Title: Physical and Reduced Order Dynamic Analysis of MEMS
1Physical and Reduced Order Dynamic Analysis of
MEMS
S. K. De and N. R. AluruBeckman Institute for
Advanced Science TechnologyUniversity of
Illinois at Urbana-Champaign
2Outline
- Introduction MEMS Devices and MEMS-CAD
- Applications and Design Issues
- Simulation Methods
- Full Simulation (Lagrangian Dynamics)
- Full Simulation Results
- ROM -Reduced Order Modeling (KL decomposition)
- ROM Results
- Characteristics of MEMS Dynamics
- Resonant Frequency Stiffness Hardening and
Softening - Second Super-harmonic Resonance
- Switching Time/Power
- Conclusions
3Introduction MEMS Devices
MEMS Micro-electro-mechanical Systems.
(TI)
Texas Instruments-Micro-mirror
Analog Devices-Accelerometer
Electrical Domain
Energy exchange
Mechanical Domain
Onix Eight-Optical Fiber Switching
Analog Devices-Gyroscope
4RF-MEMS Applications
- Switches in radar systems, wireless
communications (cellular phones) - Tunable capacitors and inductors
- Passband/multi-band Filters/Oscillators/Mixers
Advantages of RF-MEMS
- Low insertion loss, high isolation and low return
loss - Low cost, low power consumption (only during
actuation), large down and up state capacitive
ratio (wireless communications) - Versatility to be fabricated on almost any
silicon substrate - On-chip RF-filters small size, huge numbers in
parallel
5Introduction MEMS-CAD
Device level analysis vs. system level analysis
Physical/Device Level
System Level
Full Simulation (Lagrangian Dynamics)
Compact Models
Reduced Order Models
6MEMS Dynamics
Electrical Domain Electrostatic Analysis
Mechanical Domain Structural Analysis
- Applied potential difference
- Relative position
- Electrostatic charge
- Electrostatic Pressure
- External Acceleration
- Structural Stiffness
- Structural inertia
- Structural Damping
- Electrostatic Pressure
- Deformation and position
Time evolution is the concern
7Design Issues in Dynamics
- Switching speed
- Switch down (pull-in for capacitive switches
during high applied voltages) - Switch up (after applied voltage is removed)
- Depends on resonant frequency, applied voltage,
squeeze film damping - Main limitation for capacitive switches
Switch Down
Switch Up
Figures J. M. Huang, et. al., Sensors and
Actuators A, Vol. 93, 273-285, 2001
8Design Issues in Dynamics
- Q-factor
- Measurement of power absorption bandwidth
- Factor by which displacement is amplified at
resonance - For CMOS compatibility, high Q-factor needed as
it influences dynamic range of circuits - Depends on squeeze film damping
Q-factor from frequency response curve
Figure Y. C. Loke, et. al., Sensors and
Actuators A, Vol. 96, 67-77, 2002.
9Design Issues in Dynamics
- Resonant Frequency
- Depends on applied voltage, deformation
- High resonant frequency desired for fast
switching, high Q-factor - Increased through structural modification,
residual stresses - Residual stresses increase pull-in voltage
- Phase Shifts
- Phase shifting and time delaying circuits, e.g.,
phased array radar communication antennas
10Full Simulation Lagrangian Dynamics
- Coupled electro-mechanical analysis
- Linear/Non-linear Elasticity for mechanics
- Boundary Integral equation for exterior
electrostatics - Full Lagrangian description (both mechanical and
electrostatic analysis done on undeformed
geometry) presented in ICCAD 2002 for statics
(G. Li and N. R. Aluru) - Relaxation method for consistency
- Process repeated in each time step
- Accurate
- Costly in terms of time and memory
11Full Lagrangian Description
- Mechanical and Electrostatic Analysis done on
undeformed geometry - Eliminates
- Surface re-discretization
- Re-computation of interpolation functions
12Governing Equations Non-linear elasticity
Lagrangian Elasticity for mechanical deformation
Newmark Scheme with implicit-trapezoidal rule
for dynamics
13Governing Equations Lagrangian Electrostatics
Lagrangian Boundary Integral Equation for
exterior electrostatics
14Full Simulation (Semi-Lagrangian)
Discretize mechanical domain
Initialization
Compute FEM/FCM interpolation functions
Time Step n0,1,2,..,T
Discretize electrical domain
Compute BEM/BCM interpolation functions
Electrostatic Analysis Electrostatic Pressure
Structural Analysis Mechanical Deformation
Update and go to next time step
Solution Converged?
