Title: SCIENTIFIC TEST INC'
1SCIENTIFIC TEST INC.
SERIES 5000 TESTER FAMILY
TESTER
HCD
SCANNER
LCD
MUX
MUX STATION
ADP340-5
FIXTURES
ADP401
2SCIENTIFIC TEST INC.
5300HS TESTER
- The Model 5300HS is a high speed discrete test
system capable of testing a wide variety of
devices. It employs an A/D converter for fast
measure and datalog. Real time math allows
comparison of test results and computation of
figures on merit. Options provide scanning,
voltage and current range extension and
multiplexing.
3SCIENTIFIC TEST INC.
LOW CURRENT DECK
- LC-1000
- Low Current Test Deck
- Adds Soak to 99 seconds for current less than
1uA. - Extends leakage measurements downward to 20
picoamp with 1 picoamp resolution.
4SCIENTIFIC TEST INC.
HIGH CURRENT DECK
- HC-500 - 500 Amp Current Capability.
- HC-1000 - 1000 Amp Current Capability.
- HC-1200 - 1200 Amp Current Capability.
5SCIENTIFIC TEST INC.
SCANNER
Front
Rear
- SCANNER 50A / 2KV Automatic Programmable per
step Scanner for multiple device packages. Up
to 20 Scans available.
6SCIENTIFIC TEST INC.
MULTIPLEXER MUX STATION
- MULTIPLEXER 3 or 4 outputs
- OPTIONS
- MUX Manual Stations
- Handler connections
7SCIENTIFIC TEST INC.
ADP340-5
- ADP340-5
- Ring-Com, Tip-Com, Tip-Ring connections for 4/5
pin modules. - VL (100V/us) test plus all SSOVP Tests
- Gated Device Capability Optional
- RCOIL Test included
-
8SCIENTIFIC TEST INC.
ADP401 MATRIX SCANNER
- ADP401 Matrix Scanner 30A / 1KV
- ADP401 4, 8, or 16 pins DIP
- ADP401 A-8 8 pins totally programmable
- ADP401 A-16 16 pins totally programmable
-
9SCIENTIFIC TEST INC.
SYSTEM CONFIGURATION
- SYSTEM CONFIGURATION WITH TESTER, MUX AND 2
MANUAL STATIONS
10SCIENTIFIC TEST INC.
SYSTEM CONFIGURATION
- SYSTEM CONFIGURATION WITH TESTER AND HIGH CURRENT
DECK
11SCIENTIFIC TEST INC.
FIXTURES
- A variety of Fixtures and Adapters are available
for many package configurations including surface
mount devices. See Price list.
12SCIENTIFIC TEST INC.
DEVICES TESTED
- TRANSISTOR
- TRIAC
- SCR
- MOSFET
- DIODE
- ZENER
- OPTO
- REGULATOR
- CURRENT REGULATOR
- MOV
- SSOVP
- 4 / 5 PIN MODULE
- GATED OVP
- QUADRAC
- DIAC
- SIDAC
- IGBT
- STS
- RELAY
- J-FET
Quadrac is a regestered trademark or
trademark of Teccor Electronics
13SCIENTIFIC TEST INC.
VOLTAGE / CURRENT
- Voltages
- 1KV (Optional 2KV)
- Max Resolution 1mV
- Current
- 50A Max (Optional 500/1000/1200 with High Current
Deck) - Max Resolution 0.1nA (1pA with Low Current Deck)
- SSOVP
- 900ma _at_ 400V
14SCIENTIFIC TEST INC.
TEST METHODS
- Single Test Measure
- Most tests are measured directly using a fast A/D
converter. The specified drive condition is
applied to the device and the resulting parameter
is measured. BVZ, for example, is performed by
applying the specified IZ to the device and
measuring BVZ. Some tests are not as straight
forward to accomplish with a single application
of stimulus gain of a transistor and trigger
parameter of a Triac are among them. - Gain HFE, VGSON
- Transistor hFE is measured in a single test by
driving IC indirectly. IB is measured and hFE
computed and reported. Pulse duration is 300us
at 10MA and above, longer below 10MA. MOSFET
VGSON is performed in a similar manner. gFS can
be computed in real time from two VGSON tests.
