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System and experimental setup

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that MC-rich liquid wets the liquid/Si interface and PFMC is ... [4] J. O. Indekeu, M. P. Nightingale, and W. V. Wang, Phys. Rev. B 34, 330 (1986) ... – PowerPoint PPT presentation

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Title: System and experimental setup


1
Observation of Critical Casimir Effect in a
Binary Wetting Film An X-ray Reflectivity
Study Masafumi Fukuto, Yohko F. Yano, and Peter
S. Pershan Department of Physics and DEAS,
Harvard University, Cambridge, MA
  • System and experimental setup
  • What is a Casimir force?
  • A long-range force between two macroscopic
    bodies
  • induced by some form of fluctuations between
    them.
  • Two necessary conditions
  • (i) Fluctuating field
  • (ii) Boundary conditions (B.C.) at the walls
  • Comparison with theory
  • Film thickness L is determined by
  • Dm P(L) pc(L, t)
  • i.e., a balance between
  • (i) Chemical potential (per volume) of film
    relative to bulk liquid/vapor coexistence
  • ? Dm gt 0 tends to reduce film thickness.
  • ? Can be calculated from DT and known latent
    heat of MC and PFMC.
  • (ii) Non-critical (van der Waals) disjoining
    pressure P Aeff/6pL3
  • ? Effective Hamaker constant Aeff gt 0 for the
    MC/PFMC wetting films (T gt Twet).
  • ? P tends to increase film thickness.
  • ? Aeff for mixed films can be estimated from
    densities in mixture and
  • constants Aij estimated previously
    for pairs of pure materials 10.
  • (iii) Critical Casimir pressure pc
    kBTc/L3?,-(y)

Thickness measurements by x-ray reflectivity
  • Casimir forces in adsorbed fluid films near bulk
    critical points
  • (i) Fluctuations Local order parameter f(r,z)
  • e.g., mole fraction x - xc in binary mixture
  • (ii) B.C. Surface fields, i.e., affinity of one
    component
  • over the other at wall/fluid and fluid/vapor
    interfaces.
  • As T ? Tc, critical adsorption at each wall.

Symbols are based on the measured L, Dm (2.2 ?
10-22 J/Ã…3)DT/T, and Aeff 1.2 ? 10-19 J
estimated for a homogeneous MC/PFMC film at bulk
critical concentration xc 0.36. The red line
() is for DT 0.020 C. The dashed red line
(---) for T lt Tc is based on Aeff estimated for
the case in which the film is divided in half
into MC-rich and PFMC-rich layers at
concentrations given by bulk miscibility gap.
  • Theoretical background
  • Finite-size scaling and universal scaling
    functions
  • (Fisher de Gennes, 1978 1)
  • Casimir energy/area
  • Casimir pressure
  • For each B.C., scaling functions ? and ? are
    universal
  • in the critical regime (t ? 0, x ? ?, and L ?
    ?) 2.
  • Scaling functions have been calculated using
    mean field
  • theory (MFT) (Krech, 1997 3).
  • Summary
  • Both the extracted Casimir amplitude D,- and
    scaling function ?,-(y) appear to converge with
    decreasing DT (or increasing L). This is
    consistent with the theoretical expectation of a
    universal behavior in the critical regime 2.
  • The Casimir amplitude D,- extracted at Tc and
    small DT agrees well with D,- 2.4 based on the
    renormalization group (RG) and Monte Carlo
    calculations by Krech 3.
  • The range over which the Casimir effect (or the
    thickness enhancement) is observed is narrower
    than the prediction based on mean field theory
    3.
  • Thickness enhancement near Tc for small
  • DT, with a maximum slightly below Tc.
  • ? Qualitatively consistent with theoretically
  • expected repulsive Casimir forces for (,-).
  • Recent observations of Casimir effect in critical
    fluid films
  • Thickening of films of binary alcohol/alkane
    mixtures on Si near the
  • consolute point. (Mukhopadhyay Law, 1999 6)
  • Thinning of 4He films on Cu, near the superfluid
    transition.
  • (Garcia Chan, 1999 7)
  • Thickening of binary 3He/4He films on Cu, near
    the triple point.
  • (Garcia Chan, 2002 8)

References 1 M. E. Fisher and P.-G. de
Gennes, C. R. Acad. Sci. Paris, Ser. B 287, 209
(1978). 2 M. Krech and S. Dietrich, Phys. Rev.
Lett. 66, 345 (1991) Phys. Rev. A 46, 1922
(1992) Phys Rev. A 46, 1886 (1992). 3 M.
Krech, Phys. Rev. E 56, 1642 (1997). 4 J. O.
Indekeu, M. P. Nightingale, and W. V. Wang, Phys.
Rev. B 34, 330 (1986). 5 Z. Borjan and P. J.
Upton, Phys. Rev. Lett. 81, 4911 (1998).
6 A. Mukhopadhyay and B. M. Law, Phys. Rev.
Lett. 83, 772 (1999) Phys. Rev. E 62, 5201
(2000). 7 R. Garcia and M. H. W. Chan, Phys.
Rev. Lett. 83, 1187 (1999). 8 R. Garcia and M.
H. W. Chan, Phys. Rev. Lett. 88, 086101
(2002). 9 R. B. Heady and J. W. Cahn, J. Chem.
Phys. 58, 896 (1973). 10 R. K. Heilmann, M.
Fukuto, and P. S. Pershan, Phys. Rev. B 63,
205405 (2001). 11 A. J. Liu and M. E. Fisher,
Physica A 156, 35 (1989). 12 J. W. Schmidt,
Phys. Rev. A 41, 885 (1990). Work supported by
Grant No. NSF-DMR-01-24936.
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