organisms
- Insects can be attracted by the electric field
generated by an electronic device
6- Protection from Atmospheric Contaminants
- Corrosive gasses in the atmosphere can be harmful
to electronic devices - Nitrogen oxides
- Sulfur dioxide
- Causes acid rain
715.2.2 Mechanical Protection
- Both wirebond and flip chip devices have very
fine interconnects - Structural integrity provided by the
interconnections is very minimal - Protection achieved by
- Prevention of damage by encapsulation over the IC
- Minimization of strain in the solder joined by
underfill between IC and package substrate
815.3.1 Hermetic versus Non-Hermetic Sealing
- Compromise between cost and performance
- Inorganics are hermetic, organics are not
- Hermetic package is defined as one that prevents
the diffusion of helium below a leak rate of 10-8
cm3/s.
913.2 Moisture Absorption of Encapsulants
- Moisture Effects on Plastic Packages
- Moisture acts as a debonding agent though a
combination of - Moisture-reacted metal surace can form a weak,
hydrated oxide surface - Moisture-assisted chemical bond breakdown
- Moisture-related degradation or depolymerization
- Moisture diffusion rate depends on the material,
as well as its thickness and the diffusion time
10- Moisture Effects on Plastic Packages (continued)
- Organic materials are not hermetic and allow
moisture to penetrate and be absorbed. - Improvements in plastic packaging materials and
processes have lead to reliability that
approaches hermetic packages - The word hermetic is defined as completely sealed
by fusion, solder and so on, so as to keep air,
moisture or gas from getting in or out.
1115.3.3 Organics Came a Long Way
- Inadequate adhesion, contaminants within the
material itself, incompatible thermal expansion,
and stress-related problems all combined for
early problems - Now 90 of ICs are marketed in this form
- Better filler technology resulted in materials
that do not impart stress-related failures.
12- Adhesion Is Very Critical
- Good interfacial adhesion between polymers and
packages is important - This adhesion is between metallic-organic
interfaces is facilitated by a combination of
mechanical interlocking and chemical and physical
bonding. - Corrosion protection and adhesion properties are
closely linked
13- Accelerated Testing Helps to Select Right
Material - The means by which non-hermetic packaging is
assessed during screening. - Temperature cycling is the most common
thermomechanical environmental test.
1415.4.1 Encapsulation Requirements
- Mechanical Properties
- Good stress-strain Behavior
- An ideal encapsulant should exhibit
- gt1 elongation at break
- A tensile modulus of 5-8 GPa
- Minimum shift in properties at temperatures close
to Tg
15(No Transcript)
16- Thermomechanical Considerations
- Coefficients of thermal expansion
- Ideally the CTE of a molding compond should be as
close to Si as possible - Also the CTE of an underfill should be as close
to the solder bump as possible
17- Residual Stress
- Shrinkage of resin
- Thermomechanical loading due to mismatch of CTEs
of constituent materials between cure temperature
and storage temperature.
1815.4.1 Thermal Properties
- Coefficient of Thermal Expansion (CTE)
- Requirements for CTE vary significantly with the
type of encapsulants in need - Glass Transition Temperature (Tg)
- The temperature at which the transition from
solid to liquid takes place - Flow During Encapsulation
- Flow characteristics of the molten compound
within the mold during the molding operation
1915.4.3 Physical Properties
- Adhesion
- Measure of the strength between two interfaces
- Robust encapsulation system provides strong
adhesion to the device encapsulate interfaces
such that the mechanical integrity of the package
can be preserved under thermal stress - Interfaces
- Any physical or chemical layer (in atomic scale
between two materials) - first line of defense against adhesion failure
2015.5 Encapsulant Materials
- All encapsulants involve some form of
polymerization and cross-linking reactions that
enhance the mechanical properties of the
packaging system.
2115.6.1 Encapsulation Processes
- Molding
- Majority of processes use transfer molding
- Simple and mass producible
- Molten material injected into mold cavity with IC
at its center. - Held under pressure until compound cures
- Hard to apply to flip chip and PGA packages
2215.6.1 Molding Complications
- Early (70s 80s) molds suffered from unbalanced
EMC injection - Different molds filled at different rates causing
- wire sweep
- Variation in void sizes and quantity
- Variation in size
- 90-240 second cycles
- Modern gang-pot molds are balanced
- Cycle time as low as 15 seconds
2315.6.2 Liquid Encapsulation
- Viscosity controlled to meet fill requirements
- Three most common liquid encapsulation processes
- Cavity Filling
- Glob Topping
- Underfilling
2415.6.2 Cavity Fill
- Used mostly in prefabricated ceramic (usually)
chip carriers - After die attach and wire bonding the cavity is
flooded with liquid encapsulant
2515.6.2 Glob Top
- Simple alternative to cavity-filling
- No need for premade mold or cavity
- Dams may not be necessary based on application
- Often used for extra protection on manufactured
PCBs
2615.6.2 Underfilling
- Typically used in flip-chip assembly
- Liquid injected under chip to seal and strengthen
the chip to board/substrate bond
2715.7 Hermetic Sealing
- The goal of sealing is to maintain the electronic
package in an inert environment - Several processes are used
- Fused Metal Sealing
- Soldering
- Brazing
- Welding
- Glass Sealing
28Fused Metal Seals
- Typical for hermetic packages with volumes
gt.1mm3 - Can be welded, soldered, or brazed
- Welding is the most popular due to high yield,
large throughput, and reliability - Soldering and brazing are typically used if the
metal lid must be removed again later - Glass seals can also be used for reliable
protection
29Techniques
- Soldering
- Solders are selected by temperature, strength,
and cost - Melting temperature must be below that of the
solder or brazing process used to attach pins to
the substrate - Must be above the temperature used to attach the
part to a PCB - Brazing
- Stronger, more corrosion resistant seal than
solder - Does not require flux
- Usually tack-welded to a gold-plated Kovar (Co,
Ni, Fe alloy) lid - Glass Sealing
- Been in use since the 1950s
- Used to create hermetic glass-to-metal seals
between metal lid and metallized alumina chip
carrier
30Sealing Examples
31Summary and Future Trends
- Early attempts at non-hermetic packages suffered
from a number of problems, including encapsulant
contamination, poor moisture resistance,
incompatible thermal expansion, stress-related
problems. - Low-cost polymeric plastic packaging has been
dominant since the 1980s - Use of polymeric packages is only expected to
increase.