NEEP 541 Displacements in Silicon - PowerPoint PPT Presentation

1 / 7
About This Presentation
Title:

NEEP 541 Displacements in Silicon

Description:

Equilibrium conductivity depends on carrier concentration and mobility. Displacements decrease equilibrium concentration by enhancing recombination at defects ... – PowerPoint PPT presentation

Number of Views:63
Avg rating:3.0/5.0
Slides: 8
Provided by: jamesbl
Category:

less

Transcript and Presenter's Notes

Title: NEEP 541 Displacements in Silicon


1
NEEP 541Displacements in Silicon
  • Fall 2002
  • Jake Blanchard

2
Outline
  • Displacements in Silicon
  • Carrier lifetime
  • Carrier concentration and mobility
  • Annealing

3
Displacement Effect
  • In addition to ionization, displacements can
    affect the performance of semiconductor materials
  • Displacements tend to affect the carrier
    lifetime, the carrier concentration, and the
    carrier mobility

4
Carrier Lifetime
  • Defined as the average time a carrier survives
    before recombination
  • Determined by carrier concentrations, defect
    concentrations, and carrier mobility
  • Irradiation reduces lifetime because it
    introduces defects which act as recombination
    sites
  • Clusters do this more effectively (on a
    per-defect basis) than point defects

5
Carrier Concentration and Mobility
  • Equilibrium conductivity depends on carrier
    concentration and mobility
  • Displacements decrease equilibrium concentration
    by enhancing recombination at defects
  • Defects also decrease the carrier mobility,
    largely by the production of ionized impurities
    leading to enhanced scattering
  • Again, clustering enhances these effects

6
Annealing
  • Defects can be removed by heating the
    semiconductor
  • Defects recombine and crystal moves towards its
    unirradiated state
  • Time scales are microseconds to hours, depending
    on temperature
  • We must reach about 650 K to get significant
    defect removal

7
Notes
  • Threshold energy for electron irradiation is
    about 150 keV
  • Defect production rates increase rapidly above
    about 300 keV
  • Displacement energy for Si is about 12.9 eV
  • Properties are affected by interstitial O in a Si
    vacancy
  • There is no known effect from Si interstitials
  • Photons (Elt5 MeV) create defects via Compton
    electrons
Write a Comment
User Comments (0)
About PowerShow.com