15SCIENTIFIC TEST INC.
TEST METHODS
- Triple-Ramp, Trigger tests, Breakover, VGT, IGT,
VBO, IH - Trigger and breakover parameters are difficult to
measure with a single application of stimulus
because of their negative resistance
characteristics. The 5300HS uses a proprietary
triple ramp method. The ramps are composed of
discrete steps, each with increasing resolution.
Gate trigger current and voltage are typically
measured in less then 20 ms. The triple ramp is
used for IGT, VGT and VBO tests on SCRs, Triacs,
Quadracs, Diacs, Sidacs, STSs and other negative
resistance devices. - 1 KHZ Zener Impedance
- Zener impedance is performed by modulating the
programmed IZ current 10 RMS at 1KHZ. The
resultant 1KHZ voltage across the Zener is
extracted, amplified and filtered. The
measurement is made using 4 full cycles and
computing the RMS value at up to 1uV resolution.
A very accurate result is thereby obtained in
only one test application. Total measure time is
less than 15 ms.
16SCIENTIFIC TEST INC.
SOFTWARE / FIRMWARE FEATURES
- Wafer Mapping (Optional)
- Delta-On-The-Fly (Optional)
- Datalog directly into Excel
- Real Time SPC
- Auto-Calibrate
- Real Time Math
- True Parameter Substitution
- Programmable delay between tests
- 16 pin Matrix Programmable Scanner
- 96 Tests
- 99 Sorts
- 16 Logical Bins
- Sort Qualifying on Pass or Fail
- Branch on 1st non-qualifying test
- 4 programmable Relay drivers/test
- IEEE Interface
- Connections to USB or Serial Ports
- BIN Alarm
- Programmable EOT Pulse
- Programmable BIN Result Signal
- Live Lot Summary Data
- High Speed Data Capture to Disk
17SCIENTIFIC TEST INC.
TEST PROGRAM SUMMARY SCREEN
- Send Test Program to Tester.
- Create or edit Operator Information File.
- These buttons control the STI Tester
18SCIENTIFIC TEST INC.
TEST PROGRAM SUMMARY SCREEN
Double Click to edit the Test Step
19SCIENTIFIC TEST INC.
TEST PROGRAM SUMMARY SCREEN
- Use the TAB Key to move from entry to entry
- Indicates valid entry range
20SCIENTIFIC TEST INC.
CALCULATION SUMMARY SCREEN
Double click to edit Calculation Screen
21SCIENTIFIC TEST INC.
CALCULATION SUMMARY SCREEN
- STI Expression Editor
- Calculation Entry (up to 11 characters.
- Relation (Changed by Space Bar)
- Calculation Limit Entry
- Units (eg. A, V, O)
- Actual calculation which can include references
to previous test steps. - Click to accept the values entered (Press ESC
key to quit).
22SCIENTIFIC TEST INC.
OPTIONS SCREEN
Allows the user to customize the Test Program
Options.
23SCIENTIFIC TEST INC.
BIN / SORT PLAN SCREEN
Allows user to specify Binning and Sorting
details. Double click on the highlighted item to
change. (see STI Manual for complete details)
24SCIENTIFIC TEST INC.
ADP-401 SCANNER PLAN SCREEN
Allows user to customize the ADP-401 for the
device configuration needed. A, G, K and Gnd can
be assigned to the socket pins required.
25SCIENTIFIC TEST INC.
TESTER CONTROLS SCREEN
- A Test Program can be saved to, loaded or
deleted from the memory in the CPU of the Tester. - This allows a Test Program to be recalled and
does not have to be downloaded every time the
Tester is powered OFF and ON.
- EOT and BIN Results are factory set but can be
changed by the user depending on the needs of the
Handler being used. - Click the Handler Button in the Tester Setup
to make changes.
