Title: Nanomechanical Testing of Thin Polymer Films
1Nanomechanical Testing of Thin Polymer Films
Kyle Maner and Matthew Begley
Structural and Solid Mechanics Program Department
of Civil Engineering University of Virginia
Uday Komaragiri (UVA)
Special thanks to Dr. Warren C. Oliver (MTS)
Prof. Marcel Utz (UConn)
2Why test thin polymer films?
- Improve thermomechanical stability via
self-assembly of nanostructure - Establish connections between the nanostructure
mechanical properties - Determine the size scale of elementary
processes of plastic deformation
3Overview
- Traditional nanoindentation of thin films bonded
to thick substrates - A novel freestanding film microfabrication
procedure - A novel method to probe freestanding films
4Do polymers exhibit scale dependence?
Is traditional nanoindentation sensitive enough
to detect such behavior?
53 Pure, amorphous polymers Poly(styrene) (PS)
Mw 280 kD Poly(methyl methacrylate) (PMMA) Mw
350 kD Poly(phenylene oxide) (PPO) Mw 250
kD 2 Block co-polymers Poly(methyl
methacrylate)-ruthenium (PMMA-Ru) Mw 56 kD
(a metal-centered block co-polymer) Poly(styrene)-
poly(ethylene propylene) (PS-PEP) (a
lamellar microphase separated block co-polymer)
6Experimental Procedure
- Calibrate the tip discard data for depths
where the calibration is inaccurate - Indent polymer films on PS substrates 16
indents per sample to a depth of 1.0 mm - Discard rogue tests due to surface debris
- Average data to determine elastic modulus and
hardness curves as a function of penetration
depth
7- The Berkovich diamond tip does not come to a
perfect point - The radius of the tip gradually increases with
use - The shape change alters the contact area of the
indenter for a given depth - A tip calibration determines the best-fit
coefficients for the area function describing the
tip
8Quartz, E 72 GPa
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11Nanostructured lamellar block co-polymer
12Conclusions from traditional nanoindentation
- Substrate effects can be dramatically reduced if
elastic mismatch is minimized - A tip calibration can be accurate for depths
greater than 5 nm - Scale effects indicate that elementary processes
of deformation occur at depths less than 200 nm
13Overview
- Traditional nanoindentation of thin films
bonded to thick substrates - A novel freestanding film microfabrication
procedure - A novel method to probe freestanding films
14A new microfabrication procedure should be
- applicable to a wide range of materials
- easily prepared on any wet-bench
- easily integrated with existing test equipment
- easily interpreted with relatively simple
mechanics models
The experimental testing of the sample created
should be
15The short answer
Spin-casting
Etching
Testing
16Spin-cast polymer film onto glass plate with
etchable fibers
17The short answer
Spin-casting
Etching
Testing
182 HCl
BACK-LIGHTING
FRONT-LIGHTING
19Mechanical properties via nanoindentation before
and after acid bath
20The short answer
Spin-casting
Etching
Testing
21Overview
- Traditional nanoindentation of thin films bonded
to thick substrates - A novel freestanding film microfabrication
procedure - A novel method to probe freestanding films
22An overview of the test method
- constant harmonic oscillation superimposed on a
ramp loading - at contact, stiffness of sample causes drop in
harmonic oscillation - mechanical properties can be extracted from
load-deflection response
23Probing of freestanding films surface find
24Probing of freestanding films test flow
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26Stiffness scan
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28With the given parameters (thickness span),
what is the anticipated response??
Linear plate
Transition
Membrane
29PMMA
Mw 120 kD thickness 350 nm span 30 mm
30Finite element study of PPO plasticity
- Load-deflection response generated via finite
elements - Elastic-perfectly plastic stress-strain
relationship - Varied values of yield strength, elastic
modulus, and pre-stretch
31PPO
Mw 250 kD thickness 750 nm span 30 mm
32Conclusions
- Approximated size scale over which elementary
processes of plastic deformation occur in
polymers - Developed a new microfabrication technique to
create submicron freestanding polymer films - Developed a new testing method to probe thin
freestanding films and illustrated its
repeatability - Successfully used numerical models to extract
mechanical properties from submicron films
33Questions?
Thank you.
34- Introduction and motivation
- Description of the MTS Nanoindentation System
- Traditional nanoindentation of thin films bonded
to thick substrates - A novel freestanding film microfabrication
procedure - A novel method to probe freestanding films
35Traditional methods of testing thin films
- Wafer curvature
- Bulge testing
- Nanoindentation of thin films bonded to thick
substrates - Microfabrication probing of freestanding
films
36Nanoindentation Probe
37Special features of the MTS Nanoindentation System
DCM (dynamic contact measurement) module
ultra-low load indentation head with
closed-loop feedback to control dynamic
motion CSM (continuous stiffness measurement)
approach measures the stiffness of the contact
continuously during indentation as a function of
depth by considering harmonic response of head
38- Introduction and motivation
- Description of the MTS Nanoindentation System
- Traditional nanoindentation of thin films
bonded to thick substrates - A novel freestanding film microfabrication
procedure - A novel method to probe freestanding films
39The research on submicron films
- Metals, metals, and more metals deformation
and scale-dependent behavior is well understood - Plasticity in polymers how it occurs but not
how big - Minimization of substrate effects via elastic
homogeneity of film and substrate - Probing of freestanding Si-based brittle and
metal structures
40The question of contact
41Film thickness before and after acid bath
42A novel method to probe freestanding films should
combat the problems facing experimental testing
of compliant films.
- Tip calibration errors can produce inaccurate
measurements - The surface of compliant materials is difficult
to find - Mechanics to extract properties is very complex
43Sensitivity of the Method
PMMA 350 nm thick, 30 mm span
E 3.0 GPa
e0 0.0026
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45Tip Calibration Equations
- Stiffness as a function of depth, S(d), is
measured - The area function, A(d), is determined from the
following equation -
- Elastic properties of calibration sample and
indenter tip must be know to calculate,
- The calculated area function is a series with
geometrically decreasing exponents
46Standard method Nanoindentation of
film/substrate system
- CSM stabilizes harmonic motion of the indenter
head - Probe begins to move towards surface
- Contact (1) occurs when stiffness increases
- Load (2) to a prescribed displacement
- Hold (3) at maximum load to assess creep
behavior - Unload (4) 90 of the way
- Hold (5) at 90 unload to assess thermal drift
47Parameters of Spin-Casting
48Surface Characterizations
PS substrate
PMMA film on PS substrate
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50Illustrative Theory, i.e. Math for non-Udays
Strain-displacement
, where
Stress-strain
Equilibrium
51By combining the strain-displacement,
stress-strain, and equilibrium equations, the
following equation can be found
0
For small deflections, , thus
The equation for load becomes
Due to small deflections, the denominator goes to
1, and load as a function of deflection is
52Sensitivity of the method very shallow depths
PMMA 350 nm thick, 30 mm span
E 3.0 GPa
e0 0.0026