GSI Beam Test: 2430 June 2005

1
GSI Beam Test 24-30 June 2005

• Radiation test of AMS-02 electronics
• ACOP components (CSIST, NCU)
• TTCE components (INFN Perugia, MIT)
• DC/DC MOSFET dynamic test (INFN Perugia)
• USCM PROM upset test (MIT)
• ECAL components (LAPP, INFN Pisa).
• Integration tests will start at CERN in May 2005
  (contact A.Kounine)

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List of participants

• A.Papi (INFN Perugia), no badge
• M.Bizzarri (INFN Perugia), no badge
• M.Menichelli (INFN Perugia), no badge
• Ming-Jyh Lee (CSIST, Taiwan), no badge
• Ho-Ming Chang (CSIST, Taiwan), no badge
• Yueh-Bin Lee (CSIST, Taiwan), no badge
• Yuan-Hann Chang (NCU, Taiwan), no badge
• Chih-Hsun Lin (NCU, Taiwan), CERN badge
• Zhongliang Ren (Academia Sinica, Taiwan), CERN
  badge
• G.Cougoulat (LAPP, Annecy), LAPP badge
• J.Tassan (LAPP, Annecy), LAPP badge
• S.Rosier (LAPP, Annecy), LAPP badge
• M.Steuer (MIT/CERN), CERN badge
• A.Kounine (MIT/CERN), CERN badge
• S.Xu (MIT/CERN), CERN badge
• P.Berges (MIT/CERN), CERN badge

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Procedures

• Medical certificate fax to M.Steuer by May 15
• 23-24 June instruction courses for those who
  access test area during nights
• Beam time starts on June 24 at 2200, it ends on
  June 30 at 600.