- Tester Setups are factory set but can be changed
by the user if the need arises. - These setups are the type that will usually
never have to be changed.
26SCIENTIFIC TEST INC.
DATALOG SCREEN
Exact Value Window is acquired by clicking the
Runtime tab on the main screen, then clicking
on Exact Value in the pull-down menu.
27SCIENTIFIC TEST INC.
DATALOG SCREEN
Lot Summary Window Right Mouse Click inside
window for popup menu to edit Lot Summary
Exact Value Window Displays Test data received
from tester. Right Mouse Click inside window for
popup menu to edit Datalog functions, such as Log
every nth, etc.
28SCIENTIFIC TEST INC.
DATALOG SCREEN
Start Button starts a complete test sequence or
a single test.
For single test, enter the test number and check
the box for Measure (M) or Pass/Fail (PF)
29SCIENTIFIC TEST INC.
DATALOG SCREEN
Toggles Datalog Capture
Starts Test Sequence
Refer to the STI Manual for operation of Lot
Summary function buttons
Sends datalog data to an EXCEL file
30SCIENTIFIC TEST INC.
SELF-TEST FEATURE
- Self-Test
- Executes a series of test routines to confirm
functional operation of the system. A supplied
Self-test fixture is plugged into the front
panel. Proper operation of all power supplies,
relays, modes and gains is confirmed. Error
codes are keyed to a fault table in the STI
Operation Manual to provide guidance in
troubleshooting.
31SCIENTIFIC TEST INC.
SELF-TEST FEATURE
On the interface screen, press the Self Test
button and the STI Self Test screen will appear.
32SCIENTIFIC TEST INC.
SELF-TEST FEATURE
- Press the Start button.
- The Start button will go dim indicating self
test is running. - When Self Test is complete the Display will
indicate the results. - CHECK-OUT GOOD
- ERROR CODE- XX
- Run BLOCK indicated
33SCIENTIFIC TEST INC.
SELF-TEST FEATURE
- Press the Start button.
- The Start button will go dim indicating self
test is running. - When Self Test is complete the Display will
indicate the results. - CHECK-OUT GOOD
- ERROR CODE- XX
- Run BLOCK indicated
34SCIENTIFIC TEST INC.
AUTO-CALIBRATION FUNCTION
- Auto-Calibration
- A simple procedure can be initiated by the
operator anytime. Correction factors are stored
in Flash Memory in the CPU and used to
appropriately correct all drive and measure
amplifier offsets.
35SCIENTIFIC TEST INC.
AUTO-CALIBRATION FUNCTION
36SCIENTIFIC TEST INC.
AUTO-CALIBRATION FUNCTION
- When Auto Cal button is pressed the new Auto
Cal Factors will be displayed. - The ZERO button will zero all factors
- When SAVE button is pressed the factors will be
saved into Flash Memory in the CPU. - Until they are saved you can recall the already
saved factors by pressing the RECALL button.
37SCIENTIFIC TEST INC.
WAFER MAPPING FUNCTION
- Wafer Mapping
- A procedure whereby wafer attributes may be
mapped. - User selectable attribute may be
- LOGICAL BIN (up to 16 and Fail)
- INDIVIDUAL TEST RESULT (up to 16 divisions)
- SORT (up to 16 and Fail)
- Test result range and number of divisions are
user entered. - Attribute colors are user selectable.
38SCIENTIFIC TEST INC.
WAFER MAPPING SAMPLE
39SCIENTIFIC TEST INC.
TABLE OF TESTS
Page 1 of 3
40TABLE OF TESTS
Continued
Page 2 of 3
41TABLE OF TESTS
Continued
Page 3 of 3
42SCIENTIFIC TEST INC.
TEST SPECIFICATIONS
Page 1 of 3
43TEST SPECIFICATIONS
Continued
Page 2 of 3
44TEST SPECIFICATIONS
Continued
Page 3 of 3
45SCIENTIFIC TEST INC.
See your local Representative for further details
and to place an order!