Outlier Detection in Semiconductor Testing

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Outlier Detection for Quality Improvement in
Semiconductor Testing

• Semiconductor Testing

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Outlier Detection
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Outlier Detection

• In the highly competitive semiconductor industry,
  ensuring high-quality products is crucial to
  maintaining customer satisfaction and gaining a
  competitive edge. Outlier detection is a powerful
  tool that can be used to identify and address
  issues with product quality. yieldWerx yield
  management system provides advanced outlier
  detection capabilities using wafer maps, stacked
  wafer map analysis, and die genealogy data.

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Outlier Detection Using Wafer Maps

• Wafer maps provide a visual representation of the
  location of failures on a wafer. yieldWerx uses
  advanced analytics algorithms to analyze wafer
  maps and identify outliers that may indicate
  systematic errors in the manufacturing process.
  By identifying the root cause of failures,
  manufacturers can take targeted actions to
  improve product quality and yield.

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Stacked Wafer Map Analysis

• Stacked wafer map analysis is a technique used to
  identify hotspots and patterns of failing die
  across multiple wafers. This method involves
  aligning multiple wafer maps and stacking them on
  top of each other to identify common patterns or
  clusters of failing die. yieldWerx uses advanced
  algorithms to identify the causes of hotspots and
  patterns of failures and provides valuable
  insights into the semiconductor manufacturing
  process.

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Die Genealogy Data 

• Die genealogy data includes information about
  pass and fail outcomes, parametric data, and
  wafer and lot identification. yieldWerx uses die
  genealogy data to trace the genealogy of each die
  and identify any patterns or trends that may
  indicate issues with the manufacturing process.
  By analyzing die genealogy data, manufacturers
  can gain valuable insights into the causes of
  failures and take appropriate actions to address
  them.

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Conclusion

• In conclusion, outlier detection using wafer
  maps, stacked wafer map analysis, and die
  genealogy data is an essential tool
  for semiconductor manufacturers to improve
  quality and yield. yieldWerx provides advanced
  analytics and visualization tools to help
  manufacturers identify and address issues with
  product quality. By using yieldWerx,
  manufacturers can gain valuable insights into the
  manufacturing process and take precise actions to
  improve product quality and yield.

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Add Ons

• Automated Assemble Map Generation
• Quality Assurance Risk Elimination
• Cross Work Center Correlation
• External Data Source Integration
• Real time Lot Control and Disposition
• Executive Dashboard
• Part Average Testing

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ContD

• Smart Wafer Merge
• SPC/SBL/SYL
• Automated Data Loading
• Production Yield Reporting
• Raw Data Monitoring
• Standard Data Access
• Yield Calculation Flexibility
• Lot Genealogy