Title: Portable Power Challenges: Spreading the Heat
1Portable Power Challenges Spreading the Heat
- Darvin Edwards
- TI Fellow
- Manager Advanced Package Modeling and
Characterization - Texas Instruments
- rvin_at_ti.com
2Outline
- Trends driving portable power concerns
- Best Design Practices
- stacked die packages
- stacked packages
- hot spots
- Modeling Issues
- compact models
- the special handheld environment
- Compact System Optimizations
- Summary
3Trends
- Whats driving thermal concerns in portable
electronics? Teenagers! - Teenagers what phones with
- Cameras
- Video cameras
- Games
- Downloadable music
- GPS
- TV
- Email PDA functions
- Internet access
- Bluetooth
- USBII
- 4-8GB hard drives
- And the phone functions
4Trends
- Portable devices moving towards ever more compact
electronics - stacked die
- stacked packages
- embedded die
- Concentrates heat locally, drives up power
density - Is this an issue?
- phones run 1-3 watts
- could compress all circuits into one module
- cooling 2-3 watt package without heat sink is
usually challenging
Spacer
5Trends
- Low cost package types dont offer many routes
for heat spreading away from die - 1 or 2 layers of routing only
- Stacked packages have difficulty getting heat to
PCB from top package - Thin die have more hot spot issues than thicker
die - WSPs provide very localized hot spots on PCBs
- Dies of highest concern
- Battery charger die
- RF power amplifiers
- SOCs
6Best Design Practices
- To optimize stacked die thermal performance,
conduction paths to the PCB must be optimized - Largest die must go on bottom of package for best
thermal performance - Large die acts as a heat spreader to get heat to
solder balls and PCB - With good die spacer thermal conductivity, high
power die can be on top or bottom - When the largest die is on the bottom, package
thermal performance will be nearly the same as a
single die package with the same large die - Theta-ja and Theta-jb will be barely changed
- Theta-jc might go either way, depending on die
thickness and die sizes in the package - Theta-jc is a dont care for most portable
applications - Stacking adhesives should be void free for
optimal thermal conduction - System problem Stacking die results in higher
power density than single die package - Higher junction temperature will result
- Need better thermal spreading in PCB
- Moving thermal balls to beneath edge of
- chip improves thermal performance
- over a center-only array
7Best Design Practices
- To optimize stacked package thermal performance,
thermal conduction through the stack must be
maintained - The top packages will not conduct heat into the
PCB as effectively as bottom package - Thermal balls not possible for top packages
- Thermal performance of top packages will degrade
- Adhesive between packages can provide relief
- The thermal performance of the bottom most
package will look largely the same as if attached
to PCB alone - This generalization assumes heat sinking was not
the plan - Assumes zero heat generation in packages on top
- The best system design is to put high power die
in the bottom package for best thermal conduction
into PCB - Thermal performance of stacked packages is
somewhat worse than for a stacked die approach
with the same die compliment - Best practice modeling should include Cu
conductor details of package - true of almost every package type
8Cooling Ideas for Stacked Packages
Al or Cu Spreader
Soldered Connection
Top Hat Spreader for Stacked Packages
Plastic Case
Gap Filler
Metallized Case
Gap Filler Conduction to Chassis
9The Hotspot Issue
- Thinner die increase spreading resistance
- hot spots get hotter
- Can reduce impact of hotspot by attaching die
directly to high thermal conductivity spreader
such as Cu plate - cost issue
- possible reliability issue
10Hotspot Best Design Practices
- Hotspots thin die imply need for package/chip
codesign - In stacked die packages, hot spots on one die can
create hotspots on another - die thermal design tools need to comprehend
die-to-die interactions - Dont cluster hotspots
- spreading hotspots apart allows heat spreading
from individual hotspots over wider areas,
increasing conduction from each hot spot - applies to die and PCB design
- If only one hotspot, center of die is better than
corner of die - allows maximum heat spreading
- Keep hotspots out of corners
- a hotspot in a corner blocks heat flow in 3
directions
11Hotspot Best Design Practices
- Center is better than corner for single hotspot
- 0.5x0.5 mm hotspot 2 design placements
- 38 difference
Center Spot Max. Temp. 62C Theta-ja 37C
Corner Spot Max. Temp. 76C Theta-ja 51C
12Hotspot Best Design Practices
With multiple hotspots, sweet location is
somewhere in between
1
2
2
1
1
2
3
4
4
3
3
4
Best Design
Worst Design
Better Design
Sweet Spot
13Hotspot Reliability Implications
- Device reliability is a linear function of the
active die area and is exponential with
temperature - small hotspots will have minor impact on
reliability - large hotspots will have major impact on
reliability - higher temperature spots will have large impact
on reliability, regardless of size - Typical reliability issues
- electromigration
- hot electron effects
- Kirkendall voiding in Au/Al wire bonds
- Reliability and functionality need to be
characterized at the temperatures the hotspots
will reach
14Modeling Challenges for Portable Die
- No standard compact model topologies for stacked
die or stacked packages - present compact models dont include hot spots
- In suggested model, compact model topology
changes dependent on which die is largest - Inter-die resistance represented
- Potential Stacked Die Topology
- modification of standard QFP
- compact model
Inter Die Resistance
15Modeling Challenges for Portable Die
- Stacked packages may be represented with stacked
compact models
Standard package compact model
Stacking of compact models
Thermal Shunts (Shorts)
16Modeling Issues Handheld Environments
- When modeling portable devices, multiple thermal
boundary conditions must be included - Handheld
- Operating in case
- Operating on a table
- Example typical CSP device in cell phone
- When held in the hand, a portable device is
liquid cooled - There is a limit to the power which can be
comfortably dissipated by a portable device into
the hand - To extend beyond this limit, rejection of heat to
the air is required
17Modeling Application Including the Hand
- Hand is modeled as block of fat
- Exterior of fat held at body temperature, 37.1C
18Modeling Application Including the Hand
- Good correlation to experiment achieved
Still air box measurement
Operation mode measurement
Courtesy M. Naeshiro (TTC)
19Compact System Optimizations
- Optimizations
- vents even on portable devices
- heat spreaders in plastic chassis boxes
- conduction enhancements from PCB to box
- screws, gap fillers
- phase change materials to absorb transient
thermal events - low speed fans for portable devices
- in hot PCBs, thermally partition PCBs to
isolate devices with lower allowed operating
temperatures from those with higher
low speed fan
Heat Spreader
Gap Filler or Phase Change
20Compact System Optimizations
Piezoelectric Fans
Heat Pipe Applications
21Offsetting Trends
- Get Hotter Higher maximum junction temperature
ratings allow easier thermal design - Challenge high temperature with low leakage
- Get Smarter Understanding the life usage thermal
profile allows tuning of thermal solution vs.
reliability - A system specified at 125C continuous operation
may allow 300 hrs at 150C with good reliability - Design system for reliability goals, not just
maximum temperature - Must insure system functions at hottest
temperature
Product Specific
22Summary
- Portable devices are offering thermal challenges
- stacked die and stacked packages increase power
density - thinned die have potential hot spot issues
- Hotspots may need to be analyzed for thin die,
even in portable applications - multiple environments must be considered when
performing thermal design of a system - New cooling schemes are on the way to handle
higher power densities in portable systems - Thermal lifetime application profiles should be
used to estimate device reliability rather than
maximum operating temperatures