No
Yes
15Full Simulation (Lagrangian)
Discretize mechanical domain
Initialization
Compute FEM/FCM interpolation functions
Faster and Efficient
Discretize electrical domain
Compute BEM/BCM interpolation functions
Time Step n0,1,2,..,T
Electrostatic Analysis Electrostatic Pressure
Structural Analysis Mechanical Deformation
Update and go to next time step
Solution Converged?
No
Yes
16Full Simulation MEM Cantilever Beam Dynamics
Simulations for 80µm by 0.5µm Si MEM cantilever
beam, gap 0.7 µm
17Full Simulation MEM Fixed-fixed Beam Dynamics
Simulations for 80µm by 0.5µm Si MEM fixed-fixed
beam, gap 0.7 µm
18Transverse Comb Drive Dynamics
19Lateral Comb Drive Dynamics
20Reduced Order Models/Macro-Models
Levels of modeling MEMS in simulation
- System Level
- Requires low-order behavioral models of all the
components of the system - Represented as a network of lumped elements
analogous to electric circuit elements - Small set of coupled ODEs that can be easily
integrated
SYSTEM LEVEL Lumped Networks ODEs
MACROMODELS
Macro-models Link between the Physical level and
the System level
- Physical Level
- Full behavior of the continuum
- Simultaneous solution of coupled PDEs
- Generally non-linear (except for small motions)
- Computationally very expensive
PHYSICAL LEVEL 2D/3D Simulation PDEs
21Reduced Order Modeling KL Decomposition
- Method of Snapshots
- KL decomposition and SVD
- Basis functions generated for mechanical
displacement (u) and electrostatic charge density
(s) - Basis functions used in simulation instead of
interpolation functions - Collocation and method of normal equations for
solving - Order of problem (say 5000) reduces as very few
basis needed (1-3 basis) - Faster and cheaper
- Can be integrated with circuit simulators
22Karhunen Loève Decomposition
Dynamical System
Run full-simulation
Take snapshots ui
Minimize this by
Approximate
Collocation formulation
Method of normal equations for solving
Reduces order of system from N (5000) to n(3)
(nltltN)
23Basis Generation
- Snapshots taken for u, s at different time
instants t1,t2,,tn - Homogeneous boundary conditions satisfied by
- subtracting steady state S(x,y) for mechanics
- SVD done of the ensemble matrix
- V is the matrix of basis functions
24Reduced Order Modeling Basis Functions
Shapes of Electrical Basis Functions
Shapes of Mechanical Basis Functions
25Reduced Order Modeling Dynamics
Applied Voltage 40.5V (Pull-in) (Lin and Non-Lin
are different)
Applied Voltage 10V (Lin and Non-Lin are same)
Simulations for 80µm by 1.0µm Si fixed-fixed
beam, gap 0.7 µm
26Characteristics Resonant Frequency
Resonant Frequency variation of the fixed-fixed
beam for different gaps
Resonant Frequency variation of the cantilever
beam for different gaps
Spring-hardening Mechanical
Spring-softening Electrical
27Second Super-harmonic Resonance
10V DC
30V DC
- Primary peak at resonant frequency of MEM device
(DC signal) - Secondary peak at half of resonant freq. (AC
signal) - Important design Issue (electrical cross talk,
passband/multi-band filters/oscillators)
28Switching time DC signal
- Time taken for pull-in for applied voltages above
the Pull-in voltage - Decreases with increase in voltage non-linearly
Simulations for 80µm by 1.0µm Si fixed-fixed
beam, gap 0.7 µm
29Switching time Power Consumption
Power analysis from RC series circuit analogy of
MEM device DC bias with AC signal at resonant
frequency/half of resonant freq. gives faster
switching at less peak power than a pure DC
signal
30Conclusions
- MEMS dynamics simulations needed for design
issues - Full Simulation accurate but costly
- Reduced Order Models Faster and Cheaper
- Spring hardening or softening occurs depending on
applied voltage and geometry - Second Super-harmonic Resonance Electrical
Cross-talk, multi-band/pass-band filter - Faster switching by DC bias and AC signal at
resonant freq. less power required