Title: SNAP CCD Packaging R
1SNAP CCD Packaging RD
- A collaborative effort between LBL and Yale
- LBL Chris Bebek, John Bercovitz, John Emes,
- Don Groom, Steve Holland, Armin Karcher,
- Bill Kolbe, Hakeem Oluseyi, Natalie Roe,
- Guobin Wang
- Yale Charlie Baltay, Will Emmet, Tom Hurteau,
- Dave Rabinowitz, Andy Szymkowiak
2SNAP Focal Plane
3Approximate SNAP CCD Dimensions
4SNAP 4-Side Buttable CCD Design
Exploded View of Package
5CCD Packaging - Requirements
- CCD pattern consistent with NIR array
- Mechanical Rigidity, Thermal Stability
- Temperature range 100o C to 150o C
- CCD Flatness tolerance 10 microns
- CCD package thickness tolerance 10 microns
- Thermal Conductivity
- Heat generated by CCD electronics on package
1 watt - Thermal resistance to back plate should be lt 1o
C/watt - Substrate should be opaque to photons not to see
traces on back of substrate - Electrical Connections
- 74 contact pads on CCD
- Will read out 65 of these in the 1st prototype
package. Number may change if we put more
electronics on package
6Experience with Large Format CCD Cameras
QUEST II 112 CCD Large Area Camera For the
Palomar Schmidt Camera
QUEST I 16 CCD Camera for the Venezuelan Schmidt
Camera
7CCD Package for the QUEST II Camera
Packaged and tested 376 CCDs at Yale to select
the 112 best devices for the Palomar-QUEST Camera
8Thermal Expansion Data for SNAP CCD Candidate
Packaging Materials
9Thermal Expansion Data for SNAP CCD Candidate
Packaging Materials
10SNAP 4-side Buttable CCD Finite Element Analysis
- Quarter Model Without Boundary Constraints or
Elements Shown
11SNAP 4-side Buttable CCD Finite Element Analysis
Quarter Model Showing Boundary Constraints
12SNAP 4-side Buttable CCD Finite Element Analysis
- Isometric View of Deformation in Z-axis (Invar
36/Aln Package)
13SNAP 4-side Buttable CCD Finite Element Analysis
Selected Result from Dan Chengs Finite Element
Analysis (LBL
14SNAP 4-side Buttable CCD Finite Element Analysis
Deformation in Z-axis (m) for Invar/AlN Case
(293oK to 153oK)-Diagonal Section View from
Center to Corner
1 um out-of-plane
15SNAP 4-side Buttable CCD Finite Element Analysis
Deformation in Z-axis (m) for Molybdenum/AlN Case
(293oK to 153oK)-Diagonal Section View From
Center to Corner
18 um
16SNAP 4-side Buttable CCD Finite Element Analysis
Summary of Finite Element Analysis Results
17SNAP 4-Side Buttable CCD Design
18SNAP 4-Side Buttable CCD Design
19SNAP 4-Side Buttable CCD Design
- Aluminum Nitride Substrate-Top View
20SNAP 4-Side Buttable CCD Design
- Aluminum Nitride Substrate-Bottom View
21SNAP 4-Side Buttable CCD Design
- Circuit Board-Bottom View
22SNAP 4-Side Buttable CCD Design
23SNAP 4-Side Buttable CCD Assembly Sequence
- Step 1 Bump-bond CCD to AlN Substrate flow
Epotek 301-2 between - components (50 um space)
Developed in consultation with Michael Lesser,
University of Arizona.
24SNAP 4-Side Buttable CCD Assembly Sequence
- Step 2 Glue Wirebond Circuit Board Subassembly
to CCD/AlN
25SNAP 4-Side Buttable CCD Assembly Sequence
- Step 3 Subassembly from Step 2 to Invar 36 Base
- Precision-ground spacers set overall thickness to
within /-5 um during bonding - Thickness of Hysol EA9361 is sufficient to absorb
all tolerances
26SNAP 4-Side Buttable CCD Assembly Sequence
- Step 3 (contd) Precision-ground spacers set
overalthickness to within /-5 um during
bonding - Thickness of Hysol EA9361 is sufficient to
absorb all tolerances
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28Package Prototypes
- Mechanical Mockup to test thermal properties,
glues, flatness, etc. - Prototype 1
- Test as many features of design and assembly
procedures as possible - Serve as package for testing first batch of CCDs
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30Open Questions
- Invar pad to Moly back plate attachments
- Assembly procedure of CCDs into detector array
- Electronics on package
- Electrical connections
31Mounting CCD Package on Molybdenum Focal Plane
32Moly Interface Plate
- Monolithic EDM (spark erosion) construction
- 0.75mm thick flexures
- Notch cutouts to eliminate in-plane torsion
constraint - Tapped holes for M3 mount to cold-plate